The invention relates to a functional chip (100) of which at least two electrical connection pads (11a, 11b) are intended for being connected to wire elements (40a, 40b). Said chip comprises: —a substrate (10) comprising a microelectronic component electrically connected to the two electrical connection pads arranged on a front face of said substrate (10), —a cover (20) comprising a first portion (21) assembled to the front face of the substrate (10), said first portion (21) forming a spacer between the two electrical connection pads; the cover (20) further comprising a second portion (22) spaced apart from the front face of the substrate (10) and extending opposite each electrical connection pad only partially, so as to allow access to said pads, along an axis (z) normal to the front face of the substrate (10). The invention likewise relates to a method for manufacturing such a functional chip.

A method of forming a semiconductor device includes forming an active region in a first side of a silicon carbide substrate, the silicon carbide substrate having a second side opposite the first side and forming a contact pad at the first side. The contact pad is coupled to the active region. The method further includes forming an etch stop layer over the contact pad and plasma dicing the silicon carbide substrate from the second side. The plasma dicing etches through the silicon carbide substrate and stops on the etch stop layer. The diced silicon carbide substrate is held together by the etch stop layer. The diced silicon carbide substrate is attached on a carrier. The diced silicon carbide substrate is separated into silicon carbide dies by cleaving the etch stop layer.

The disclosure provides a printed circuit board structure. The printed circuit board structure includes a printed circuit board, a semiconductor chip, a first pad, a second pad, a conductive wire, and a third pad. The semiconductor chip is disposed on the printed circuit board. The first pad is disposed on the semiconductor chip. The second pad is disposed on the printed circuit board. The conductive wire electrically connects the first pad and the second pad. The third pad is disposed between the first pad and the second pad. The conductive wire has a portion located on the third pad.

A semiconductor package includes a substrate and a semiconductor chip, a lower conductive layer and an upper conductive layer sequentially stacked on the substrate. The substrate includes first and second connection pads formed thereon. The semiconductor chip includes third and fourth connection pads formed thereon. The upper conductive layer is connected to the first and the third connection pads via a first and a second wiring, and the lower conductive layer is connected to the second and the fourth connection pads via a third and a fourth wiring.

The disclosure provides a printed circuit board structure. The printed circuit board structure includes a printed circuit board, a semiconductor chip, a first pad, a second pad, a conductive wire, and a third pad. The semiconductor chip is disposed on the printed circuit board. The first pad is disposed on the semiconductor chip. The second pad is disposed on the printed circuit board. The conductive wire electrically connects the first pad and the second pad. The third pad is disposed between the first pad and the second pad. The conductive wire has a portion located on the third pad.

A semiconductor package includes a substrate and a semiconductor chip, a lower conductive layer and an upper conductive layer sequentially stacked on the substrate. The substrate includes first and second connection pads formed thereon. The semiconductor chip includes third and fourth connection pads formed thereon. The upper conductive layer is connected to the first and the third connection pads via a first and a second wiring, and the lower conductive layer is connected to the second and the fourth connection pads via a third and a fourth wiring.

A semiconductor module includes: a semiconductor device having a front-side electrode; a bonding wire having a bonding portion bonded to the front-side electrode; a first sealing member; and a second sealing member. The first sealing member seals a portion where the front-side electrode and the bonding wire are bonded to each other. The second sealing member covers the first sealing member. The first sealing member is higher than the second sealing member in elastic modulus.

A semiconductor device includes first and second semiconductor elements, and first and second circuits at different potentials. The second semiconductor element, electrically connected to the first semiconductor element, relays mutual signals between the first and the second circuits, while insulating them. The semiconductor device further includes a first terminal lead electrically connected to the first semiconductor element, a first wire connected to the first and the second semiconductor elements, and a second wire connected to the first semiconductor element and the first terminal lead. The first wire contains a first metal. The second wire includes a first core containing a second metal, and a first surface layer containing a third metal and covering the first core. The second metal has a smaller atomic number than that of the first metal. The third metal has a greater bonding strength with respect to the first terminal lead than the second metal.

A semiconductor module includes: a semiconductor device having a front-side electrode; a bonding wire having a bonding portion bonded to the front-side electrode; a first sealing member; and a second sealing member. The first sealing member seals a portion where the front-side electrode and the bonding wire are bonded to each other. The second sealing member covers the first sealing member. The first sealing member is higher than the second sealing member in elastic modulus.

A method of forming a semiconductor device includes forming an active region in a first side of a silicon carbide substrate, the silicon carbide substrate having a second side opposite the first side and forming a contact pad at the first side. The contact pad is coupled to the active region. The method further includes forming an etch stop layer over the contact pad and plasma dicing the silicon carbide substrate from the second side. The plasma dicing etches through the silicon carbide substrate and stops on the etch stop layer. The diced silicon carbide substrate is held together by the etch stop layer. The diced silicon carbide substrate is attached on a carrier. The diced silicon carbide substrate is separated into silicon carbide dies by cleaving the etch stop layer.