An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

The present application discloses a successive approximation register analog-to-digital converter with passive noise shaping, which comprises: switch capacitor arrays for acquiring analog input signals; a noise shaping circuit which is a passive integral network, the network has input ends connected respectively with output ends of the two switch capacitor arrays and for acquiring output signals of the two switch capacitor arrays, is composed of a plurality of sub passive integrators, and reconfigures the plurality of sub passive integrators to different circuit forms; a comparator which has two input ends connected respectively with output ends of the passive integral network and an output end connected with an input end of a logic circuit, and is configured to compare magnitudes of the output signals of the noise shaping circuit.

There is described a hybrid ADC device for converting an analog input signal (Vin) into a digital output signal (Vout), the device comprising a first ADC circuit configured to receive the analog input signal (Vin) and convert it into a first digital signal (Y0); a DAC circuit configured to receive the first digital signal and convert it into a first analog signal; a delay circuit configured to delay the analog input signal; a first combiner configured to generate an analog residual signal by subtracting the first analog signal from the delayed analog input signal; a second ADC circuit configured to receive the residual analog signal and convert it into a second digital signal (Y1); a filter circuit configured to receive the first digital signal and output a filtered first digital signal (Y0′), the filter circuit having a transfer function corresponding to a combined transfer function of the DAC circuit and the second ADC circuit; and a second combiner configured to generate the digital output signal (Vout) by adding the second digital signal and the filtered first digital signal, wherein the first ADC circuit comprises an anti-aliasing filter. Furthermore, a corresponding method and an automobile radar system are described.

Herein disclosed are some examples of metastability detectors and compensator circuitry for successive-approximation-register (SAR) analog-to-digital converters (ADCs) within delta sigma modulator (DSM) loops. A metastability detector may detect metastability at an output of a SAR ADC and compensator circuitry may implement a compensation scheme to compensate for the metastability. The identification of the metastability and/or compensation for the metastability can avoid detrimental effects and/or errors to the DSM loops that may be caused by the metastability of the SAR ADCS.

Analog to digital conversion circuitry has an input sampling buffer, which has an input sampling capacitor for sampling an analog signal. The conversion circuitry also has a successive-approximation-register analog to digital converter (SAR-ADC) which converts the sampled analog signal to a digital signal. The input sampling buffer has an amplifier and a gain-control capacitor, and has an amplification configuration and an error-feedback configuration. In the amplification configuration, the input sampling capacitor is coupled to the amplifier and gain-control capacitor, with the gain-control capacitor connected in feedback with the amplifier, for applying gain to the sampled analog signal. In the error-feedback configuration, the gain-control capacitor is decoupled from the input sampling capacitor and receives a residue voltage from the SAR-ADC, such that the level of the analog signal determined in the amplification configuration varies depending on the residue voltage received onto the gain-control capacitor in the error-feedback configuration.

In certain aspects, an analog-to-digital converter (ADC) includes a comparator having a first input, a second input, and an output. The ADC also includes a digital-to-analog converter (DAC) coupled to the first input of the comparator, a switching circuit, a first capacitor coupled between the first input of the comparator and the switching circuit, a second capacitor coupled between the first input of the comparator and the switching circuit, and an amplifying circuit having an input and an output, wherein the input of the amplifying circuit is coupled to the switching circuit. The ADC further includes a first switch coupled between the output of the amplifying circuit and the DAC, and a successive approximation register (SAR) having an input and an output, wherein the input of the SAR is coupled to the output of the comparator, and the output of the SAR is coupled to the DAC.

An excess loop delay compensation (ELDC) technique for use with a successive approximation register (SAR) based quantizer in a continuous time delta-sigma ADC is described. The techniques can efficiently program and calibrate the ELD gain in ELD compensation SAR quantizers. An ELDC circuit can include a charge pump having a digitally programmable capacitance to adjust a gain, such as the gain of the ELDC digital-to-analog converter (DAC) or the gain of the SAR DAC.

An exemplary quantizer includes a multi-bit analog-to-digital converter (ADC) and a first digital-to-analog converter (DAC) feedback circuit. The multi-bit ADC has an internal DAC associated with comparison of each sampled analog input of the multi-bit ADC. The multi-bit ADC converts a currently-sampled analog input into a first digital output. A first noise-shaped truncation output is derived from the first digital output. The first DAC feedback circuit transfers a first truncation residue associated with the first noise-shaped truncation output to the internal DAC. The transferred first truncation residue is reflected in comparison of a later-sampled analog input of the multi-bit ADC via the internal DAC.

This disclosure relates to a current-to-digital converter suitable for wide-ranging current sensing applications. In particular, the current-to-digital converter comprises a delta-sigma analogue-to-digital converter which utilizes a successive-approximation-register to control a modulation of the sensed current so that the digital conversion of the modulated sensed current by the delta-sigma analogue-to-digital converter may be done with high precision.

Circuitry and techniques are described herein for performing accurate and low power conversion of an analog value into a digital value. According to some aspects, this disclosure describes a successive approximation register (SAR) analog to digital converter (ADC). According to some aspects the SAR ADC comprises an active integrator between a sample and hold stage and a comparator stage. The active integrator operates differently dependent on whether the SAR ADC is operated in a sample phase or a conversion phase. According to other aspects, the SAR ADC utilizes a ring oscillator-based comparator to compare a sampled analog input value to a plurality of reference values to determine a digital value representing the analog value.