Patent classifications
G01R31/2836
DISPLAY PANEL AND DISPLAY APPARATUS
A display panel and a display apparatus are provided, the display panel includes a substrate, a plurality of sub-pixels, a plurality of data lines, and a crack detection line. A first peripheral area surrounds a display area; the plurality of data lines are connected to the plurality of sub-pixels; and the crack detection line surrounds the display area, is arranged along the edge of the first peripheral area and a second peripheral region, and is connected to at least one of the plurality of data lines.
ADVANCED WARNING INDICATOR FOR EMERGENCY MEDICAL DEVICES
An emergency medical device (20) (e.g., an external defibrillator/monitor) employing an emergency medical subsystem (21) for executing an emergency medical procedure (e.g., a monitoring subsystem (21) and a therapy subsystem (21)), and an emergency medical controller (23) for controlling an activation of the emergency medical subsystem (21). The subsystem (21) includes one or more operational components (22). In operation, the controller (23) conditionally actuates a device readiness indicator (24) (e.g., auditory or visual) indicative of an operational readiness of the operational component(s) (22), and conditionally actuates a failure warning indicator (25) (e.g., auditory or visual) indicative of a pending failure of the operational readiness of the operational component(s) (22). The failure warning indicator (25) may be actuated based on a predictive failure analysis of a premature degradation of the operational component(s) (22), a repeated occurrence of error conditions of the operational component(s) (22) (particularly recoverable error conditions), and a shortened reliable life of the operational component(s) (22).
Power Source Combination Circuit, Diagnosis Method and Apparatus, and System
A power source combination circuit has a combination circuit and a controller. The combination circuit includes a first power source, a first field-effect transistor, a second power source, and a second field-effect transistor. The controller is configured to control the combination circuit to supply power to a load circuit, obtain a first input voltage, a second input voltage, and a third input voltage, and diagnose, based on the obtained voltages, whether the combination circuit is in a normal state or an abnormal state. The first input voltage is an input side voltage of the first field-effect transistor, the second input voltage is an input side voltage of the second field-effect transistor, and the third input voltage is a voltage at a power source input end of the load circuit.
METHOD, ARRANGEMENT AND COMPUTER PROGRAM PRODUCT FOR DEBUGGING A PRINTED CIRCUIT BOARD
A method of debugging a printed circuit board with at least one boundary-scan compliant device is presented. The method uses an electronic processing unit and includes the steps of: retrieving boundary-scan properties of the at least one boundary-scan compliant device, the properties including a listing of boundary-scan compliant circuit terminals of the at least one boundary-scan compliant device; retrieving connectivity properties; selecting and displaying a circuit graph of at least a part of the devices mounted on the printed circuit board, the circuit graph including at least one of the devices mounted on the printed circuit board and a least one further device from the devices which has a circuit terminal interconnected to a circuit terminal of the device for visualizing at least the device, the further device and interconnects between the circuit terminals of the devices.
METHOD FOR ANALYZING AN ELECTRICAL CIRCUIT
A method for analyzing an electrical circuit. The method includes procuring one or multiple netlists(s) of the circuit; supplying the one or multiple netlist(s) to a classification model; and mapping, by the classification model, one or multiple of the connection(s) included in the netlist or netlists onto one or multiple net type(s) from a predefined selection of net types.
SYSTEMS AND METHODS FOR FAULT DETECTION AND REPORTING THROUGH SERIAL INTERFACE TRANSCEIVERS
Circuitry, systems, and methods for fault detection and reporting comprise a fault detection circuit configured to detect one or more fault conditions that cause a state change in a fault pin voltage representative of a transceiver failure. Once the state of the fault pin voltage changes, a transceiver input generates a fault detection code. In embodiments, in response to the transceiver input receiving a first signal, the fault detection code is shifted to a transceiver output that may communicate the fault detection code to a controller. Once the transceiver input receives a second signal, the fault pin voltage may be reset to clear the fault detection code before resuming operations, including detecting additional fault conditions as they arise.
Mismatch detection using replica circuit
An apparatus for detecting difference in operating characteristics of a main circuit by using a replica circuit is presented. In one exemplary case, a sensed difference in operating characteristics of the two circuits is used to drive a tuning control loop to minimize the sensed difference. In another exemplary case, several replica circuits of the main circuit are used, where each is isolated from one or more operating variables that affect the operating characteristic of the main circuit. Each replica circuit can be used for sensing a different operating characteristic, or, two replica circuits can be combined to sense a same operating characteristic.
SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD
Provided are scan device and method of diagnosing scan chain fault. The scan device for diagnosing a fault includes a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade. In the scan partition, connection paths of the scan flipflops are controllable. The connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.
Method for Locating Open Circuit Failure Point of Test Structure
The present application discloses a method for locating an open circuit failure point of a test structure, which includes the following steps: step 1: providing a sample formed with a test structure, a first metal layer pattern and a second metal layer pattern of the test structure forming a series resistor structure through each via; step 2: performing a first active voltage contrast test to the sample to show an open circuit point and making a first scratch mark at an adjacent position of the open circuit point; step 3: forming a coating mark at the first scratch mark on the sample; step 4: performing a second active voltage contrast test to the sample to show the open circuit point and locating a relative position of the open circuit point by using a position of the coating mark as a reference position.
Dynamic characterisation of amplifier using multiple envelope shaping functions
A method of characterizing an envelope tracking amplification stage, the method comprising: generating an input test waveform which is representative of an input waveform under normal operating conditions of the amplification stage; applying a respective one of a plurality of different shaping functions, each comprising a non-linear transfer function, to the input signal envelope in each of a plurality of test periods during the period in which the input test waveform is applied as the input signal to generate the input to the envelope tracking modulated supply voltage; measuring parameters of the amplification stage during the period in which the input test waveform is applied in order to allow determination of the gain, phase and efficiency characteristics of the amplifier; and for each of the gain, phase and efficiency characteristics, generating a three dimensional plot of the characteristic with respect to input power and supply voltage applied to the amplifier.