A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client. A method of providing usage-aware compressed data from a test and measurement instrument includes acquiring waveform data from one or more devices under test, receiving a user input through a user interface, determining one or more requested data types based on the user input, transforming the waveform data into compressed data containing only data elements corresponding to the one or more requested data types, and transmitting the compressed data to a client.

System analysis by receiving a model of a complex system design. The model includes at least one layer. The analysis includes performing a plurality of simulations of the performance of the layer. The number of simulations is determined according to a number of system components associated with the layer. The analysis further includes determining a worst-case result for a set of simulations from the plurality of simulations and assigning the worst-case result to an overall system simulation.

An apparatus includes a base portion configured to selectively couple with a robotic arm. A shaft extends distally form the base portion and terminating into a distal end. A sleeve is slidably coupled to the shaft. A colpotomy cup is fixedly secured to a portion of the sleeve. A plurality of sensors are configured to locate the position of the sleeve relative to one or more anatomical features of a patient. The sensors are further configured to locate the position of the sleeve relative to the shaft.

Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test two chips of the wafer, respectively. Further, the two testing ports have different testing functions. Therefore, during the wafer testing process, a single testing device can perform multiple testing operations.

Embodiments of the present disclosure relate to methods of finding optimized analog measurement hardware settings of a measurement system for a target measurement. The method can include one or more of the following steps: applying initial settings to the measurement system; varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal; performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers.

Embodiments are directed to a computer implemented method and system for the testing, characterization and diagnostics of integrated circuits. A system might include a device under test, such as an integrated circuit, that includes an adaptive microcontroller. The method includes loading a testing program for execution by the adaptive microcontroller, causing the microcontroller to execute the testing program. Once results from the testing program are received, the testing program can be adaptively modified based on the results. The modified testing program can be run again. The testing program can modify parameters of the integrated circuit that are not externally accessible. Other embodiments are also disclosed.

A measurement task is selected, where the measurement task is associated with a transmission of an encoded signal transmitted via a plurality of data lines. The encoded signal is encoded using one or more of 3-Phase, N-Phase, or N-factorial low-voltage differential signaling (LVDS) where N is at least three (3). A repeating waveform is generated corresponding to the measurement task. The repeating waveform corresponding to the measurement task is then transmitted via the plurality of data lines.

A technique for testing an electronic UUT by a test apparatus includes obtaining multiple DFTs of a test signal received from the UUT with the test apparatus configured differently for obtaining each DFT. The resulting DFTs include both valid content representing the test signal and invalid content introduced by the test apparatus. The improved technique suppresses the invalid content by generating a corrected DFT, which provides minimum magnitude values for corresponding frequencies relative to the test signal across the multiple DFTs.

Provided is a test apparatus including an optical test signal generating section that generates an optical test signal; an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test; a first optical switch section that selects, from among optical signals output by the plurality of devices under test, the optical signal output by the device under test that is the testing target; and an optical signal receiving section that receives the selected optical signal.

Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test two chips of the wafer, respectively. Further, the two testing ports have different testing functions. Therefore, during the wafer testing process, a single testing device can perform multiple testing operations.