Electrostatic discharge (ESD) test systems include a FET-based pulse generator using pairs of back-to-back FETs coupled to produce an ESD pulse based on discharging a capacitor that is coupled in series with a device under test (DUT). A number of FETs can be selected based on an intended ESD test voltage magnitude.

Topology discovery of a target system having a plurality of components coupled with a scan topology may be performed by driving a low logic value on the data input signal and a data output signal of the scan topology. An input data value and an output data value for each of the plurality of components is sampled and recorded. A low logic value is then scanned through the scan path and recorded at each component. The scan topology may be determined based on the recorded data values and the recorded scan values.

This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations.

Semiconductor devices that include test circuitry to measure internal signal wire propagation delays during memory access operations, and circuity configured to store delay information that is used to configure internal delays based on the measured internal signal propagation circuit delays. The semiconductor device includes a test circuit configured to measure a signal propagation delay between a command decoder and a bank logic circuit based on time between receipt of a test command signal directly from the command decoder and a time of receipt of the test command signal routed through the bank logic circuit.

A self-test circuit for an integrated circuit, having a plurality of scan chains is provided, wherein each of the scan chains has a plurality of first memory elements, a data input for providing the scan chain with test data, wherein the data input is connected to one of the first memory elements, a plurality of second memory elements, and a switching apparatus having a first and a second switching position, which switching apparatus is coupled between the first memory elements and the second memory elements and is configured to respectively connect a last one of the first memory elements to a data output in the first switching position and to respectively connect the last one of the first memory elements to a first one of the second memory elements in the second switching position.

Circuitry, systems, and methods for fault detection and reporting comprise a fault detection circuit configured to detect one or more fault conditions that cause a state change in a fault pin voltage representative of a transceiver failure. Once the state of the fault pin voltage changes, a transceiver input generates a fault detection code. In embodiments, in response to the transceiver input receiving a first signal, the fault detection code is shifted to a transceiver output that may communicate the fault detection code to a controller. Once the transceiver input receives a second signal, the fault pin voltage may be reset to clear the fault detection code before resuming operations, including detecting additional fault conditions as they arise.

Described herein are systems and devices for testing electrical circuits. An example integrated test system includes a unit under test (UUT), a test development system operably coupled to the UUT, the test development system being configured to perform in-circuit testing (ICT) on the UUT and a functional platform brain operably coupled to the test development system and the UUT, the functional platform brain being configured to perform functional testing (FCT) on the UUT using a test sequence protocol, wherein the test sequence protocol is configured to facilitate communication between the test development system and the functional platform brain.

This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations.

An extended joint test action group based controller and a method of use allows easier testing of integrated circuits by reducing the power dissipation of an IC. The extended joint test action group (JTAG) controller tests internal storage elements that form digital units in an integrated circuit (IC) use a design for testing scan infrastructure on the IC, wherein the JTAG controller is extended by an overall reset generator for all digital units of the IC, and a finite state machine controls the overall reset generator. In reset mode the JTAG controller stops the at least one clock module in supplying the digital units that should be reset. It then sets all scan chains in test mode and switches the input multiplexers into reset mode; and then controls the number of shift clock cycles for shifting in the reset value to the flip-flops in the scan chain, respectively.

A method, computer program product, and/or system is disclosed for testing integrated circuits, e.g., processors, that includes: generating a software design prototype of the functional behavior of an integrated circuit to be tested; creating a lab All-Events-Trace (AET) normalized model of the integrated circuit, wherein the normalized model captures the functions of the integrated circuit and not the non-functional aspects of the integrated circuit; generating a lab scenario using the software design prototype and the AET normalized model of the integrated circuit for a particular cycle of interest, wherein the lab scenario contains initialization for all signals that have hardware information; and generating a replayed lab normalized AET for the particular cycle of interest.