A DAC, for use in an iADC, is configured for converting a multi-bit word to an analog feedback signal. The DAC comprises a MMS logic block. It further comprises a plurality of output elements configured to generate respective analog portions based on a selection vector and a signal combiner for combining the analog portions to the analog feedback signal. In the MMS logic block switching blocks are arranged cascaded. Each switching block receives at least a portion of the multi-bit word, splits the portion into two sub-portions and forwards them to one subsequent switching block or to one output element. A weight factor is adjusted by multiplying it with the difference of the two sub-portions. A weight accumulator accumulates successive adjusted weight factors, wherein the way of splitting the portion of a further multi-bit word is determined based on the sign of the weight accumulator.

An exemplary quantizer includes a multi-bit analog-to-digital converter (ADC) and a first digital-to-analog converter (DAC) feedback circuit. The multi-bit ADC has an internal DAC associated with comparison of each sampled analog input of the multi-bit ADC. The multi-bit ADC converts a currently-sampled analog input into a first digital output. A first noise-shaped truncation output is derived from the first digital output. The first DAC feedback circuit transfers a first truncation residue associated with the first noise-shaped truncation output to the internal DAC. The transferred first truncation residue is reflected in comparison of a later-sampled analog input of the multi-bit ADC via the internal DAC.

Noise and distortion reduction in a signal processed through analog circuitry includes providing noise reduction circuitry to reduce signal noise generated by at least one analog circuit element. The noise reduction circuitry is adaptively configured to adjust a rate to apply noise reduction to the signal without introducing unwanted distortion. Distortion reduction circuitry is adaptively configured to adjust a rate to apply distortion reduction to the signal without introducing unwanted noise. The signal is processed through the analog circuitry using the adaptively configured noise reduction circuitry and adaptively configured distortion reduction circuitry to reduce both noise and distortion in the signal.

A data converter is disclosed. The data converter includes a loop-filter, a quantizer, an analog dynamic element matching (DEM) shuffler, a digital DEM shuffler and a feedback digital-to-analog converter. The loop-filter receives analog signals from an analog input. The quantizer then converts the filtered analog signals from the loop-filter to digital signals at a digital output. The analog DEM shuffler shuffles a set of analog threshold levels of the quantizer to yield a set of partially shuffled digital data at an output of the quantizer. The digital DEM shuffler shuffles the set of partially shuffled digital data from the output of the quantizer to yield a set of shuffled digital data. The feedback digital-to-analog converter converts the set of shuffled digital data to a set of analog data to be fed back to the loop-filter.

A Sigma Delta analog-to-digital converter (ADC) and a method for eliminating idle tones of the Sigma Delta ADC are provided. The Sigma Delta ADC includes a loop filter, a quantizer, an adder and a digital-to-analog converter (DAC). The loop filter performs filtering on a difference between an analog input signal and an analog feedback signal to generate a filtered signal. The quantizer is coupled to the loop filter, and generates a digital output signal according to the filtered signal. The adder is coupled to the quantizer, and adds a digital dithering signal to the digital output signal to generate a digital feedback signal. The DAC is coupled to the loop filter, and generates the analog feedback signal according to the digital feedback signal.

A delta-sigma (Σ-Δ) modulator and method for reducing nonlinear error and gain error. The Σ-Δmodulator includes: a plurality of sampling capacitors, configured to sample an input voltage or simultaneously sample an input voltage and a reference voltage signal; an operational amplifier; a plurality of switches, configured to select to sample the input voltage and the reference voltage signal; an integrating capacitor, configured to perform integration superposition on the input voltage and the reference voltage signal sampled by the sampling capacitors; and a control assembly, configured to control, to select to sample the reference voltage signal or simultaneously sample the input voltage and the reference voltage signal within a cycle, and to perform clock control on the sampling capacitors that simultaneously sample the input voltage and the reference voltage signal within a next cycle.

An analog-to-digital converter comprises a first integrator (40), a first converter input (19), a first reference voltage input (34), a capacitor array (68) comprising capacitor elements (171), and a rotation frequency control unit (37) providing a rotation signal (SRO) with at least two different values of a rotation frequency (fR). A first subset of capacitor elements (171) of the capacitor array (68) is coupled to the first converter input (19) and to an input side of the first integrator (40) in a first phase and is coupled to the first reference voltage input (34) and to the input side of the first integrator (40) in a second phase as a function of the rotation signal (SRO).

An analog-to-digital converter comprises a first integrator (40), a first converter input (19), a first reference voltage input (34), a capacitor array (68) comprising capacitor elements (171), and a rotation frequency control unit (37) providing a rotation signal (SRO) with at least two different values of a rotation frequency (fR). A first subset of capacitor elements (171) of the capacitor array (68) is coupled to the first converter input (19) and to an input side of the first integrator (40) in a first phase and is coupled to the first reference voltage input (34) and to the input side of the first integrator (40) in a second phase as a function of the rotation signal (SRO).

Σ-Δ modulator and method for reducing nonlinear error and gain error. The Σ-Δ modulator includes: a plurality of sampling capacitors, configured to sample an input voltage or simultaneously sample an input voltage and a reference voltage signal; an operational amplifier; a plurality of switches, configured to select to sample the input voltage and the reference voltage signal; an integrating capacitor, configured to perform integration superposition on the input voltage and the reference voltage signal sampled by the sampling capacitors; and a control assembly, configured to control, to select to sample the reference voltage signal or simultaneously sample the input voltage and the reference voltage signal within a cycle, and to perform clock control on the sampling capacitors that simultaneously sample the input voltage and the reference voltage signal within a next cycle. During input sampling, Vref signals of two capacitors are simultaneously sampled to offset an overlarge area of the integrating capacitor, and a pseudo random number is used to control a polling timing of the capacitors to solve a problem of idle tone of a Σ-Δ modulator, so that the area of the integrating capacitor is effectively reduced, thereby reducing manufacturing costs of an integrated circuit and reducing an output swing.

Systems and methods are disclosed for a signal convertor comprising a resistor or current source coupled to a positive virtual ground node and a negative virtual ground node, wherein the resistor or current source is configured to switch from the positive virtual ground node (VGP) to the negative virtual ground node (VGN), wherein the switching of the resistor or current source results in a shaping of the low frequency noise from the resistor.