According to one aspect of the present disclosure a system and method of enhancing random test case generation during pre-silicon design verification of test models of very large scale integration (VLSI) processors and systems is provided. A test sequence including a specification of at least one target state value for at least one resource of the hardware design model is received and includes a state object having at least one state element defining the target state value for a resource. Instructions are generated to transition the at least one resource from an existing state to the at least one target state value. The instructions are executed according to the test sequence to transition the resources to the defined state. State information on the hardware design model is output to allow a process engineer to determine whether the target state value for the resource was successfully changed.

A method and system for predicting an insulated gate bipolar transistor (IGBT) lifetime based on compound failure mode coupling are provided. First, a simultaneous failure probability model of a bonding wire and a solder layer is calculated. Next, expectancy of the simultaneous failure probability model is calculated and recorded as a lifetime under a coupling effect. A coupling function relation is established. A lifetime of the solder layer and a lifetime of the bonding wire are predicted. An IGBT lifetime prediction model not taking the coupling effect into account is established. An IGBT lifetime prediction model taking the coupling effect into account is established. In the disclosure, the lifetime of the IGBT module under the coupling effect of the solder layer and the bonding wire may be accurately predicted.

A device for simulating a battery condition includes a plurality of electrically conductive plates, the plurality of electrically conductive plates including a set of opposing plates having a first plate and a second plate. The device also includes an electrically conductive material extending between the first plate and the second plate, the electrically conductive material in electrical contact with the first plate and the second plate and defining at least part of an electrical path from the first plate to the second plate, the electrically conductive material having a resistance selected to simulate the battery condition in response to activating the device.

The present invention relates to an apparatus for calibrating a battery simulator having an input and an output, wherein a current path with an apparatus for measuring the current strength and with at least one capacitor is provided between the input and output. Furthermore, a voltage path can be provided between the input and output, with an apparatus for measuring the voltage and/or a current transformer, in the secondary current of which the apparatus for measuring the current strength is connected. If a battery simulator is connected to the apparatus it can charge the capacitor and then the capacitor can charge the battery simulator, whilst the current strength and voltage are measured, and on that basis the internal measurement devices of the battery simulator are calibrated.

Computer-based simulation of a device under test (DUT) corresponding to a user circuit design includes providing an adapter configured to couple to the DUT during the computer-based simulation (simulation). The adapter is configured to translate incoming high-level programming language (HLPL) transactions into DUT compatible data for conveyance to the DUT and translate DUT compatible data generated by the DUT to outgoing HLPL transactions. A communication server is provided that couples to the adapter during the simulation. The communication server is configured to exchange the incoming and outgoing HLPL transactions with an entity executing external to the simulation. A communication layer client is provided that is configured to execute external to the simulation and exchange the incoming and outgoing HLPL transactions with the communication server. The communication layer client provides an application programming interface through which an external computer program generates data traffic to drive the DUT within the simulation.

An artificial intelligence (AI) based system and method for electrical design inspection, configured to autonomously extract, convert, and analyze data from electrical documentation related to electrical circuits by utilizing AI algorithms along with deterministic algorithms in order to produce output results.

A method for predicting failure parameters of semiconductor devices can include receiving a set of data that includes (i) characteristics of a sample semiconductor device, and (ii) parameters characterizing a stress condition. The method further includes extracting a plurality of feature values from the set of data and inputting the plurality of feature values into a trained model executing on the one or more processors, wherein the trained model is configured according to an artificial intelligence (AI) algorithm based on a previous plurality of feature values, and wherein the trained model is operable to output a failure prediction based on the plurality of feature values. Further, the method includes generating, via the trained model, a predicted failure parameter of the sample semiconductor device due to the stress condition.

Provided is a battery state monitoring circuit and a battery device capable of predicting a state of charge of a secondary battery with high accuracy. The battery state monitoring circuit includes a pseudo-equivalent circuit of the secondary battery, and causes a current flowing through a sense resistor to flow to the pseudo-equivalent circuit of the secondary battery, to thereby measure a pseudo-open circuit voltage of the secondary battery.

A battery emulation apparatus for supplying a device-under-test (DUT) with electrical power, comprising output terminals for connecting the DUT and an output voltage module providing a variable DC output voltage. A user interface receives a user input comprising the setting of battery parameter(s) and measurement criteria. A data storage stores data representing battery models. A processor selects a battery model based on the parameter(s) and controls the output voltage module to emulate characteristics of the selected battery model(s) according the data, while supplying the DUT with the output voltage. The processor monitors a response of the DUT and/or the output voltage module to the emulated characteristics of the selected battery model(s), wherein the response comprises a physical measurement value. The processor evaluates said physical measurement value based on the set measurement criteria in order to assess the suitability of the selected model(s).

Provided are an apparatus for testing an adaptor, a method for testing an adaptor, and a computer storage medium. The apparatus includes a testing module, a host computer, and an electronic load. The testing module is coupled with the electronic load to simulate a working state of an electronic device, to acquire a simulated battery voltage value corresponding to the working state. The testing module is configured to be coupled with an adaptor to-be-tested to control, according to the simulated battery voltage value, the adaptor to-be-tested to be in a target output state. The testing module is coupled with the host computer, to detect the target output state of the adaptor to-be-tested to obtain output information of the adaptor to-be-tested and send the output information to the host computer. The host computer is configured to output a test result of the adaptor to-be-tested according to the output information of the adaptor to-be-tested.