A range sensor and a method thereof. The range sensor includes a light source configured to project a plurality of sheets of light at an angle within a field of view (FOV); an image sensor, wherein the image sensor is offset from the light source; collection optics; and a controller connected to the light source, the image sensor, and the collection optics, and configured to simultaneously determine a range of a distant object based on direct time-of-flight (TOF) and a range of a near object based on triangulation.

An on-chip clock controller includes a primary clock gating cell and a secondary clock gating cell. The primary clock gating cell includes a first clock input terminal coupled to receive an input clock signal and a first enable input terminal coupled to receive an enable signal. The primary clock gating cell also include a first clock output terminal configured to generate a first output clock signal based at least in part on the input clock signal and the enable signal. The secondary clock gating includes a second clock input terminal coupled to receive the input clock signal and a second clock output terminal configured to generate a second output clock signal based at least in part on the input clock signal. The enable signal is based at least in part on the second output clock signal.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A range sensor and a method thereof. The range sensor includes a light source configured to project a sheet of light at an angle within a field of view (FOV); an image sensor offset from the light source; collection optics; and a controller connected to the light source, the image sensor, and the collection optics, and configured to determine a range of a distant object based on direct time-of-flight and determine a range of a near object based on triangulation. The method includes projecting, by a light source, a sheet of light at an angle within an FOV; offsetting an image sensor from the light source; collecting, by collection optics, the sheet of light reflected off objects; and determining, by a controller connected to the light source, the image sensor, and the collection optics, a range of a distant object based on direct time-of-flight and a range of a near object based on triangulation simultaneously.

A range sensor and a method thereof. The range sensor includes a light source configured to project a sheet of light at an angle within a field of view (FOV); an image sensor offset from the light source; collection optics; and a controller connected to the light source, the image sensor, and the collection optics, and configured to determine a range of a distant object based on direct time-of-flight and determine a range of a near object based on triangulation. The method includes projecting, by a light source, a sheet of light at an angle within an FOV; offsetting an image sensor from the light source; collecting, by collection optics, the sheet of light reflected off objects; and determining, by a controller connected to the light source, the image sensor, and the collection optics, a range of a distant object based on direct time-of-flight and a range of a near object based on triangulation simultaneously.

A comparator circuit is applied to comparing an input voltage and a reference voltage to generate a comparison result. The comparator circuit includes a resistor circuit, a current source circuit and a transistor switching circuit. The resistor circuit receives first and second input voltages in the input voltage. The current source circuit provides a first current and a second current, and the first current, the second current and the resistor circuit generate the reference voltage. The transistor switching circuit generates the comparison result at its output end according to a first control voltage and a second control voltage at its input end. The current source circuit and the resistor circuit generate the first control voltage according to the first current and the first input voltage, and generate the second control voltage according to the second current and the second input voltage.

A comparator circuit is applied to comparing an input voltage and a reference voltage to generate a comparison result. The comparator circuit includes a resistor circuit, a current source circuit and a transistor switching circuit. The resistor circuit receives first and second input voltages in the input voltage. The current source circuit provides a first current and a second current, and the first current, the second current and the resistor circuit generate the reference voltage. The transistor switching circuit generates the comparison result at its output end according to a first control voltage and a second control voltage at its input end. The current source circuit and the resistor circuit generate the first control voltage according to the first current and the first input voltage, and generate the second control voltage according to the second current and the second input voltage.