Systems and methods for converting an input analog signal to a digital representation thereof. A method includes determining an input analog signal voltage range of the input analog signal, and splitting the input analog signal voltage range into n+1 sub-ranges, n being a number of splits in the input analog signal voltage range. The method also includes assigning a respective N-bit coarse digital code i to each sub-range. The method also includes identifying the input analog signal with a corresponding sub-range, the corresponding sub-range having respective digital code i. A delta-sigma operation is performed on the input analog signal using upper and lower reference voltages of the corresponding sub-range that the input analog signal is identified with, to produce the digital representation.

An arithmetic circuit includes an auto-zero amplification circuit that compensates an offset of an entered differential signal, and a comparator circuit that converts an output signal from the auto-zero amplification circuit to a digital signal. The auto-zero amplification circuit and comparator circuit are provided in the same package.

The present technology relates to an image sensor, an electronic apparatus, a comparator, and a drive method which enable achievement of a noise reduction while maintaining high speed of AD conversion. An ADC for performing AD conversion for an electrical signal output from a pixel includes a comparator that compares the electrical signal and a reference signal, a level of which is changed and a counter that counts time necessary for a change of the reference signal to a coincidence of the electrical signal and the reference signal on the basis of output signals from the comparator. The comparator includes a differential amplifier that outputs a comparison result signal indicating a comparison result obtained by comparing the electrical signal and the reference signal and a plurality of output amplifiers that outputs signals obtained by amplifying the comparison result signal output from the differential amplifier as the output signals at different timings. The present technology can be applied to, for example, an ADC that performs AD conversion for an electrical signal output from a pixel.

The present technology relates to an image sensor, an electronic apparatus, a comparator, and a drive method enabling achievement of a noise reduction while maintaining high speed of AD conversion. An ADC for performing AD conversion for an electrical signal output from a pixel includes a comparator that compares the electrical signal and a reference signal, a level of which is changed and a counter that counts time necessary for a change of the reference signal to a coincidence of the electrical signal and the reference signal on the basis of output signals from the comparator. The comparator includes a differential amplifier that outputs a comparison result signal indicating a comparison result obtained by comparing the electrical signal and the reference signal and a plurality of output amplifiers that outputs signals obtained by amplifying the comparison result signal output from the differential amplifier as the output signals at different timings.

A flash analog to digital converter (ADC) includes a first, second, and third double data rate comparator core configured to determine a relative voltage of a first differential input signal during each of a rising edge and a falling edge in a single clock cycle of a comparator clock input to the comparator core. An inverted comparator clock coupled to the third comparator core reduces kickback noise. The ADC includes a first and a second floating voltage reference configured to shift a voltage of a differential comparator input by a fixed amount, and produce the first and second differential input signal. The third comparator core is cross coupled between the first and second comparator core.

A circuit including an amplifier array including an amplifier stage with M amplifiers (M2), connected to a resistor interpolator (interpolation order N2) including an input row and at least a second row, each row comprising interpolation resistors connected in series at nodes. The input row including M driven nodes connected to a respective amplifier, and connected in parallel to the second row, with at least some first-row interpolation nodes connected to corresponding second-row interpolation nodes. The resistor interpolator comprising at least one multi-row interpolation cell, with: in the input row, a driven node coupled through first and second interpolation resistors to respective adjacent first and second interpolation nodes; and in the second row, third and fourth interpolation nodes coupled through third and fourth interpolation resistors to an intermediate fifth interpolation node; and with the first and second interpolation nodes connected respectively to the third and fourth interpolation nodes.

The present technology relates to an image sensor, an electronic apparatus, a comparator, and a drive method enabling achievement of a noise reduction while maintaining high speed of AD conversion. An ADC for performing AD conversion for an electrical signal output from a pixel includes a comparator that compares the electrical signal and a reference signal, a level of which is changed and a counter that counts time necessary for a change of the reference signal to a coincidence of the electrical signal and the reference signal on the basis of output signals from the comparator. The comparator includes a differential amplifier that outputs a comparison result signal indicating a comparison result obtained by comparing the electrical signal and the reference signal and a plurality of output amplifiers that outputs signals obtained by amplifying the comparison result signal output from the differential amplifier as the output signals at different timings.

A circuit including an amplifier array including an amplifier stage with M amplifiers (M2), connected to a resistor interpolator (interpolation order N2) including an input row and at least a second row, each row comprising interpolation resistors connected in series at nodes. The input row including M driven nodes connected to a respective amplifier, and connected in parallel to the second row, with at least some first-row interpolation nodes connected to corresponding second-row interpolation nodes. The resistor interpolator comprising at least one multi-row interpolation cell, with: in the input row, a driven node coupled through first and second interpolation resistors to respective adjacent first and second interpolation nodes; and in the second row, third and fourth interpolation nodes coupled through third and fourth interpolation resistors to an intermediate fifth interpolation node; and with the first and second interpolation nodes connected respectively to the third and fourth interpolation nodes.

A reference voltage sub-system that allows fast power up after spending extended periods in an ultra-low power standby mode. The reference voltage sub-system includes a reference voltage buffer, a reference voltage keeper, an active calibration facility for selectively adjusting the reference voltage keeper output to match the reference voltage buffer output, and a selection means for selecting between the reference voltage buffer output and the reference voltage keeper output.

The present technology relates to an image sensor, an electronic apparatus, a comparator, and a drive method which enable achievement of a noise reduction while maintaining high speed of AD conversion. An ADC for performing AD conversion for an electrical signal output from a pixel includes a comparator that compares the electrical signal and a reference signal, a level of which is changed and a counter that counts time necessary for a change of the reference signal to a coincidence of the electrical signal and the reference signal on the basis of output signals from the comparator. The comparator includes a differential amplifier that outputs a comparison result signal indicating a comparison result obtained by comparing the electrical signal and the reference signal and a plurality of output amplifiers that outputs signals obtained by amplifying the comparison result signal output from the differential amplifier as the output signals at different timings. The present technology can be applied to, for example, an ADC that performs AD conversion for an electrical signal output from a pixel.