A digital-to-analog converter device including a set of components, each component included in the set of components including a number of unit cells, each unit cell being associated with a unit cell size indicating manufacturing specifications of the unit cell is provided by the present disclosure. The digital-to-analog converter device further includes a plurality of switches, each switch included in the plurality of switches being coupled to a component included in the set of components, and an output electrode coupled to the plurality of switches. The digital-to-analog converter device is configured to output an output signal at the output electrode. A first unit cell size associated with a first unit cell included in the set of components is different than a second unit cell size associated with a second unit cell included in the set of components.

A method for digital-to-analog signal conversion with distributed reconstructive filtering includes receiving a digital code synchronous to a clock signal having a first frequency, determining next states of a plurality of digital-to-analog current elements based on the digital code, combining a plurality of currents to generate an output current, and generating the plurality of currents. Each of the plurality of currents is based on a corresponding control signal of a plurality of control signals. The method includes generating the plurality of control signals based on the next states of the plurality of digital-to-analog current elements. Each of the plurality of control signals selects a first voltage level, a second voltage level, or a transitioning voltage level for use by a corresponding digital-to-analog current element. The transitioning voltage level linearly transitions from the first voltage level to the second voltage level over a predetermined number of periods of the clock signal.

A digital-to-analog converter device including a set of components, each component included in the set of components including a number of unit cells, each unit cell being associated with a unit cell size indicating manufacturing specifications of the unit cell is provided by the present disclosure. The digital-to-analog converter device further includes a plurality of switches, each switch included in the plurality of switches being coupled to a component included in the set of components, and an output electrode coupled to the plurality of switches. The digital-to-analog converter device is configured to output an output signal at the output electrode. A first unit cell size associated with a first unit cell included in the set of components is different than a second unit cell size associated with a second unit cell included in the set of components.

A digital-to-analog converter device including a set of components, each component included in the set of components including a number of unit cells, each unit cell being associated with a unit cell size indicating manufacturing specifications of the unit cell is provided by the present disclosure. The digital-to-analog converter device further includes a plurality of switches, each switch included in the plurality of switches being coupled to a component included in the set of components, and an output electrode coupled to the plurality of switches. The digital-to-analog converter device is configured to output an output signal at the output electrode. A first unit cell size associated with a first unit cell included in the set of components is different than a second unit cell size associated with a second unit cell included in the set of components.

A digital-to-analog converter device including a set of components, each component included in the set of components including a number of unit cells, each unit cell being associated with a unit cell size indicating manufacturing specifications of the unit cell is provided by the present disclosure. The digital-to-analog converter device further includes a plurality of switches, each switch included in the plurality of switches being coupled to a component included in the set of components, and an output electrode coupled to the plurality of switches. The digital-to-analog converter device is configured to output an output signal at the output electrode. A first unit cell size associated with a first unit cell included in the set of components is different than a second unit cell size associated with a second unit cell included in the set of components.

A digital-to-analog converter device including a set of components, each component included in the set of components including a number of unit cells, each unit cell being associated with a unit cell size indicating manufacturing specifications of the unit cell is provided by the present disclosure. The digital-to-analog converter device further includes a plurality of switches, each switch included in the plurality of switches being coupled to a component included in the set of components, and an output electrode coupled to the plurality of switches. The digital-to-analog converter device is configured to output an output signal at the output electrode. A first unit cell size associated with a first unit cell included in the set of components is different than a second unit cell size associated with a second unit cell included in the set of components.

A detector for measuring a resistance of a variable resistance sensor (VRS) that varies with respect to a time-varying stimulus (e.g., temperature) includes a voltage reference having variation with respect to operating conditions and a linearized digital-to-analog converter (LIDAC) having a known transconductance that uses the voltage reference to generate a current for pumping into the VRS to cause the VRS to generate a voltage sensed by the detector. The sensed voltage includes error due to the variation of the voltage reference. The detector also includes a programmable gain amplifier (PGA) that gains up the sensed voltage to generate an output signal, an ADC that converts the output signal to a digital value, and a digital processor that computes the resistance of the VRS using the digital value and the known transconductance. The PGA is non-varying with respect to the time-varying stimulus.

Single-stage and multiple-stage current-mode Analog-to-Digital converters (iADC)s utilizing apparatuses, circuits, and methods are described in this disclosure. The disclosed iADCs can operate asynchronously and be free from the digital clock noise, which also lowers dynamic power consumption, and reduces circuitry overhead associated with free running clocks. For their pseudo-flash operations, the disclosed iADCs do not require their input current signals to be replicated which saves area, lowers power consumption, and improves accuracy. Moreover, the disclosed methods of multi-staging of iADCs increase their resolutions while keeping current consumption and die size (cost) low. The iADC's asynchronous topology facilitates decoupling analog-computations from digital-computations, which helps reduce glitch, and facilitates gradual degradation (instead of an abrupt drop) of iADC's accuracy with increased input current signal frequency. The iADCs can be arranged with minimal digital circuitry (i.e., be digital-light), thereby saving on die size and dynamic power consumption.

A family of current mode analog to digital converters, or TiADC, utilizing methods, circuits, and apparatuses, are disclosed with the following benefits: (1) There are normal and random non-systematic mismatch between devices in silicon manufacturing, that introduce non-linearity in current mode analog to digital converter's, or iADC, reference network. The iADC's linearity is improved by utilizing a thermometer current mode signal conditioning method, SCM. Successive applications of the SCM effectuates a segmented current reference network to function like a thermometer network, which operates based on the function of summation. Having a TiADC with a thermometer reference network, where current segments are summed or accumulated incrementally, would inherently reduce the impact of statistical distribution of component's random mismatch on the iADC's non-linearity. Accordingly, linearity of TiADC can be improved by the square root of the sum of the square of mismatch errors of the number of segmented current references in the thermometer network. (2) speed is improved by operating the TiADC in current mode, which is inherently faster. (3) voltage swings in current mode are small, which enables he iADC to operate at lower power supply voltages. (4) The TiADC can operate in subthreshold and at very low currents, which lower powers consumption. (5) the TiADC is asynchronous. Being clock free, TiADC has lower dynamic power consumption with reduces digital system noise. (6) the signal conditioning method or SCM utilized in TiADC provides concurrent functions of analog differencing and digital comparison. This trait enhances the dynamic response of iADC, wherein the digital output throughput accuracy degrades gradually and not abruptly as a function of increasing frequency of iADC's input signal. (7) No passive devices, such as capacitors or resistors, are required for the TiADC. (8) TiADC can be fabricated on low cost mainstream standard digital CMOS processes.

A family of current mode analog to digital converters, or TiADC, utilizing methods, circuits, and apparatuses, are disclosed with the following benefits: (1) There are normal and random non-systematic mismatch between devices in silicon manufacturing, that introduce non-linearity in current mode analog to digital converter's, or iADC, reference network. The iADC's linearity is improved by utilizing a thermometer current mode signal conditioning method, SCM. Successive applications of the SCM effectuates a segmented current reference network to function like a thermometer network, which operates based on the function of summation. Having a TiADC with a thermometer reference network, where current segments are summed or accumulated incrementally, would inherently reduce the impact of statistical distribution of component's random mismatch on the iADC's non-linearity. Accordingly, linearity of TiADC can be improved by the square root of the sum of the square of mismatch errors of the number of segmented current references in the thermometer network. (2) speed is improved by operating the TiADC in current mode, which is inherently faster. (3) voltage swings in current mode are small, which enables the iADC to operate at lower power supply voltages. (4) The TiADC can operate in subthreshold and at very low currents, which lower powers consumption. (5) the TiADC is asynchronous. Being clock free, TiADC has lower dynamic power consumption with reduces digital system noise. (6) the signal conditioning method or SCM utilized in TiADC provides concurrent functions of analog differencing and digital comparison. This trait enhances the dynamic response of iADC, wherein the digital output throughput accuracy degrades gradually and not abruptly as a function of increasing frequency of iADC's input signal. (7) No passive devices, such as capacitors or resistors, are required for the TiADC. (8) TiADC can be fabricated on low cost mainstream standard digital CMOS processes.