A body layer formed of a semiconductor layer, the body layer comprising, a first region, a second region, and a channel region positioned therebetween; a channel stopper formed on the channel region; source and drain electrodes electrically connected to the first and second regions via first and second contact layers respectively are provided. Each of the first and second contact layers comprises an impurities-containing first amorphous silicon layer; a thickness of each of the first and second regions is less than a thickness of the channel region; and the first and second regions comprise a second amorphous silicon layer containing impurities in a concentration being less than a concentration of impurities contained in the first amorphous silicon layer. This makes it possible to suppress a photoexcited current and improve the aperture ratio in a case that a display apparatus is configured.

A driving substrate is provided. The driving substrate includes a substrate and a thin film transistor disposed on the substrate. The thin film transistor is divided into at least two active blocks. Two adjacent ones of the at least two active blocks are separated from each other by a first gap, and a ratio of the first gap to an average width of the two adjacent ones of the at least two active blocks in a first direction is greater than or equal to 0.1 and less than 0.5.

This liquid crystal display apparatus is provided with: a TFT substrate comprising a thin film transistor and a pixel electrode connected to the thin film transistor; and a counter substrate comprising a common electrode that faces the pixel electrode via a liquid crystal layer. The thin film transistor comprises: a semiconductor layer deposited over a gate electrode via a gate insulating layer, while having a planar shape that has a first side and a second side each overlapping the gate electrode in plan view; and a first electrode which is connected to the pixel electrode and a second electrode which faces the first electrode, said first and second electrodes being formed on the semiconductor layer. The first side and the second side of the semiconductor layer are adjacent to each other at a predetermined angle; and the first electrode at least partially covers the first side and the second side.

A load, a transistor which controls a current value supplied to the load, a capacitor, a power supply line, and first to third switches are provided. After a threshold voltage of the transistor is held by the capacitor, a potential in accordance with a video signal is inputted and a voltage that is the sum of the threshold voltage and the potential is held. Accordingly, variation in current value caused by variation in threshold voltage of the transistor can be suppressed. Therefore, a desired current can be supplied to a load such as a light emitting element. In addition, a display device with a high duty ratio can be provided by changing a potential of the power supply line.

An image sensor (32) includes a plurality of pixel sensing portion (320) that are arranged in columns and rows. Each of the pixel sensing portions (320) includes a thin film transistor (11), and a photodetection diode (13) including n-type (16), intrinsic (15), and p-type semiconductor layers (14). The intrinsic semiconductor layer (15) of the photodetection diode (13) of each of the pixel sensing portions (320) has a crystallinity gradient that varies from an amorphous silicon structure to a microcrystalline silicon structure along a first direction (L1) extending from the p-type semiconductor layer (14) toward the n-type semiconductor layer (16). An image sensing-enabled display apparatus (3) and a method of making the image sensor (32) are also disclosed.

Embodiments herein describe techniques for a semiconductor device, which may include a substrate, a metallic encapsulation layer above the substrate, and a gate electrode above the substrate and next to the metallic encapsulation layer. A channel layer may be above the metallic encapsulation layer and the gate electrode, where the channel layer may include a source area and a drain area. In addition, a source electrode may be coupled to the source area, and a drain electrode may be coupled to the drain area. Other embodiments may be described and/or claimed.

The present invention provides an amorphous silicon thin film transistor and a manufacturing method of the amorphous silicon thin film transistor, which comprise: a substrate, a gate electrode layer, a gate insulating layer, an active layer, a source/drain electrode layer, an N+-doped layer, a protective insulating layer, and a passivation layer. The N+-doped layer is disposed between the active layer and the source/drain electrode layer. The protective insulating layer is disposed on the source/drain electrode layer. A channel is formed in the source/drain electrode layer and penetrates the N+-doped layer and the protective insulating layer. The passivation layer covers the channel and the protective insulating layer. The protective insulating layer and the source/drain electrode layer are flush with each other in the channel.

A device includes a first transistor having a first source, a first gate, a first drain, and one or more electrodes. The first transistor serves as an inverter. The device also includes a second transistor having a second source, a second gate, and a second drain. The first and second sources are connected together. The first and second drains are connected together. The second transistor serves as an output, a driver, or both. The one or more electrodes, the second gate, or a combination thereof serve as tapped drains that are configured to sample a stepped voltage of the second transistor.

A device includes a first stage having a first optical switch, a first transistor connected to the first optical switch, and a second transistor connected to the first optical switch and the first transistor. The device also includes a second stage having a second optical switch, a third transistor connected to the second transistor and the second optical switch, and a fourth transistor connected to the second transistor, the second optical switch, and the third transistor.

In some embodiments, the present disclosure relates to an integrated chip that includes a gate electrode over a substrate, and a gate dielectric layer arranged over the gate electrode. The gate dielectric layer includes a ferroelectric material. An active structure is arranged over the gate dielectric layer and includes a semiconductor material. A source contact and a drain contact are arranged over the active structure. A capping structure is arranged between the source and drain contacts and over the active structure. The capping structure includes a first metal material.