A device includes a first driver circuit coupled to a first bus line, where the first driver circuit includes a first delay element. The first delay element is configured to receive a first input signal and generate a first output signal. The first output signal transitions logic levels after a first delay period when the first input signal transitions from a logic high level to a logic low level. The first output signal transitions logic levels after a second delay period when the first input signal transitions from the logic low level to the logic high level. The first delay element includes a sense amplifier. The first driver circuit is configured to transmit the first output signal over the first bus line. The device also includes a second driver circuit configured to transmit a second output signal over a second bus line.

A r a level shifter circuit includes a first p-channel kick transistor connected directly across a first cross-coupled p-channel transistor, a second p-channel kick transistor connected directly across a second cross-coupled p-channel transistor, a first gate drive circuit coupled to the gate of the first p-channel kick transistor and configured to turn on first p-channel kick transistor to pull up the first output node in response to a rising edge of a signal at the input node, and a second gate drive circuit coupled to the gate of the second p-channel kick transistor and configured to turn on second p-channel kick transistor to pull up the second output node in response to a falling edge of a signal at the input node.

A flip-flop and latch circuit is disclosed. The circuit includes a single-input inverter, a dual-input inverter, a single-input tri-state inverter, a dual-input tri-state inverter, and two single-event transient (SET) filters. The single-input tri-state inverter receives an input signal D. The dual-input tri-state inverter includes a first input, a second input and an output, wherein the first input receives output signals from the dual-input inverter and the second input receives output signals from the dual-input inverter via the first SET filter. The output of the dual-input tri-state inverter sends output signals to a first input of the dual-input inverter and a second input of the dual-input inverter via the second SET filter. The single-input inverter receives inputs from the dual-input inverter to provide an output signal Q for the circuit

A flip-flop circuit is disclosed. The flip-flop circuit includes a single-input inverter, a dual-input inverter, a single-input tri-state inverter, a dual-input tri-state inverter, and two single-event transient (SET) filters. The single-input tri-state inverter receives an input signal D. The dual-input tri-state inverter includes a first input, a second input and an output, wherein the first input receives output signals from the dual-input inverter and the second input receives output signals from the dual-input inverter via the first SET filter. The output of the dual-input tri-state inverter sends output signals to a first input of the dual-input inverter and a second input of the dual-input inverter via the second SET filter. The single-input inverter receives inputs from the dual-input inverter to provide an output signal Q for the flip-flop circuit.

The present invention provides a voltage difference measurement circuit comprising a level shifting circuit, an ADC and a calculation circuit. In the operations of the voltage difference measurement circuit, the level shifting circuit adjusts levels of a supply voltage and a ground voltage to generate an adjusted supply voltage and an adjusted ground voltage, respectively. The ADC performs an analog-to-digital converting operation upon the adjusted supply voltage and the adjusted ground voltage to generate a first digital value and a second digital value, respectively. The calculation circuit calculates a voltage difference between the supply voltage and the ground voltage according to the first digital value and the second digital value.

The present invention provides a voltage difference measurement circuit comprising a level shifting circuit, an ADC and a calculation circuit. In the operations of the voltage difference measurement circuit, the level shifting circuit adjusts levels of a supply voltage and a ground voltage to generate an adjusted supply voltage and an adjusted ground voltage, respectively. The ADC performs an analog-to-digital converting operation upon the adjusted supply voltage and the adjusted ground voltage to generate a first digital value and a second digital value, respectively. The calculation circuit calculates a voltage difference between the supply voltage and the ground voltage according to the first digital value and the second digital value.

In certain aspects of the disclosure, an apparatus comprises a latching element having a data input, a first feedback input, a second feedback input, and an output. A pull-up input block is coupled to the data input and has at least a first pull-up input, and a pull-down input block is also coupled to the data input and has at least a first pull-down input. A feedback pull-down block implementing a logic function complementary to the pull-up input block is coupled to a feedback pull-down control device and responsive to the first pull-up input, and a feedback pull-up block implementing a logic function complementary to the pull-down input block is coupled to a feedback pull-up control device and responsive to the first pull-down input. The pull-up input block and pull-down input block are guaranteed not to be enabled concurrently.

A level shift circuit includes two resistors by which logic is fixed when two input terminals become low level, and a logic circuit and transistors which set the logic of an output terminal to a desired value according to the fixation of the logic.

A level shift circuit includes two resistors by which logic is fixed when two input terminals become low level, and a logic circuit and transistors which set the logic of an output terminal to a desired value according to the fixation of the logic.

A flip-flop circuit is disclosed. The flip-flop circuit includes a single-input inverter, a dual-input inverter, a single-input tri-state inverter, a dual-input tri-state inverter, and two single-event transient (SET) filters. The single-input tri-state inverter receives an input signal D. The dual-input tri-state inverter includes a first input, a second input and an output, wherein the first input receives output signals from the dual-input inverter and the second input receives output signals from the dual-input inverter via the first SET filter. The output of the dual-input tri-state inverter sends output signals to a first input of the dual-input inverter and a second input of the dual-input inverter via the second SET filter. The single-input inverter receives inputs from the dual-input inverter to provide an output signal Q for the flip-flop circuit.