A system is provided that includes a memory configured to store test patterns. A first lockstep core and a second lockstep core are configured to receive the same set of test patterns. First scan outputs are generated from the first lockstep core, and second scan outputs are generated from the second lockstep core during a reset of the first lockstep core and the second lockstep core. A comparator can be coupled to the first lockstep core and the second lockstep core and is configured to compare the first scan outputs to the second scan outputs. The first and second lockstep cores can be initialized to a similar state if the first and second scan outputs are the same. The first and second lockstep cores can comprise non-resettable flip flops.

Scan channel slicing methods and systems for testing of scan chains in an integrated circuit (IC) reduce the number of test cycles needed to effectively test all the scan chains in the IC, reducing the time and cost of testing. In scan channel slicing, rather than loading and unloading into scan chains high-power patterns having numerous switching transitions over the length of each scan chain, loading and unloading the entirety of the scan chain scan while observing it, chain load data is sliced, apportioning between the different scan chains independently observable sections (slices) of transition data in which all four bit-to-bit transitions (“0” to “0”, “0” to “1”, “1” to 0”, “1” to “1”) are ensured to exist. The remainder of the scan chain load data, which is not observed in the test procedure, can be low-transition data that consumes low dynamic power, such as mostly zeroes or mostly ones.

Existing multi-wire debugging protocols, such as 4-wire JTAG, 2-wire cJTAG, or ARM SWD, are run through a serial wireless link by providing the debugger and the target device with hardware interfaces that include UARTs and conversion bridges. The debugger interface serializes outgoing control signals and de-serializes returning data. The target interface de-serializes incoming control signals and serializes outgoing data. The actions of the interfaces are transparent to the inner workings of the devices, allowing re-use of existing debugging software. Compression, signal combining, and other optional enhancements increase debugging speed and flexibility while wirelessly accessing target devices that may be too small, too difficult to reach, or too seal-dependent for a wired connection.

In a quantum computer, quantum algorithms are performed by a qubit interacting with multiple quantum control pulses. The quantum control pulses are electromagnetic RF signals that are generated digitally at baseband and sent, via asynchronous ports, to DACs that feed an RF upconversion circuit. For synchronization, each asynchronous port is coupled to a multi-tap delay line. The setting of the multi-tap delay line is determined by a function of the port's setup-and-hold time. This function is trained, via machine learning, to be applicable across a variety of ports.

An error rate measuring apparatus that measures whether or not an FEC operation of the device under test is possible based on a comparison result of the signal received from the device under test and a test signal includes an operation unit that sets a codeword length and an FEC symbol length of the FEC corresponding to a communication standard of the device under test, a data comparison unit that compares bit string data obtained by converting the signal received from the device under test with error data to detect an FEC symbol error of each FEC symbol length, a display unit that associates the bit string data of the FEC symbol length as one point with one unit region of a display region and performs color-coding display depending on presence or absence of occurrence of the FEC symbol error by each FEC symbol length.

An input device including an input circuit with an input connection point for applying an input signal and with an input signal path which leads from the input connection point to an evaluation input and on which a conversion of the input signal into an evaluation signal is effected, an evaluation device which includes the evaluation input and which is designed to recognise an input signal level of the input signal on the basis of the evaluation signal, wherein the evaluation device is further designed to carry out a functionality test of the input device and within the framework of the functionality test by way of providing a test signal to effect a first change of the evaluation signal and to test the functionality of the input device on the basis of the effected first change of the evaluation signal, wherein the input circuit includes a transistor which is connected into the input signal path, and the input circuit is designed to control a control terminal of the transistor on the basis of the test signal, in order to effect the first change of the evaluation signal.

An integrated circuit is provided that comprise a receive unit to be tested for receiving an input signal and storing the input signal at a predetermined point of time. Additionally, it comprises a processor for applying an error correction to the received input signal, for comparing the error corrected signal with an expectation value and for outputting an error message when the filtered input signal does not correspond to the expectation value. A power source supplies the receive unit to be tested with an adjustable voltage and/or and adjustable current. An adjustment unit varies the predetermined point in time and the adjustable voltage respectively the adjustable current.

A method may involve applying, by a testing computing device, a distortion to a computing device under test. The distortion includes operating the computing device under test at a performance range of a computational resource that could cause the computing device under test to operate outside a normal range. The method may also involve receiving, by the testing computing device and in response to the applying of the distortion, one or more digital signals from the computing device under test. The method may further involve comparing, by the testing computing device, the one or more digital signals to one or more baseline digital signals associated with the computing device under test. The method may also involve detecting, based on the comparing, a presence of at least one anomalous element that could be indicative of a hostile element in the computing device under test.

In one embodiment, a device comprises: a first die having disposed thereon a first plurality of latches wherein ones of the first plurality of latches are operatively connected to an adjacent one of the first plurality of latches; and a second die having disposed thereon a second plurality of latches wherein ones of the second plurality of latches are operatively connected to an adjacent one of the second plurality of latches. Each latch of the first plurality of latches on said first die corresponds to a latch in the second plurality of latches on said second die. Each set of corresponding latches are operatively connected. A scan path comprises a closed loop comprising each of said first and second plurality of latches. One of the second plurality of latches is operatively connected to another one of the second plurality of latches via an inverter.

A system-on-chip includes a process-voltage-temperature (PVT) sensor with a filter circuit that initiates a patterned digital signal and propagates the patterned digital signal in a manner responsive to variations in semiconductor material, operating supply voltage and operating temperature of the system-on-chip. A digital comparison circuit compares the initiated patterned digital signal and the propagated patterned digital signal. A warning signal is generated in response to the comparison where there is a detection of discrepancy between the initiated patterned digital signal and the propagated patterned digital signal.