The present disclosure provides a TFT, its manufacturing method, an array substrate and a display device. The method includes steps of: forming a pattern of a gate electrode on a base substrate; forming a gate insulation layer with an even surface; forming a pattern of a polysilicon semiconductor layer; and forming patterns of a source electrode and a drain electrode. The step of forming the pattern of the polysilicon semiconductor layer includes: crystallizing the amorphous silicon layer, so as to form the polysilicon semiconductor layer.

A manufacturing method of an array substrate, an array substrate and a display apparatus are provided. The manufacturing method includes: providing a base substrate; sequentially forming an active layer and a first insulating layer that covers the active layer on the base substrate; performing one patterning process on the first insulating layer, so as to form a first through hole and a second through hole that expose the active layer in the first insulating layer, and form a first recess at a surface of the first insulating layer; forming a conductive layer on the patterned first insulating layer, with the conductive layer being filled in the first through hole, the second through hole and the first recess; conducting a grinding process to form a source electrode, a drain electrode and a pixel electrode are formed respectively.

The present application discloses a thin film transistor, a method for manufacturing a thin film transistor and a liquid crystal display panel, and relates to a display technology field. The thin film transistor includes a substrate, a gate electrode layer and an insulating layer, the gate electrode layer is formed on the substrate, the insulating layer is covered on the gate layer; a semiconductor layer is formed on the insulating layer; a conductor layer is formed on the semiconductor layer; an insulating spacer layer is formed on the insulating layer; a source-drain electrode layer is formed on the conductor layer and the insulating spacer layer; a passivation layer formed on the source-drain electrode layer and the semiconductor layer; wherein the insulating spacer layer is located between the source-drain electrode layer and the semiconductor layer to solve the leakage current too large problem of the thin film transistor.

The present disclosure discloses a manufacturing method of a polycrystalline silicon thin film, which includes: forming a first amorphous silicon thin film; crystallizing the first amorphous silicon thin film to form a polycrystalline silicon thin film by applying an excimer laser annealing process; forming a second amorphous silicon thin film on a first surface of the polycrystalline silicon thin film; and etching until the second amorphous silicon thin film is completely removed toward a direction of the polycrystalline silicon thin film from the second amorphous silicon thin film by applying a dry etching process. The present disclosure further discloses a manufacturing method of a thin film transistor array substrate which includes the steps of manufacturing an active layer: forming a layer of a polycrystalline silicon thin film according to the previous polycrystalline silicon thin film; and etching the polycrystalline silicon thin film to form a patterned active layer.

An array substrate, a manufacturing method thereof, and a display device are provided. The array substrate includes a base substrate; a first conductive layer located on the base substrate, including a source electrode of a switching element; and a color filter layer located on the first conductive layer, wherein the source electrode of the switching element and the color filter layer are abutted in a direction perpendicular to the base substrate.

A thin film transistor substrate according to an embodiment comprises: a support substrate; a bonding layer disposed on the support substrate; a thin film transistor disposed on the bonding layer, wherein the thin film transistor includes a channel layer containing a nitride-based semiconductor layer, a source electrode electrically connected to a first region of the channel layer, a drain electrode electrically connected to a second region of the channel layer, a gate electrode disposed below the channel layer, and a depletion forming layer disposed between the channel layer and the gate electrode; and a pixel electrode disposed on the thin film transistor and electrically connected to the drain electrode of the thin film transistor. The thin film transistor substrate according to the embodiment, and a display panel and a display device including the same have an advantage of implementing high resolution and reproducing a soft moving image by providing a high carrier mobility.

Improved thin film transistor device and method, comprising transparent multi-layer thin-film transistors (TFT) disposed over a flexible polyethylene naphthalate (PEN) substrate with a nano-crystalline ZnO channel layer, and a novel HfLaO passivation layer. This device, which may be made at room temperature, has a high field-effect mobility (.sub.FE) of 345 cm2/Vs, small sub-threshold slope (SS) of 103 mV/dec, high on-current/off-current (I.sub.ON/I.sub.OFF) of 710.sup.6, and a low drain-voltage (V.sub.D) of 2V for low power operation. Although prior art ZnO based TFT had unimpressive performance, use of the novel HfLaO passivation layer appears to greatly improve the performance of ZnO TFT by preventing trace levels of H.sub.2O from forming unwanted ZnOH bonds, thus disrupting ZnO nanocrystals. At least some of the problems with prior ZnO TFT may be attributed to these ZnOH bonds, which damage ZnO crystallinity, create charged scattering centers, and form potential barriers that degrade mobility.

A thin film transistor (TFT) substrate having reduced differences in heights in areas thereof so as to facilitate subsequent processing is disclosed. In one aspect, the TFT substrate includes a substrate having a first area in which a TFT is not disposed and a second area in which a TFT is disposed, a height adjustment layer disposed on the substrate in an area corresponding to at least a part of the first area. The TFT substrate also includes a TFT disposed on the substrate in an area corresponding to the second area.

A thin film transistor structure in which a source electrode and a drain electrode formed from a metal material are in direct contact with an oxide semiconductor film may lead to high contact resistance. One cause of high contact resistance is that a Schottky junction is formed at a contact plane between the source and drain electrodes and the oxide semiconductor film. An oxygen-deficient oxide semiconductor layer which includes crystal grains with a size of 1 nm to 10 nm and has a higher carrier concentration than the oxide semiconductor film serving as a channel formation region is provided between the oxide semiconductor film and the source and drain electrodes.

A SOI substrate is covered by a semiconductor material pattern which includes a dividing pattern made from electrically insulating material. The dividing pattern is coated by one or more semiconductor materials. The semiconductor material pattern is covered by a gate electrode which is facing the dividing pattern. The semiconductor material pattern and the gate pattern are covered by a cap layer. The substrate is eliminated to access the source/drain regions. Two delineation patterns are formed to cover the source region and drain region and to leave the dividing pattern free. A second cap layer is deposited and access vias are formed to access the source/drain regions by elimination of the delineation patterns.