H03K19/1737

DIE LOCATION DETECTION FOR GROUPED MEMORY DIES
20230052489 · 2023-02-16 ·

Methods, systems, and devices for die location detection for grouped memory dies are described. A memory device may include multiple memory die that are coupled with a shared bus. In some examples, each memory die may include a circuit configured to output an identifier associated with a location of the respective memory die. For example, a first memory die may output a first identifier, based on receiving one or more signals, that identifies a location of the first memory die. Identifying the locations of the respective memory dies may allow for the dies to be individually accessed despite being coupled with a shared bus.

INPUT SUPPLY CIRCUIT AND METHOD FOR OPERATING AN INPUT SUPPLY CIRCUIT
20230047185 · 2023-02-16 ·

Embodiments of input supply circuits and methods for operating an input supply circuit are described. In one embodiment, an input supply circuit includes a bias circuit configured to define a voltage threshold in response to an input signal, and an input buffer configured to generate an output signal in response to the voltage threshold. Other embodiments are also described.

METHOD PROVIDING MULTIPLE FUNCTIONS TO PINS OF A CHIP AND SYSTEM APPLYING THE METHOD
20230047676 · 2023-02-16 ·

A method for providing more than one function to pins of a programmable device used in a server system includes the programmable device and first and second devices. The programmable device is electrically connected to the first device and the second device. The programmable device includes a major logic communication device, a detection module, a storage module, and at least one multiplexing pin. The second device is powered on, sending an in-position signal to the detection module through the at least one multiplexing pin. The detection module transmits the in-position signal to the storage module. The major logic communication module communicates with the first device through the at least one multiplexing pin. A system applying the method are also disclosed.

Clock and phase alignment between physical layers and controller
11581881 · 2023-02-14 · ·

An integrated circuit (IC) for clock and phase aligning and synchronization between physical (PHY) layers and a communications controller is provided. The IC includes a clock multiplier configured to multiply a frequency of the clock signal from a plurality of PHY layers to match a frequency of a clock signal of the controller, wherein the clock signal from the plurality of PHY layers is less than the frequency of the clock signal of the controller. IC support circuitry is configured to provide the multiplied clock signal to the controller. The IC includes a first clock divider configured to divide the frequency of the multiplied clock signal and to output the divided clock signal to the controller. The IC includes a phase alignment circuit configured to align phases of one or more data signals based on a phase of the clock signal and a phase of the multiplied clock signal.

Logic drive using standard commodity programmable logic IC chips comprising non-volatile random access memory cells
11711082 · 2023-07-25 · ·

A multi-chip package includes a field-programmable-gate-array (FPGA) integrated-circuit (IC) chip configured to perform a logic function based on a truth table, wherein the field-programmable-gate-array (FPGA) integrated-circuit (IC) chip comprises multiple non-volatile memory cells therein configured to store multiple resulting values of the truth table, and a programmable logic block therein configured to select, in accordance with one of the combinations of its inputs, one from the resulting values into its output; and a memory chip coupling to the field-programmable-gate-array (FPGA) integrated-circuit (IC) chip, wherein a data bit width between the field-programmable-gate-array (FPGA) integrated-circuit (IC) chip and the memory chip is greater than or equal to 64.

Method of dynamically configuring FPGA and network security device

Provided are a method of dynamically configuring a FPGA and a network security device. The network security device includes a CPU and at least one FPGA coupled with the CPU. The CPU generates a configuration entry for a target FPGA in response to a user instruction. The configuration entry includes a classification number and a configuration content for the target FPGA. The CPU sends the configuration entry to each FPGA coupled with the CPU, Each FPGA obtains its own classification number, compares its own classification number with the classification number in the configuration entry, and stores the configuration content when the own classification number the same with the classification number in the configuration entry.

USB CONNECTOR FUNCTIONALITY MODIFICATION SYSTEM
20230237003 · 2023-07-27 ·

A Universal Serial Bus (USB) connector functionality modification system includes a USB connector coupled to a first subsystem and a second subsystem by a multiplexer device. A USB connector functionality modification subsystem is coupled to the multiplexer device and operates to receive a USB connector functionality modification instruction while the multiplexer device is configured to allow the first subsystem to transmit and receive data via the USB connector and the second subsystem cannot transmit and receive data via the USB connector. In response to receiving the USB connector functionality modification instruction, the USB connector functionality modification subsystem reconfigures the multiplexer device to allow the second subsystem to transmit and receive data via the USB connector while the first subsystem cannot transmit and receive data via the USB connector.

System and method for low power memory test

An apparatus includes a first group of memory units and a second group of memory units coupled to a first data path and a second data path coupled to a controller, a first delay element on the first data path coupled to the second group of memory units and configured to send, from the controller to the second group of memory units, signals for write and read operations in a sequence of time cycles delayed by a time cycle with respect to the first group of memory units, and a second delay element on the second data path and coupled to the first group of memory units and configured to send, from the first group of memory units to the controller, test result signals delayed by a time cycle, the delayed test result signals having a matching delay to the delayed write and read operations.

MEMORY UNIT WITH TIME DOMAIN EDGE DELAY ACCUMULATION FOR COMPUTING-IN-MEMORY APPLICATIONS AND COMPUTING METHOD THEREOF

A memory unit with time domain edge delay accumulation for computing-in-memory applications is controlled by a first word line and a second word line. The memory unit includes at least one memory cell, at least one edge-delay cell multiplexor and at least one edge-delay cell. The at least one edge-delay cell includes a weight reader and a driver. The weight reader is configured to receive a weight and a multi-bit analog input voltage and generate a multi-bit voltage according to the weight and the multi-bit analog input voltage. The driver is connected to the weight reader and configured to receive an edge-input signal. The driver is configured to generate an edge-output signal having a delay time according to the edge-input signal and the multi-bit voltage. The delay time of the edge-output signal is positively correlated with the multi-bit analog input voltage multiplied by the weight.

METHODS AND DEVICES FOR FLEXIBLE RAM LOADING
20230230650 · 2023-07-20 ·

A flexible RAM loader including a shift register that includes a first data section coupled with a serial data input, and a second data section selectively coupled with a first parallel data input. The shift register is configured to load data serially from the serial data input to the first data section and the second data section when the second data section is uncoupled from the first parallel data input, and, when the second data section is coupled with the first parallel data input, configured to load data in parallel from the serial data input into the first data section and from the first parallel data input into the second data section. The flexible RAM loader also including a test register comprising a selection bit to couple the second data section with the first parallel data input.