Patent classifications
H01L2021/60202
MANUFACTURING METHOD OF MONOCRYSTALLINE SILICON AND MONOCRYSTALLINE SILICON
A manufacturing method of a monocrystalline silicon includes: a growth step in which a seed crystal having contacted a silicon melt is pulled up and a crucible is rotated and raised to form a straight body of the monocrystalline silicon; a separating step in which the monocrystalline silicon is separated from the silicon melt; a state holding step in which the crucible and the monocrystalline silicon are lowered and the monocrystalline silicon is kept at a level at which an upper end of the straight body is located at the same level as an upper end of a heat shield or is located below the upper end of the heat shield for a predetermined time; and a draw-out step in which the monocrystalline silicon is drawn out of a chamber.
Manufacturing method of monocrystalline silicon and monocrystalline silicon
A manufacturing method of a monocrystalline silicon includes: a growth step in which a seed crystal having contacted a silicon melt is pulled up and a crucible is rotated and raised to form a straight body of the monocrystalline silicon; a separating step in which the monocrystalline silicon is separated from the silicon melt; a state holding step in which the crucible and the monocrystalline silicon are lowered and the monocrystalline silicon is kept at a level at which an upper end of the straight body is located at the same level as an upper end of a heat shield or is located below the upper end of the heat shield for a predetermined time; and a draw-out step in which the monocrystalline silicon is drawn out of a chamber.
LASER ASSISTED BONDING METHOD
A laser assisted bonding method comprises placing a semiconductor die on a substrate, wherein the semiconductor die has on its back surface solder bumps and on its front surface an anti-reflection layer for infrared laser; and irradiating an infrared laser beam to the semiconductor die through the anti-reflection layer, to reflow the solder bumps between the semiconductor die and the substrate via heat generated due to energy of the infrared laser beam absorbed by the semiconductor die, wherein the anti-reflection layer is configured to reduce reflection of the infrared laser beam from the semiconductor die.