An exemplary method of detecting a Trojan circuit in an integrated circuit is related to applying a test pattern comprising an initial test pattern followed by a corresponding succeeding test pattern to a golden design of the integrated circuit, wherein a change in the test pattern increases side-channel sensitivity; measuring a side-channel parameter in the golden design of the integrated circuit after application of the test pattern; applying the test pattern to a design of the integrated circuit under test; measuring the side-channel parameter in the design of the integrated circuit under test after application of the test pattern; and determining a Trojan circuit to be present in the integrated circuit under test when the measured side-channel parameters vary by a threshold.

A system includes a signal generator, configured to pass a generated signal, which has two different generated frequencies, through a circuit including an intrabody electrode. The system further includes a processor, configured to identify, while the generated signal is passed through the circuit, a derived frequency, which is derived from the generated frequencies, on the circuit, and to generate, in response to identifying the derived frequency, an output indicating a flaw in the electrode. Other embodiments are also described.

A system for testing is provided. The system includes an electronic circuit and an automatic testing equipment (ATE). The electronic circuit includes a voltage monitor including a resistive divider receiving at its voltage input an input voltage and coupled at its output to an input of a comparator. A reference input of the comparator is coupled to a generator supplying a reference voltage setting one or more thresholds of the comparator. The electronic circuit includes a Built In Self Test Module coupled to the ATE and to the inputs and output of the comparator. The BIST module is being configured upon receiving respective commands from the ATE to test a reaction time of the comparator and an offset of the comparator. The ATE performs a respective test of the ratio of the resistor divider by a first voltage measurement and a test of the reference voltage provided by the generator.

A manufacturing method of an electronic device and an electronic device are provided. The manufacturing method includes the following steps: providing a substrate; forming a plurality of signal lines and a testing circuit on the substrate, wherein the testing circuit includes a plurality of output channels electrically connected to at least a portion of the plurality of signal lines; performing a testing process; and optionally isolating the testing circuit from the at least a portion of the plurality of signal lines. The testing process includes: providing a signal; processing a plurality of testing signals by processing the signal via the testing circuit; and transmitting the plurality of testing signals to the at least a portion of the plurality of signal lines via the plurality of output channels. The plurality of output channels are less than the plurality of signal lines in quantity.

A device includes a function circuit that operates based on power provided by a first positive supply voltage and a first negative supply voltage, a monitoring circuit that operates based on power provided by a second positive supply voltage and a second negative supply voltage and that generates a first monitor signal based on monitoring an operation of the function circuit, and an output circuit that generates a second monitor signal based on monitoring the first positive supply voltage, generates a third monitor signal based on monitoring the second positive supply voltage, and generates an output signal that is output through one or more output pins, based on the first monitor signal, the second monitor signal, and the third monitor signal.

The disclosure describes to techniques for detecting field failures or performance degradation of circuits, including integrated circuits (IC), by including additional contacts, i.e. terminals, along with the functional contacts that used for connecting the circuit to a system in which the circuit is a part. These additional contacts may be used to measure dynamic changing electrical characteristics over time e.g. voltage, current, temperature and impedance. These electrical characteristics may be representative of a certain failure mode and may be an indicator for circuit state-of-health (SOH), while the circuit is performing in the field.

A capacitive sensor includes a first conductive structure; a second conductive structure that is counter to the first conductive structure, wherein the second conductive structure is movable relative to the first conductive structure in response to an external force acting thereon, wherein the second conductive structure is capacitively coupled to the first conductive structure to form a first capacitor having a first capacitance that changes with a change in a distance between the first conductive structure and second conductive structure; a signal generator configured to apply a first electrical signal step at an input or at an output of the first capacitor to induce a first voltage transient response at the output of first capacitor; and a diagnostic circuit configured to detect a fault in the capacitive sensor by measuring a first time constant of the first voltage transient response and detecting the fault based on the first time constant.

A keyboard with wire aging self-adaption, a self-adaption method for keyboard, an electronic computing device readable medium with a stored program, and an electronic computing device program product are provided. In the keyboard, a processor feeds a scanning signal to each scanning line in turn during a scanning round. In response to the conduction state of one of switching elements, the processor detects a return signal on the corresponding return line and selects one or more scanning lines as a testing line. During a first duration in which the testing line maintains the scanning signal, according to the time difference between the starting points of the first duration and the return signal and the response time parameter corresponding to the testing line that is stored in the memory, the processor determines whether to update the response time parameter corresponding to the testing line that is stored in the memory.

There is provided an aircraft engine printed circuit board assembly generally having a functional circuit contributing to the operation of an aircraft engine. The functional circuit has a first substrate portion, a first electronic component supported by the first substrate portion, and a first electrical conductor supported by the first substrate portion and leading to the first electronic component. The aircraft engine printed circuit board assembly generally has a monitoring circuit having a second substrate portion, a second electronic component supported by the second substrate portion, a second electrical conductor supported by the second substrate portion and leading to the second electronic component, the second electrical conductor having a shorter life expectancy than the first electrical conductor, and a detector monitoring an indicator of operativeness of the second electrical conductor, in which the first electrical conductor and the second electrical conductor are both exposed to the same environment.

A TSV detecting circuit, TSV detecting methods, and an integrated circuit thereof are disclosed by the present disclosure. The TSV detecting circuit includes a first detecting module includes: a first comparison unit; a first input unit, for transmitting an input signal to a first input of the first comparison unit controlled by a first clock signal; a first switching unit for transmitting a signal of a first node to a second input of the first comparison unit controlled by a first detection control signal, the first node coupled to a first terminal of the TSV; and a second detecting module includes: a second input unit for transmitting the input signal to a second node controlled by a second clock signal; a second switching unit for transmitting a signal of the second node to a second terminal of the TSV controlled a second detection control signal.