Patent classifications
H03L7/091
LOW-POWER FRACTIONAL-N PHASE-LOCKED LOOP CIRCUIT
Disclosed is a low-power fractional-N phase-locked loop circuit, which comprises a phase detector, a voltage-to-current converter, a loop filter, a voltage-controlled oscillator, a frequency divider and a digital logic processor; the phase detector, the voltage-to-current converter, the loop filter, the voltage-controlled oscillator and the frequency divider are connected in sequence; a reference signal is input from the phase detector, the phase detector detects the phases of the reference signal and a feedback signal with a quantization error output by the frequency divider, compensates a quantization phase error generated by fractional frequency division, and outputs a compensated phase detection result to the voltage-to-current converter; the quantization error generated by fractional frequency division is converted into a voltage domain through a digital domain or directly coupled to a phase error signal in the phase detector to complete the compensation of the quantization error.
LOW-POWER FRACTIONAL-N PHASE-LOCKED LOOP CIRCUIT
Disclosed is a low-power fractional-N phase-locked loop circuit, which comprises a phase detector, a voltage-to-current converter, a loop filter, a voltage-controlled oscillator, a frequency divider and a digital logic processor; the phase detector, the voltage-to-current converter, the loop filter, the voltage-controlled oscillator and the frequency divider are connected in sequence; a reference signal is input from the phase detector, the phase detector detects the phases of the reference signal and a feedback signal with a quantization error output by the frequency divider, compensates a quantization phase error generated by fractional frequency division, and outputs a compensated phase detection result to the voltage-to-current converter; the quantization error generated by fractional frequency division is converted into a voltage domain through a digital domain or directly coupled to a phase error signal in the phase detector to complete the compensation of the quantization error.
PHASE LOCKED LOOP CIRCUIT WITH INCREASED ROBUSTNESS
A Phase Locked Loop PLL circuit and method therein for generating multiphase output signals are disclosed. The PLL circuit includes a digitally controlled oscillator, a sample circuit, an analog to digital converter and a digital processing unit. The digital processing unit comprises a phase estimator configured to estimate a phase of the multiphase output signals, a differentiator configured to calculate a phase difference between a current phase and a previous phase, and an accumulator configured to accumulate the phase differences generated by the differentiator. The PLL circuit further comprises a loop filter configured to receive an output from the accumulator and generate a control signal to the digitally controlled oscillator to adjust frequency of the digitally controlled oscillator generating the multiphase output signals.
Apparatus and methods for a phase frequency detector with a wide operational range
Described herein is a phase frequency detector (PFD) with a wide operational range. The PFD includes a first flip-flop to receive a reference clock and generate a first output signal based on differences between the reference clock and a feedback clock, a second flip-flop to receive the feedback clock and generate a second output signal based on differences between the reference the feedback clocks, a reset processing path connected to the first flip-flop and second flip-flop, the reset processing path having a reset delay to control a pulse width of a reset signal associated with the first flip-flop and second flip-flop, and an output processing path connected to the first flip-flop and second flip-flop, the output processing path having an output delay to control a pulse width of the first output signal and the second output signal, where the reset processing path and the output processing path are delay independent.
Apparatus and methods for a phase frequency detector with a wide operational range
Described herein is a phase frequency detector (PFD) with a wide operational range. The PFD includes a first flip-flop to receive a reference clock and generate a first output signal based on differences between the reference clock and a feedback clock, a second flip-flop to receive the feedback clock and generate a second output signal based on differences between the reference the feedback clocks, a reset processing path connected to the first flip-flop and second flip-flop, the reset processing path having a reset delay to control a pulse width of a reset signal associated with the first flip-flop and second flip-flop, and an output processing path connected to the first flip-flop and second flip-flop, the output processing path having an output delay to control a pulse width of the first output signal and the second output signal, where the reset processing path and the output processing path are delay independent.
Time-to-digital converter (TDC) measuring phase difference between periodic inputs
A time-to-digital converter (TDC) includes a count logic and a digital core. The count logic generates a first sequence of counts representing a first sequence of edges of a first periodic signal, and a second sequence of counts representing a second sequence of edges of a second periodic signal. The digital core generates a sequence of outputs representing the phase differences between the first periodic signal and the second periodic signal from the first sequence of counts and the second sequence of counts. Each output is generated from a pair of successive edges of the first direction of one of the periodic signals and an individual one of the other periodic signal occurring between the pair, and the output is set equal to the minimum of difference of the individual one with the first value of the pair and the individual one with the second value of the pair.
Time-to-digital converter (TDC) measuring phase difference between periodic inputs
A time-to-digital converter (TDC) includes a count logic and a digital core. The count logic generates a first sequence of counts representing a first sequence of edges of a first periodic signal, and a second sequence of counts representing a second sequence of edges of a second periodic signal. The digital core generates a sequence of outputs representing the phase differences between the first periodic signal and the second periodic signal from the first sequence of counts and the second sequence of counts. Each output is generated from a pair of successive edges of the first direction of one of the periodic signals and an individual one of the other periodic signal occurring between the pair, and the output is set equal to the minimum of difference of the individual one with the first value of the pair and the individual one with the second value of the pair.
Efficient frequency detectors for clock and data recovery circuits
A system and method for a frequency detector circuit includes: a transition detector configured to receive a data input and provide a first edge output based on transitions in the data input; a first circuit configured to generate a second edge output; a second circuit configured to generate a third edge output; and a combinational logic configured to output an UP output when at least two of the first edge output, the second edge output, and the third edge output are high and configured to output a DOWN output when the first edge output, the second edge output, and the third edge output are all low.
CLOCK JITTER MEASUREMENT CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
A circuit for measuring clock jitter includes: an internal signal generator configured to generate an internal clock signal and a single pulse signal, respectively synchronized with an input clock signal; a plurality of delay units being connected in series with each other and configured to generate respective delayed clock signals; a plurality of latch circuits configured to latch the single pulse signal in synchronization with the respective delayed clock signals, and output sampling signals; and a count sub-circuit configured to output a count value resulting from counting a number of active sampling signals of the sampling signals.
CLOCK JITTER MEASUREMENT CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
A circuit for measuring clock jitter includes: an internal signal generator configured to generate an internal clock signal and a single pulse signal, respectively synchronized with an input clock signal; a plurality of delay units being connected in series with each other and configured to generate respective delayed clock signals; a plurality of latch circuits configured to latch the single pulse signal in synchronization with the respective delayed clock signals, and output sampling signals; and a count sub-circuit configured to output a count value resulting from counting a number of active sampling signals of the sampling signals.