G11C29/28

Apparatuses and methods for parallel writing to multiple memory device structures

The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.

Apparatuses and methods for parallel writing to multiple memory device structures

The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEVICE STRUCTURES

The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEVICE STRUCTURES

The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.

BUILT-IN SELF-TEST CIRCUITS FOR MEMORY SYSTEMS HAVING MULTIPLE CHANNELS
20230178166 · 2023-06-08 ·

A memory system includes a plurality of memory devices having respective arrays of memory cells therein, a bus electrically coupled to and shared by the plurality of memory devices, and a memory controller. The memory controller, which is electrically coupled to the bus, includes a built-in self-test (BIST) circuit, which is commonly connected to the plurality of memory devices. The BIST circuit is configured to transfer a command set including a test pattern to the plurality of memory devices via the bus, and transfer a command trigger signal for driving the test pattern to the plurality of memory devices via the bus.

BUILT-IN SELF-TEST CIRCUITS FOR MEMORY SYSTEMS HAVING MULTIPLE CHANNELS
20230178166 · 2023-06-08 ·

A memory system includes a plurality of memory devices having respective arrays of memory cells therein, a bus electrically coupled to and shared by the plurality of memory devices, and a memory controller. The memory controller, which is electrically coupled to the bus, includes a built-in self-test (BIST) circuit, which is commonly connected to the plurality of memory devices. The BIST circuit is configured to transfer a command set including a test pattern to the plurality of memory devices via the bus, and transfer a command trigger signal for driving the test pattern to the plurality of memory devices via the bus.

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEVICE STRUCTURES

The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEVICE STRUCTURES

The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.

MEMORY APPARATUS AND MEMORY TESTING METHOD THEREOF
20220215893 · 2022-07-07 · ·

A memory apparatus and a memory testing method are provided. The memory testing method includes: generating a plurality of testing patterns; writing each of the testing patterns to a plurality of selected memory blocks of the memory according to a setting address; reading out a plurality of pieces of readout data from the selected memory blocks according to the setting address; and comparing the plurality of pieces of readout data to generate a testing result.

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEVICE STRUCTURES

The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.