Provided is a method for enabling a semiconductor test system for testing field programmable gate arrays (FPGAs) to operate as a device programmer by converting a serial vector format (SVF) file containing a bitstream and converting the file to a vector compatible with the semiconductor test system. When executed on an HP93K test system, as an example, the vector generates JTAG (Joint Test Action Group) signals, which program the bitstream into a Field Programmable Gate Array (FPGA). The inventive method eliminates the need for a separate computer system that is normally required to run FPGA programming software and also eliminates the need to use FPGA vendor provided JTAG programming pods. Eliminating the need for the vendor software, a separate computer system, and programming pods reduces equipment cost, maintenance, and streamlines the electrical test, evaluation, and characterization of FPGAs.

An integrated circuit includes logic circuits, a logic analyzer circuit, and a multiplexer circuit configurable to provide a value of a signal selected from one of the logic circuits to the logic analyzer circuit. The logic analyzer circuit is configured to store the value of the signal selected by the multiplexer circuit. A method is provided for capturing signals within an integrated circuit. The method includes providing a first logic signal from a first logic circuit to a multiplexer circuit, providing a second logic signal from a second logic circuit to the multiplexer circuit, selecting one of the first logic signal or the second logic signal as a selected signal using the multiplexer circuit, and storing a value of the selected signal in the logic analyzer circuit in the integrated circuit.

In an approach, a processor receives an input indicative of a set of registers, the set of registers being configured for obtaining output data from a design-under-test (DUT) in a field-programmable gate array (FPGA) module. A processor executes a set of instructions for monitoring the output data in the set of registers;. A processor generates data indicative of at least one portion of changes of the output data in the set of registers during the execution of the set of instructions. A processor causes a separate machine to analyze the data via utilizing an interface to send the data to the separate machine.

A field programmable gate array (FPGA) for improving the reliability of a key configuration bitstream by reusing a buffer memory includes a configuration buffer, a configuration memory and a control circuit. The configuration memory includes N configuration blocks. The FPGA stores a key configuration chain by using the configuration buffer and ensures correct content of the key configuration chain through an error correcting code (ECC) check function of the configuration buffer, so that when the FPGA runs normally, a control circuit reads the key configuration chain in the configuration buffer at an interval of a predetermined time and writes the key configuration chain into a corresponding configuration block to update the key configuration chain, thereby ensuring accuracy of the content of the key configuration chain and improving running reliability of the FPGA.

Systems, methods, and computer readable medium described herein relate to techniques for characterizing and/or anomaly detection in integrated circuits such as, but not limited to, field programmable gate arrays (FPGAs) and application-specific integrated circuits (ASICs). In one example aspect of certain example embodiments, a fully digital technique relies on the pulse width of signals propagated through a path under test. In another example aspect, the re-configurability of the integrated circuit is leveraged to combine the pulse propagation technique with a delay characterization technique to yield better detection of certain type of Trojans and the like. Another example aspect provides for running the test through reconfigurable path segments in order to isolate and identify anomalous circuit elements. Yet another example aspect provides for performing the characterization and anomaly detection without requiring golden references and the like.

A full-path circuit delay measurement device for a field-programmable gate array (FPGA) and a measurement method are provided. The measurement device includes two shadow registers and a phase-shifted clock, where the two shadow registers take an output of a measured combinational logic circuit as a clock and sample the phase-shifted clock SCLK as data; the two shadow registers are respectively triggered on rising and falling edges of the output of the measured combinational logic circuit to sample the phase-shifted clock; outputs of the two shadow registers are delivered by an OR gate as an input into a synchronization register; a clock of the synchronization register serves as a clock MCLK of the measured combinational logic circuit; an output of the synchronization register serves as that of the circuit delay measurement device; the phase-shifted clock SCLK and the clock MCLK of the measured combinational logic circuit have the same frequency.

Systems, methods, and computer readable medium described herein relate to techniques for characterizing and/or anomaly detection in integrated circuits such as, but not limited to, field programmable gate arrays (FPGAs) and application-specific integrated circuits (ASICs). In one example aspect of certain example embodiments, a fully digital technique relies on the pulse width of signals propagated through a path under test. In another example aspect, the re-configurability of the integrated circuit is leveraged to combine the pulse propagation technique with a delay characterization technique to yield better detection of certain type of Trojans and the like. Another example aspect provides for running the test through reconfigurable path segments in order to isolate and identify anomalous circuit elements. Yet another example aspect provides for performing the characterization and anomaly detection without requiring golden references and the like.

A data storage apparatus is provided which has a plurality of data storage units, each respective data storage unit configured to store a respective data bit of a data word. Stored data value parity generation circuitry is configured to generate a parity bit for the data word in dependence on the data bits of the data word stored in the plurality of data storage units. The stored data value parity generation circuitry is configured such that switching within the stored data value parity generation circuitry does not occur when the data word is read out from the plurality of data storage units. Transition detection circuitry is configured to detect a change in value of the parity bit.

A calibration system is disclosed. The calibration system includes a waveform generator configured to generate a periodic waveform and a control circuit in signal communication with the waveform generator. The control circuit includes an analog-to-digital converter configured to convert the periodic waveform to digital values and an electronic device in signal communication with the analog-to-digital converter. The electronic device is configured to verify calibration of (1) timing of the control circuit and (2) voltage levels of the control circuit based on the periodic waveform.

Diagnosing whether controllers of internal vehicle systems are the source of failures detected by a system control managing a vehicle such as a spacecraft. Highspeed data is received via at a field programmable gate array (FPGA) embedded in an assembly of the vehicle. The FPGA includes a controller and a digital diagnostic interface. In one embodiment, the diagnostic interface utilizes Very Highspeed Integrated Circuit (VHSIC) Hardware Description Language (VHDL) for performance modeling of a controller configured to control at least one internal system within the vehicle. The VHDL performance models the controller. Upon receiving an indication of a failure, the performance modeling of the controller is used to ascertain whether or not the controller is the source of the failure. Disassembly of the assembly housing the internal system is not required in order to ascertain whether or not the controller is the source of the failure.