A non-transitory computer-readable recording medium stores an analysis program for causing a computer to execute a process including: reading circuit data; trying to generate test data for a delay fault to be targeted; analyzing whether an underkill is caused when the targeted delay fault results in a redundant fault; and presenting circuit modification locations to avoid the underkill, based on an analysis result, when the underkill is caused.

A non-transitory computer-readable recording medium stores an analysis program for causing a computer to execute a process including: reading circuit data; trying to generate test data for a delay fault to be targeted; analyzing whether an underkill is caused when the targeted delay fault results in a redundant fault; and presenting circuit modification locations to avoid the underkill, based on an analysis result, when the underkill is caused.

An integrated circuit includes a data propagation path including a flip-flop. The flip-flop includes a first latch and a second latch. The integrated circuit includes a third latch that acts as a dummy latch. The input of the third latch is coupled to the output of the first latch. The integrated circuit includes a fault detector coupled to the output of the flip-flop and the output of the third latch. The third latch includes a signal propagation delay selected so that the third latch will fail to capture data in a given clock cycle before the second latch of the flip-flop fails to capture the data in the given clock cycle. The fault detector that detects when the third latch is failed to capture the data.

A clock control system for a scan chain generates two clock signals. During a shift phase of a testing mode of the scan chain, one clock signal is an inverted version of the other clock signal. The clock control system provides the clock signal and the inverted clock signal to two different scan flip-flops of the scan chain, respectively. Each of the two scan flip-flops performs a flip-flop operation when the received clock signal transitions from a de-asserted state to an asserted state. Thus, the two flip-flop operations are mutually exclusive during the shift phase. As a result, a dynamic voltage drop across the scan chain during the shift phase is reduced.

Disclosed herein is a pseudo-random binary sequence (PRBS) generator (200) for performing on-chip testing. It comprises of a plurality of lanes (L1-L4), wherein each lane comprises a latch group (Lg1-Lg4) capable of receiving clock signals, wherein a number of latches in each latch group is based on an output sequence to be generated for performing the on-chip testing. Each latch group is having at least one of a flip-flop and a latch is further connected with a plurality of logic gates in such a manner that an output, generated by the at least one of the flip-flop and the latch of each latch group, is provided as an input to the plurality of logic gates.

In order to generate a false failure in a logic circuit without adding a new circuit to the logic circuit, a semiconductor device includes a plurality of test points includes a test point flip-flop to fix a target node within the logic circuit to a predetermined logic level when the flip-flop holds a predetermined value. A scan chain is configured by sequentially coupling a plurality of test point slip-flops. A failure injection circuit injects a failure into the target node during the normal operation of the logic circuit, by generating failure data and by setting the generated failure data to the scan chain through a scan-in node of the scan chain.

A monitor circuit (301) for monitoring changes in an input digital value of a register circuit comprises a data input (302) configured to receive a copy of the input digital value of said register circuit, and one or more triggering signal inputs (303) configured to receive one or more triggering signals. One or more triggering edges thereof define an allowable time limit before which a digital value must appear at a data input of said register circuit to become properly stored in said register circuit. The monitor circuit comprises a data event (DE) output (305), so that said monitor circuit is configured to produce a DE signal at said DE output (305) in response to a digital value at said data input (302) changing within a time window defined by said one or more triggering signals.

An integrated circuit includes a sub-system and a reference sub-system. The reference sub-system is substantially identical to the sub-system but is non-operating by default. The integrated circuit includes a test circuit that obtains a parameter value of the sub-system and a reference parameter from the reference sub-system. The integrated circuit detects deterioration of the sub-system based on the parameter value and the reference parameter. The integrated circuit deactivates the sub-system and activates the reference sub-system responsive to detecting deterioration of the sub-system.

A testing tool includes a clock generation circuit generating a test clock and outputting the test clock via a test clock output pad, data processing circuitry clocked by the test clock, and data output circuitry receiving data output from the data processing circuitry and outputting the data via an input/output (IO) pad, the data output circuitry being clocked by the test clock. The testing tool also includes a programmable delay circuit generating a delayed version of the test clock, and data input circuitry receiving data input via the IO pad, the data input circuitry clocked by the delayed version of the test clock. The delayed version of the test clock is delayed to compensate for delay between transmission of a pulse of the test clock via the test clock output pad to an external computer and receipt of the data input from the external computer via the IO pad.

An integrated circuit includes a data propagation path including a flip-flop. The flip-flop includes a first latch and a second latch. The integrated circuit includes a third latch that acts as a dummy latch. The input of the third latch is coupled to the output of the first latch. The integrated circuit includes a fault detector coupled to the output of the flip-flop and the output of the third latch. The third latch includes a signal propagation delay selected so that the third latch will fail to capture data in a given clock cycle before the second latch of the flip-flop fails to capture the data in the given clock cycle. The fault detector that detects when the third latch is failed to capture the data.