A 1/n-rate decision feedback equalizer (DFE) and method include a plurality of branches. Each branch includes a summer circuit configured to add a feedback signal to a received input, and a latch configured to receive an output of the summer circuit in accordance with a clock signal. A feedback circuit includes a multiplexer configured to receive as input, an output of each branch, the multiplexer having a clocked select input and configured to multiplex the output of each branch to assemble a full rate bit sequence, and a filter configured to provide cancellation of intersymbol interference (ISI) from the received input to be provided to the summer circuit of each branch.

A data receiving circuit is provided. The data receiving circuit includes a data input circuit, a latch circuit, and a current source. The data input circuit is configured to receive an input signal. The latch circuit is configured to output an output signal in response to the input signal. The current source is configured to provide a current to the latch circuit. The current source is different from the data input circuit.

An electronic latch circuit (100) and a multi-phase signal generator (300) are disclosed. The electronic latch circuit (100) comprises an output circuit (105) comprising a first output (X, 106), a second output (Y, 107) and a third output (Z, 108). The electronic latch circuit (100) further comprises an input circuit (101) comprising a first input (A, 102), a second input (B, 103) and a clock signal input (CLK, 104). The electronic latch circuit (100) is configured to change state based on input signals at the inputs (A, B, CLK) of the input circuit (101) and a present state of the output circuit (105). The multi-phase signal generator (300) comprises a plurality N of the electronic latch circuit (100) for generating N phase signals with individual phases. The plurality N of the electronic latch circuit (100) are cascaded with each other.

A circuit to a extend signal comparison voltage range includes a latching circuit and a comparator responsive to common-mode input signals. The comparator is coupled to the latching circuit and to a dynamic node. The circuit also includes a clocked boost circuit coupled to the dynamic node. The clocked boost circuit is configured to extend a supply voltage range of the comparator via biasing the dynamic node. A method to extend a signal comparison voltage range includes selectively shifting a voltage level of one of a ground reference of a dynamic circuit or a supply reference of the dynamic circuit in response to a clock signal.

A low latency comparator circuit with a local clock circuit is disclosed. A comparator circuit configured to compare a first input signal to a second input signal. The comparator circuit includes at least one regenerative latch circuit having a first and second inputs configured to receive the first and second input signals, respectively. The comparator circuit further includes a clock circuit configured to generate and provide a clock signal exclusively to circuitry in the comparator circuit, including the at least one regenerative latch circuit. At least one output latch circuit coupled to the at least one regenerative latch circuit and configured to provide a first output signal indicative of a comparison of the first and second input signals.

A flip-flop with glitch protection is disclosed. The flip-flop includes a differential amplifier circuit that generates amplifier output signals based on an input data and clock signals and precharges a true data node when a clock signal is inactive. A latch circuit is coupled to the differential amplifier and includes a latch node. Responsive to a current value of the input data signal having a first logic state, the latch node is set at a logic value equivalent to the precharged value during an active phase of the clock signal. Responsive to the current value of the input data signal having a second logic state complementary to the first, during the active phase of the clock signal, the latch circuit causes the latch node to be set to a logic value complementary to the precharged value, using the clock signal and the current value of the input data signal.

The present disclosure includes storage circuits, such latches. In one embodiment, a circuit includes a plurality of latches, each latch including a first N-type transistor formed in a first P-type material, a first P-type transistor formed in a first N-type material, a second N-type transistor formed in a second P-type material, and a second P-type transistor formed in a second N-type material. The first and second N-type transistors are formed in different P-wells and the first and second P-type transistors are formed in different N-wells. In other storage circuits, charge extraction transistors are coupled to data storage nodes and are biased in a nonconductive state. These techniques make the data storage circuits more resilient, for example, to an ionizing particle striking the circuit and generating charge carriers that would otherwise change the state of the storage node.

A memory device including an interface to receive one or more clock signals and one or more data signal a dual-sensing stage dual-tail latch arranged at the interface. The dual-sensing stage dual-tail latch includes a sensing stage to sense a differential voltage between a first signal and a second signal and to provide a first differential voltage output and a second differential voltage output to a first node and a second node, respectively. The dual-sensing stage dual-tail latch includes a complimentary sensing stage arranged in parallel with the sensing stage and to sense the differential voltage between the first signal and the second signal, where a first complimentary differential output voltage and a second complimentary differential output of the complimentary sensing stage are coupled to the first node and the second node. The dual-sensing stage dual-tail latch includes a latch stage to receive the outputs from the first node and the second node.

To provide a miniaturized data holding circuit. First and second MOS transistors respectively transmit a data signal and an inverted data signal to inputs of first and second inverting gates that constitute a state holding circuit when a clock signal is at a first level. Fifth and sixth MOS transistors are respectively inserted in a feedback path from an output of the second inverting gate to the input of the first inverting gate and a feedback path from an output of the first inverting gate to the input of the second inverting gate, and respectively transmit the outputs of the second and first inverting gates when the clock signal is at a second signal level. Seventh and eighth MOS transistors are constituted in a channel of a conductive type different from the first MOS transistor and connected in parallel to the fifth and sixth MOS transistors, respectively, and transmit the output of the second inverting gate and the output of the first inverting gate on the basis of the inverted data signal and the data signal, respectively.

A data receiving circuit is provided. The data receiving circuit includes a first transistor, a second transistor, a third transistor, and a latch circuit. The first transistor has a gate configured to receive an input signal. The latch circuit is configured to output an output signal in response to the input signal. The second transistor has a gate configured to receive a first signal and a drain connected to the latch circuit. The third transistor has a gate configured to receive the first signal and a drain connected to the latch circuit. The second transistor and the third transistor are configured to provide a current to the latch circuit in response to the first signal.