A method of monitoring a substance in a well can include disposing at least one optical electromagnetic sensor and at least one electromagnetic transmitter in the well, and inducing strain in the sensor, the strain being indicative of an electromagnetic parameter of the substance in an annulus between a casing and a wellbore of the well. A system for monitoring a substance in a well can include at least one electromagnetic transmitter, and at least one optical electromagnetic sensor with an optical waveguide extending along a wellbore to a remote location, the sensor being positioned external to a casing in the wellbore.

A method of measuring a delay time of a propagation of a signal in a line in a circuit structure, the method comprises irradiating the line by pulses of a charged particle beam, wherein a pulse repetition frequency of the pulses of the charged particle beam is varied. The method further comprises measuring, for each of the pulse repetition frequencies, a secondary charged particle emission responsive to the irradiating the line by the pulses of the charged particle beam at the respective pulse repetition frequency, and deriving the delay time of the line based on the secondary charged particle emission responsive to the varying of the pulse repetition frequency.

The invention relates to a measuring device for determining the dielectric value of a medium. The measuring device is based on two waveguides, each of which has a signal gate on one end. The waveguides are, in such case, so arranged that the signal gates lie opposite one another. Formed therebetween is a sample space for the medium, such that a high frequency signal, which is in-coupled into the first waveguide, is transmitted into the second waveguide via the second signal gate after passage through the medium. Since the transmitted fraction and the reflected fraction of the high frequency signal depend strongly on the dielectric value, such can, as a result, be measured with a high sensitivity and, depending on choice of the frequency band and dimensioning of the waveguides, over a large value range.

A method for identifying sufficient non-linear susceptibility in a test material. The method includes determining the polarizability of the test material, extracting from the polarizability, an optomechanical coupling of the test material, modeling light-induced dynamics, based on optomechanical coupling of the test material, and controlling the light induced dynamics to identify sufficient non-linear susceptibility.

A method of inspecting a radio frequency device modifies a radio frequency signal along electroconductive elements by changing dielectric material properties of a tunable dielectric material. The method includes: emitting a light beam through an optically transparent first substrate layer into a test volume of the tunable dielectric material with an inbound light intensity and/or inbound phase; applying a bias field to a test volume via a first transparent test electrode arranged at the first substrate layer and a second test electrode arranged opposite the first test electrode at a second substrate layer; measuring an outgoing light intensity and/or an outgoing phase of the light beam; and determining a property of the tunable dielectric material based on the outgoing light intensity and the incoming light intensity and/or based on a phase relation between the inbound phase and the outgoing phase of the light beam from the bias field.

The invention relates to a measuring device for determining the dielectric value of a medium. The measuring device is based on two waveguides, each of which has a signal gate on one end. The waveguides are, in such case, so arranged that the signal gates lie opposite one another. Formed therebetween is a sample space for the medium, such that a high frequency signal, which is in-coupled into the first waveguide, is transmitted into the second waveguide via the second signal gate after passage through the medium. Since the transmitted fraction and the reflected fraction of the high frequency signal depend strongly on the dielectric value, such can, as a result, be measured with a high sensitivity and, depending on choice of the frequency band and dimensioning of the waveguides, over a large value range.

The present disclosure provides a measuring device, a measuring apparatus, and a measuring method for a dielectric constant of a liquid crystal. The measuring device includes: a first substrate and a second substrate disposed to be opposite to each other; a resonant structure layer disposed on a side of the first substrate facing the second substrate. a cavity for receiving the liquid crystal to be measured is defined between the first substrate and the second substrate. The above measuring device is applied to measurement of the dielectric constant of the liquid crystal in the terahertz wave band.

The present disclosure provides a measuring device, a measuring apparatus, and a measuring method for a dielectric constant of a liquid crystal. The measuring device includes: a first substrate and a second substrate disposed to be opposite to each other; a resonant structure layer disposed on a side of the first substrate facing the second substrate. a cavity for receiving the liquid crystal to be measured is defined between the first substrate and the second substrate. The above measuring device is applied to measurement of the dielectric constant of the liquid crystal in the terahertz wave band.

Disclosed herein is a system for non-contact measurement of an optoelectronic property. The system includes a sensing element configured to amplify an electromagnetic wave having a specific frequency, a thin film disposed on the sensing element such that an optoelectronic property of the thin film is measured, and an optoelectronic property measuring server configured to extract a physical property of the thin film based on the optoelectronic property of the thin film obtained when the electromagnetic wave amplified by the sensing element passes through the thin film.

An arrangement for a spatially resolved determination of the specific electrical resistance and/or of the specific electrical conductivity of a sample at different positions, in which a plurality of detectors are configured for a spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval and is incident onto the detectors. A radiation onto a surface takes place with homogeneous intensity. The measurement signals of the detectors detected with spatial resolution and wavelength resolution within a wavelength interval are compared for each detected position with a wavelength-resolved function that are compared by calculation of the propagation of electromagnetic radiation in multilayer systems while using an optical model for a physical description of the examined sample while taking account of the wavelength-dependent progressions of the linear optical refractive indices n and of the coefficients of absorption k of all the materials and/or substances forming the sample that can be approximated by a physical function of a complex refractive index of the conductive material or substance. They are brought to a sufficient overlap with a calibration curve progression by a change of the parameters of the physical function to determine the specific electrical resistance and/or the specific electrical conductivity at different positions with spatial resolution.