Provided is a measurement apparatus including a signal source configured to output a binary digital signal configuring a multi-tone waveform, a waveform acquisition unit configured to acquire an analog signal waveform generated in response to application of the digital signal to a device under test, and a computation unit configured to calculate a frequency characteristic of the device under test from the waveform acquired by the waveform acquisition unit, in which the signal source is configured to repeatedly output a signal upconverted by multiplying a pseudo-random binary sequence (PRBS) signal by a repeating rectangular wave with a reference frequency and a reference duty ratio.

A system for analyzing a passive network is provided, the system being configured to extend the frequency band with the interpolation function of the low frequency band and the extrapolation function of the high frequency band for S-parameters with limited measurement band, adjust the propagation delay time for the band-extended S-parameter to derive the final band-extended S-parameter, and analyze the time response of the passive network on the basis of the output voltage waveform estimated by performing convolution on the impulse response to the derived final band-extended S-parameter and the input voltage waveform of the passive network, thereby improving the time response performance of the passive network without a complex circuit conversion process, and making it possible to be capable of lightweight structures. Furthermore, it is possible to improve the accuracy of the impulse response by adjusting the propagation delay time removed from the band-limited S-parameter.

A system includes a signal generator, configured to pass a generated signal, which has two different generated frequencies, through a circuit including an intrabody electrode. The system further includes a processor, configured to identify, while the generated signal is passed through the circuit, a derived frequency, which is derived from the generated frequencies, on the circuit, and to generate, in response to identifying the derived frequency, an output indicating a flaw in the electrode. Other embodiments are also described.

The present disclosure provides for an electronic sensor for detecting a root of a plant in soil, the electronic sensor that includes a first conductor plate configured to be disposed in soil, a switch, a power supply, and a signal extractor. The switch is electrically coupled to the first conductor plate and is configured to switch between a first mode and a second mode. The power supply is electrically coupled to the switch and is configured to provide an electrical charge to the first conductor plate in the first mode of the switch. The signal extractor is electrically coupled to the switch and is configured to extract a signal response at the first conductor plate in the second mode of the switch. The present disclosure further provides a second conductor plate configured to be disposed in soil adjacent to and substantially parallel to the first conductor plate. The second conductor plate is electrically coupled to ground.

A testing system includes a testing device including a display screen. The testing device can display, via the display screen, a representation of a vehicle and oscillators of the vehicle. The testing device transmits a test request that identifies a selected oscillator of the plurality of oscillators for testing. A vehicle receives the test request. An electronic control unit of the vehicle instructs the selected oscillator to generate test signals. The testing calculates a performance metric of the test signals. The testing device determines whether the selected oscillator is properly placed, functioning at a predetermined threshold, or both. Improperly placed or improperly functioning oscillators can be adjusted or replaced.

A self-test system for PCIe and a method thereof are disclosed. In the system, a first circuit interconnect card and a second circuit interconnect card are inserted into CEM slots, respectively, and the first circuit interconnect card and the second circuit interconnect card are electrically connected to each other through a FFC, the central processing unit generates and provides differential signals to the first circuit interconnect card and the second circuit interconnect card; the first circuit interconnect card or the second circuit interconnect card provide differential signals to the second circuit interconnect card or the first circuit interconnect card through the first FFC interface and the second FFC interface, respectively, and the second circuit interconnect card or the first circuit interconnect card provides the differential signals to a central processing unit, so as to implement self-check for PCIe.

A monitoring device is disclosed that is configured to monitor conditions within an electrical enclosure containing electrical equipment. The monitoring device comprises a support configured to couple to an interior surface of the electrical enclosure. The support is configured to hold and electrically couple a plurality of sensors, at least two RF antennas, at least one processor in communication with the plurality of sensors and the at least two RF antennas, and a power connection configured to receive electrical and Ethernet input. The at least one processor is configured to receive and analyze data obtained from the plurality of sensors and the at least two RF antennas pertaining to a plurality of conditions inside the electrical enclosure. The at least one processor is configured to detect a potential electrical equipment failure based on the received an analyzed data.

A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure condition. A second power-supply voltage is applied to the electronic device to determine whether the electronic device has safety risk. The first power-supply voltage is higher than the second power-supply voltage, and the safety risk is caused by material failure in the device to-be-verified. The method and the system for fault verification of an electronic device can verify safety risk caused by material failure in internal components of the electronic device.

A system for detecting a connection between two devices includes a first device and a second device. The first device includes a first connection terminal and a first reactance element connected to the first connection terminal. The second device includes a second connection terminal; a first resistance element, and a first frequency generator for allowing a signal to pass through the first resistance element and be applied to the first device via the second connection terminal. The second device further includes a first comparator having both input terminals connected to both ends of the first resistance element, and comparing and outputting a signal of both ends of the first resistance element, and a first control unit for determining whether or not the first connection terminal of the first device is connected to the second connection terminal by means of the output signal of the first comparator.

Circuits and methods involve an integrated circuit (IC) device, a plurality of application-specific sub-circuits, and a plurality of instances of a measuring circuit. The application-specific sub-circuits are disposed within respective areas of the IC device. Each instance of the measuring circuit is associated with one of the application-specific sub-circuits and is disposed within a respective one of the areas of the device. Each instance of the measuring circuit further includes a ring oscillator and a register for storage of a value indicative of an interval of time. Each instance of the measuring circuit is configured to measure passage of the interval of time based on a first clock signal, count oscillations of an output signal of the ring oscillator during the interval of time, and output a value indicating a number of oscillations counted during the interval of time.