An apparatus has a collection of ring oscillators. An instruction register block is configured to sequentially address and activate each ring oscillator in the collection of ring oscillators. A multiplexer with input lines is connected to each ring oscillator in the collection of ring oscillators and an output line. A pulse counter is connected to the output line of the multiplexer to count the number of oscillations of a selected ring oscillator within a selected time period to form a multiple bit frequency count output signal. A data shift register receives the multiple bit frequency count output signal and produces a serial frequency count output signal.

Circuits and methods involve an integrated circuit (IC) device, a plurality of application-specific sub-circuits, and a plurality of instances of a measuring circuit. The application-specific sub-circuits are disposed within respective areas of the IC device. Each instance of the measuring circuit is associated with one of the application-specific sub-circuits and is disposed within a respective one of the areas of the device. Each instance of the measuring circuit further includes a ring oscillator and a register for storage of a value indicative of an interval of time. Each instance of the measuring circuit is configured to measure passage of the interval of time based on a first clock signal, count oscillations of an output signal of the ring oscillator during the interval of time, and output a value indicating a number of oscillations counted during the interval of time.

A circuit comprises a plurality of clock control devices. Each of the clock control devices is configured to generate a scan test clock signal for a particular clock domain in the circuit and comprises circuitry configured to select clock pulses of a fast clock signal as scan capture clock pulses for the particular clock domain based on a particular clock pulse of a slow clock signal and a scan enable signal. The order and spacing between the groups of the scan capture clock pulses for different clock domains correspond to the order and spacing of the clock pulses of the slow clock signal.

A disclosed apparatus for accomplishing such a task may include (1) a circuit board incorporated into a module designed for insertion into slots of computing devices, (2) at least one conductive contact disposed on the circuit board, (3) a counter circuit disposed on the circuit board and communicatively coupled to the conductive contact, wherein the counter circuit comprises (A) a signal-change detector that detects signal changes as the module is inserted into one of the slots of the computing devices and (B) a counter device that maintains a dynamic count indicative of a number of times that the module has been inserted into one of the slots of the computing devices based at least in part on the signal changes, (4) a battery electrically coupled to the counter circuit, wherein the battery powers the counter device prior to the insertion. Various other apparatuses, systems, and methods are also disclosed.

A circuit comprises a plurality of clock control devices. Each of the clock control devices is configured to generate a scan test clock signal for a particular clock domain in the circuit and comprises circuitry configured to select clock pulses of a fast clock signal as scan capture clock pulses for the particular clock domain based on a particular clock pulse of a slow clock signal and a scan enable signal. The order and spacing between the groups of the scan capture clock pulses for different clock domains correspond to the order and spacing of the clock pulses of the slow clock signal.

A disclosed apparatus for accomplishing such a task may include (1) a circuit board incorporated into a module designed for insertion into slots of computing devices, (2) at least one conductive contact disposed on the circuit board, (3) a counter circuit disposed on the circuit board and communicatively coupled to the conductive contact, wherein the counter circuit comprises (A) a signal-change detector that detects signal changes as the module is inserted into one of the slots of the computing devices and (B) a counter device that maintains a dynamic count indicative of a number of times that the module has been inserted into one of the slots of the computing devices based at least in part on the signal changes, (4) a battery electrically coupled to the counter circuit, wherein the battery powers the counter device prior to the insertion. Various other apparatuses, systems, and methods are also disclosed.

A fail-safe counter evaluator is provided to insure proper counting operations by fail-safe counters. The failsafe counter evaluator comprises a first microprocessor, a first counter, a second counter, a second microprocessor and a test channel. The first counter is configured as a counter in operation and disposed in the first microprocessor to receive externally generated count pulses. The second counter is disposed in the first microprocessor and configured to undergo a test. The test channel is configured to send an input test signal to the second counter based on test pulses from the second microprocessor. The first microprocessor and the second microprocessor are synchronized so that to coordinate a start and an end of the test. The second counter is evaluated after the test pulses have been sent to determine if the second counter is operating properly.

A fail-safe counter evaluator is provided to insure proper counting operations by fail-safe counters. The failsafe counter evaluator comprises a first microprocessor, a first counter, a second counter, a second microprocessor and a test channel. The first counter is configured as a counter in operation and disposed in the first microprocessor to receive externally generated count pulses. The second counter is disposed in the first microprocessor and configured to undergo a test. The test channel is configured to send an input test signal to the second counter based on test pulses from the second microprocessor. The first microprocessor and the second microprocessor are synchronized so that to coordinate a start and an end of the test. The second counter is evaluated after the test pulses have been sent to determine if the second counter is operating properly.

An eye diagram measurement device includes a first mapping circuitry, a count circuitry, a second mapping circuitry and a memory circuitry. The first mapping circuitry maps one of plurality of internal signals of an electronic device to a first data signal having a predetermined number of bits. The counter circuitry performs a counting operation according to the first data signal and a plurality of signal values associated with the predetermined number of bits, to generate a plurality of count signals. The second mapping circuitry maps the count signals respectively to a plurality of eye diagram measurement signals corresponding to a present phase. The memory circuitry stores the eye diagram measurement signals in order to provide the eye diagram measurement signals to an external system for generating an eye diagram measurement result of the electronic device.

An eye diagram measurement device includes a first mapping circuitry, a count circuitry, a second mapping circuitry and a memory circuitry. The first mapping circuitry maps one of plurality of internal signals of an electronic device to a first data signal having a predetermined number of bits. The counter circuitry performs a counting operation according to the first data signal and a plurality of signal values associated with the predetermined number of bits, to generate a plurality of count signals. The second mapping circuitry maps the count signals respectively to a plurality of eye diagram measurement signals corresponding to a present phase. The memory circuitry stores the eye diagram measurement signals in order to provide the eye diagram measurement signals to an external system for generating an eye diagram measurement result of the electronic device.