H04N25/623

SOLID-STATE IMAGING DEVICE AND ELECTRONIC DEVICE

A light-detecting device includes a photoelectric conversion film configured to generate a hole as a photoelectric charge and a readout circuit. The readout circuit includes a first node configured to hold the photoelectric charge generated by the photoelectric conversion film and a first P-type metal oxide semiconductor (MOS) transistor connected to the first node and a constant voltage source.

Photoelectric conversion device, imaging system, and movable object

A photoelectric conversion device includes a pixel unit having pixels arranged to form rows and columns, each including a transfer transistor that transfers charge in a photoelectric converter to an output unit, and a pixel control unit that controls the pixels. The pixel control unit is configured to supply a control signal in accordance with an exposure period individually defined for pixel blocks of the pixel unit to pixels of each pixel block and read out, from each pixel, a first signal obtained when the photoelectric converter is in a reset state and a second signal based on charge accumulated in the photoelectric converter during the exposure period. A period excluding both the exposure period and a readout period of the second signal corresponds to a reset period of the photoelectric converter. The transfer transistor is off in a readout period of the first and second signals.

CMOS active pixel structure
09854194 · 2017-12-26 · ·

The invention concerns a structure of a CMOS active pixel, comprising a semi-conductive substrate (1) of a first type, at least one first photodiode operating in photovoltaic mode comprising a photovoltaic conversion area (2) defined by a doped area of a second type forming a PN junction with the substrate, said first photodiode re-emitting photoelectric charge carriers collected by the PN junction during the exposure of said first photodiode to a light, at least one second photodiode operating in integration mode and reverse-biased, said second photodiode comprising a charge accumulation area (3) defined by a doped area of the second type forming a PN junction with the substrate, said charge accumulation area being exposed to the charge carriers from the photovoltaic conversion area (2) in order to accumulate such charge carriers.

IMAGING APPARATUS, DRIVE METHOD, AND ELECTRONIC APPARATUS

An imaging apparatus with logarithmic characteristics includes: a photodiode that receives light; a well tap unit that fixes the potential of an N-type region of the photodiode; and a resetting unit that resets the photodiode, a P-type region of the photodiode outputting a voltage signal equivalent to a photocurrent subjected to logarithmic compression. The first potential to be supplied to the well tap unit is made lower than the second potential to be supplied to the resetting unit, so that the capacitance formed with the PN junction of the photodiode is charged when the resetting unit performs a reset operation. The present technology can be applied to unit pixels having logarithmic characteristics.

Image sensors with enhanced wide-angle performance
11251218 · 2022-02-15 · ·

Imaging apparatus (2000, 2100, 2200) includes a photosensitive medium (2004, 2204) and an array of pixel circuits (302), which are arranged in a regular grid on a semiconductor substrate (2002) and define respective pixels (2006, 2106) of the apparatus. Pixel electrodes (2012, 2112, 2212) are connected respectively to the pixel circuits in the array and coupled to read out photocharge from respective areas of the photosensitive medium to the pixel circuits. The pixel electrodes in a peripheral region of the array are spatially offset, relative to the regular grid, in respective directions away from a center of the array.

Image sensor for supplying a different voltage to pixels based on illumination change, operation method thereof, and device having an image sensor

An image sensor includes a pixel array including a plurality of pixels, a row driver configured to control an operation of each of the plurality of pixels, a voltage supply line connected to a reset transistor included in each of the plurality of pixels, and a voltage supply circuit which detects a signal from the voltage supply line and supplies one of a first voltage and a second voltage to the voltage supply line based on the signal from the voltage supply line.

IMAGE SENSOR HAVING LED FLICKER MITIGATION FUNCTION AND IMAGE PROCESSING SYSTEM INCLUDING THE IMAGE SENSOR

Disclosed are an image sensor having a light-emitting diode (LED) flicker mitigation function and an image processing system including the image sensor. The image processing system includes an image sensor including a plurality of pixels, the plurality of pixels configured to respectively generate pixel signals corresponding to photocharges, and configured to perform analog-to-digital conversion (ADC) on the pixel signals to generate digital pixel signals; and an image signal processor configured to process the digital pixel signals to generate image data. The image sensor operates in a first operating mode in a situation in which a light-emitting diode (LED) light is provided, and operates in a second operating mode in a general situation in which the LED light is not provided.

IMAGING DEVICE

An imaging device includes: a solid-state imaging element having a plurality of pixel cells arranged in a matrix; and a control part configured to control the solid-state imaging element. The pixel cells each include an avalanche photodiode, a floating diffusion part configured to accumulate electric charges, a transfer transistor connecting a cathode of the avalanche photodiode and the floating diffusion part, and a reset transistor for resetting electric charges accumulated in the floating diffusion part. The control part controls the reset transistor to discharge electric charges exceeding a predetermined electric charge amount, of electric charges accumulated in the floating diffusion part from the cathode of the avalanche photodiode via the transfer transistor.

Semiconductor structure and operating method for improving charge transfer of image sensor device

An image sensor semiconductor device includes a first photodiode disposed in a semiconductor substrate and configured to generate charges in response to radiation, a first transistor disposed adjacent to the first photodiode, a floating diffusion region configured to store the generated charges, a reset transistor configured to reset the floating diffusion region, and a second transistor disposed over the substrate between the first photodiode and the reset transistor. The first transistor and the second transistor are configured to generate a first electric field and a second electric field, respectively, to move the charges generated by the first photodiode to the floating diffusion region.

Single-ended capacitive trans-impedance amplifier (CTIA) unit cell for two-color applications

An image capturing device is provided, which includes a capacitive trans-impedance amplifier (CTIA) unit cell. The CTIA unit cell includes an image detector and a switching network. The image detector is configured to detect light having a first color and light having a second color different from the first color, and to generate a photocurrent in response to detecting the light. The switching network includes a CTIA switch, a CTIA low reset switch, and a CTIA high-reset biasing switch. The CTIA switch sets a first reset level of the CTIA unit cell to a first voltage in response invoking a first switching state of the CTIA low-reset switch and sets a second reset level of the CTIA to a second voltage greater than the first voltage level in response to invoking a second switching state of the CTIA low-reset switch.