A system-on-chip includes a process-voltage-temperature (PVT) sensor with a filter circuit that initiates a patterned digital signal and propagates the patterned digital signal in a manner responsive to variations in semiconductor material, operating supply voltage and operating temperature of the system-on-chip. A digital comparison circuit compares the initiated patterned digital signal and the propagated patterned digital signal. A warning signal is generated in response to the comparison where there is a detection of discrepancy between the initiated patterned digital signal and the propagated patterned digital signal.

A system-on-chip includes a process-voltage-temperature (PVT) sensor with a filter circuit that initiates a patterned digital signal and propagates the patterned digital signal in a manner responsive to variations in semiconductor material, operating supply voltage and operating temperature of the system-on-chip. A digital comparison circuit compares the initiated patterned digital signal and the propagated patterned digital signal. A warning signal is generated in response to the comparison where there is a detection of discrepancy between the initiated patterned digital signal and the propagated patterned digital signal.

The described technology provides a method for dynamically adjusting operating voltage of a device, including receiving device characteristics data related to a device, performing a margining test for the device to generate a performance curve characterizing variation of the device's current performance speeds at various operating voltages from expected performance speeds at the various operating voltages, determining an operating voltage for the device based on the device characteristics data and the performance curve, and adjusting the operating of the device based on the determined operating voltage.

A system comprises a plurality of regions, wherein ones of the plurality of regions are partitioned from others of the plurality of regions and at least one of the plurality of regions is a region under test. The system comprises at least one noise generator configured to generate noise in at least the region under test, and at least one noise monitor configured to monitor one or more effects of the noise generated in the region under test. The system comprises a test controller configured to: cause the at least one noise generator to generate the noise in at least the region under test; receive information from the at least one noise monitor indicative of the one or more effects of the noise generated in the region under test; and determine one or more conditions based on at least a portion of the received information.

A shift register circuit generates a clock enable signal in response to a start signal and in response to a clock signal. The shift register circuit generates multiple pulses in the clock enable signal in response to a single transition in the start signal and in response to control signals having values that indicate to generate more than one pulse in the clock enable signal. A multiplexer circuit provides an output signal for testing an electronic circuit based on an input signal or based on the clock signal in response to the clock enable signal.

A shift register circuit generates a clock enable signal in response to a start signal and in response to a clock signal. The shift register circuit generates multiple pulses in the clock enable signal in response to a single transition in the start signal and in response to control signals having values that indicate to generate more than one pulse in the clock enable signal. A multiplexer circuit provides an output signal for testing an electronic circuit based on an input signal or based on the clock signal in response to the clock enable signal.

Described is an apparatus which comprises: a state detector which is operable to detect logic states of zero and one in response to a clock edge; and an error detector coupled to the state detector, wherein the error detector is to detect an error in the detected logic states.

Described is an apparatus which comprises: a state detector which is operable to detect logic states of zero and one in response to a clock edge; and an error detector coupled to the state detector, wherein the error detector is to detect an error in the detected logic states.

Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.