A system for testing a circuit comprises scan chains, a controller configured to generate a bit-inverting signal based on child test pattern information, and bit-inverting circuitry coupled to the controller and configured to invert bits of a parent test pattern associated with a plurality of shift clock cycles based on the bit-inverting signal to generate a child test pattern during a shift operation. Here, the plurality of shift clock cycles for bit inverting occur every m shift clock cycles, and the child test pattern information comprises information of m and location of the plurality of shift clock cycles in the shift operation.

An integrated circuit chip includes a plurality of function blocks; a mode controller configured to convert an input signal, received from an external device through an input/output pin, into an input pattern and test mode setting data which include a plurality of bits, and to output the test mode setting data and a mode switching enable signal when a secure pattern generated therein is the same as the input pattern; and a mode setting module configured to control the plurality of function blocks to operate in a test mode according to the mode setting data, in response to the test mode switching enable signal.

A circuit comprises: a bit-flipping signal generation device comprising a storage device and configured to generate a bit-flipping signal based on bit-flipping location information, the storage device configured to store the bit-flipping location information for a first number of bits, the bit-flipping location information obtained through a fault simulation process; a pseudo random test pattern generator configured to generate test patterns based on the bit-flipping signal, the pseudo random test pattern generator comprising a register configured to be a linear finite state machine, the register comprising storage elements and bit-flipping devices, each of the bit-flipping devices coupled to one of the storage elements; and scan chains configured to receive the test patterns, wherein the bit-flipping signal causes one of the bit-flipping devices to invert a bit of the register each time a second number of test patterns is being generated by the pseudo random test pattern generator during a test.

An integrated circuit. The integrated circuit comprises a timebase generator and a switch mode direct current-to-direct current (DC-to-DC) converter coupled to the timebase generator. The timebase generator comprises a linear feedback shift register (LFSR) having an output and a logic circuit comprising a first logic inverter, a first AND logic gate, and a first multiplexer, wherein the first logic inverter has an input coupled to a most significant bit of the output of the LFSR, wherein the first AND logic gate has a first input coupled to a second most significant bit of the output of the LFSR and a second input coupled to an output of the first logic inverter, wherein a selector input of the first multiplexer is coupled to an output of the first AND logic gate.

Test stimulus signals applied to at least one circuit under test are produced in a set of test stimulus generators as a function of test stimulus information loaded in test stimulus registers. Loading of the test stimulus information in the test stimulus registers is controlled as a function of test programming information loaded via a programming interface in a respective control register in a set of control registers. The test stimulus generators are activated as a function of the test programming information loaded in said control registers. Test outcome signals received from the at least one circuit under test are used to produce signature comparison signals, which are compared with respective programmable signature reference signals stored in a set of input signature registers, are produced in response to the signature comparison signals produced from the test outcome signals failing to match with the respective reference signals.

Disclosed herein is a pseudo-random binary sequence (PRBS) generator (200) for performing on-chip testing. It comprises of a plurality of lanes (L1-L4), wherein each lane comprises a latch group (Lg1-Lg4) capable of receiving clock signals, wherein a number of latches in each latch group is based on an output sequence to be generated for performing the on-chip testing. Each latch group is having at least one of a flip-flop and a latch is further connected with a plurality of logic gates in such a manner that an output, generated by the at least one of the flip-flop and the latch of each latch group, is provided as an input to the plurality of logic gates.

An artificial intelligence (AI)-based constrained random verification (CRV) method for a design under test (DUT) includes: receiving a series of constraints; obtaining a limited constraint range according to the series of constraints; generating a series of stimuli according to the limited constraint range; and verifying the DUT by the series of stimuli; wherein at least one of the step of obtaining the limited constraint range according to the series of constraints and the step of generating the series of stimuli according to the limited constraint range employs an AI algorithm.

A device for printing to a recording medium with an inkjet printing unit that has at least one nozzle arrangement and is designed to generate a print image on the recording medium. The print image includes at least one test pattern that exhibits at least two different spatial frequencies. The device also has an image acquisition unit that is designed to acquire an image of an acquisition region on the recording medium, which acquisition region includes at least a portion of the test pattern; and a processor that is designed to generate image data corresponding to the image and determine a functional state of the nozzle arrangement, by means of the image data, using a neural network.

In one embodiment, an apparatus includes at least one fabric to interface with a plurality of intellectual property (IP) blocks of the apparatus, the at least one fabric including at least one status storage, and a fabric bridge controller coupled to the at least one fabric. The fabric bridge controller may be configured to initiate a functional safety test of the at least one fabric in response to a fabric test signal received during functional operation of the apparatus, receive a result of the functional safety test via the at least one status storage, and send to a destination location a test report based on the result. Other embodiments are described and claimed.

A system comprising at least one hardware processor and a non-transitory computer-readable storage medium having stored thereon program code, the program code executable by the at least one hardware processor to receive a sequence comprising n bits, apply a transformation to the sequence to obtain a time-frequency signal representation of the sequence, analyze the signal to measure one or more intensity values of the transformed sequence, and determine the presence of a periodic segment within the sequence when one of the intensity values deviates from a specified value range.