The present disclosure includes apparatuses and methods for parallel writing to multiple memory device locations. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of resolved instructions and/or constant data from the host. The memory controller is configured to write the resolved instructions and/or constant data in parallel to a plurality of locations the memory device.

The present disclosure includes apparatuses and methods related to a memory device as the store to pre-resolved instructions. An example apparatus comprises a memory device coupled to a host via a data bus and a control bus. The memory device includes an array of memory cells and sensing circuitry coupled to the array via a plurality of sense lines. The sensing circuitry includes sense amplifiers and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of address translated instructions and/or constant data from the host. The memory controller is configured to write the address translated instructions and/or constant data to a plurality of locations in a bank of the memory device in parallel.

The present disclosure includes apparatuses and methods related to a memory device as the store to pre-resolved instructions. An example apparatus comprises a memory device coupled to a host via a data bus and a control bus. The memory device includes an array of memory cells and sensing circuitry coupled to the array via a plurality of sense lines. The sensing circuitry includes sense amplifiers and a compute component configured to implement logical operations. A memory controller in the memory device is configured to receive a block of address translated instructions and/or constant data from the host. The memory controller is configured to write the address translated instructions and/or constant data to a plurality of locations in a bank of the memory device in parallel.

A flash memory comprising a first plurality of memory cells, each memory cell of the first plurality of memory cells selectively connected to a first input of a comparator. A second plurality of memory cells selectively connected to a second input of the comparator, wherein a first number of the second plurality of memory cells are in an erased state, wherein a second number of the second plurality of memory cells are in a written state, wherein each memory cell of the first plurality of memory cells and each memory cell of the second plurality of memory cells has a first cell capacitance, and wherein the sum of the first number and the second number is at least three.

A flash memory comprising a first plurality of memory cells, each memory cell of the first plurality of memory cells selectively connected to a first input of a comparator. A second plurality of memory cells selectively connected to a second input of the comparator, wherein a first number of the second plurality of memory cells are in an erased state, wherein a second number of the second plurality of memory cells are in a written state, wherein each memory cell of the first plurality of memory cells and each memory cell of the second plurality of memory cells has a first cell capacitance, and wherein the sum of the first number and the second number is at least three.

A memory calibration method and system and a vehicle system are disclosed. The method includes reading a first set of data from a first memory, wherein the first set of data includes pre-stored parameters for calibrating a second memory comprising a controller; performing a first verification process on the first set of data; performing a second verification process on the first set of data when the first set of data passes the first verification process; adopting the first set of data to configure the controller of the second memory when the first set of data passes the second verification process; and performing a test for the second memory to determine whether finishing a current calibration process for the second memory, wherein the second memory has been calibrated when the second memory passes the test.

A gate driving circuit and a display panel with the gate driving circuit are provided. The gate driving circuit includes shift registers for providing scan signals to gate lines of the display panel. Each shift register includes a main circuit and a discharge circuit. In the main circuit, a pre-charge unit is coupled to a first node and is configured to output a pre-charge signal to the first node, a pull-up unit is coupled to the first node and a second node and is configured to output an m.sup.th stage scan signal of the 1.sup.st to N.sup.th stage scan signals to the second node; and a reset unit is coupled to the first node and is configured to receive a reset signal. In the discharge circuit, a pull-down unit is coupled to the first node and the second node and is configured to receive a pull-down control signal.

A memory system and method of operating the same is described, where the memory system is used to store data in a RAIDed manner. The stored data may be retrieved, including the parity data so that the stored data is recovered when the first of either the stored data without the parity data, or the stored data from all but one memory module and the parity data, has been received. The writing of data, for low write data loads, is managed such that only one of the memory modules of a RAID stripe is being written to, or erased, during a time interval.

A memory system and method of operating the same is described, where the memory system is used to store data in a RAIDed manner. The stored data may be retrieved, including the parity data so that the stored data is recovered when the first of either the stored data without the parity data, or the stored data from all but one memory module and the parity data, has been received. The writing of data, for low write data loads, is managed such that only one of the memory modules of a RAID stripe is being written to, or erased, during a time interval.

The present disclosure relates to circuit structures and, more particularly, to circuit structures which detect high speed and high precision characterization of VTsat and VTlin of FET arrays and methods of manufacture and use. The circuit includes a control loop comprised of a differential amplifier, a plurality of FET arrays, and at least one analog switch enabling selection between a calibration mode and an operation mode.