Enhanced operational amplifier trim circuitry and techniques are presented herein. In one implementation, a circuit includes a reference circuit configured to produce a set of reference voltages, and a digital-to-analog conversion (DAC) circuit. The DAC circuit comprises a plurality of transistor pairs, where each pair among the plurality of transistor pairs is configured to provide portions of adjustment currents for an operational amplifier based at least on the set of reference voltages and sizing among transistors of each pair. The circuit also includes drain switching elements coupled to drain terminals of the transistors of each pair and configured to selectively couple one or more of the portions of the adjustment currents to the operational amplifier in accordance with digital trim codes.

One or more examples relate to an apparatus to amplify differential voltage signal components of voltage across a resistor. Such an apparatus may include a resistor; a differential amplification circuit operatively coupled with the resistor to amplify a differential voltage signal component of a voltage across the resistor; and an operative coupling between the resistor and the differential amplification circuit to pass the differential voltage signal component and isolate a common mode voltage signal component of the voltage across the resistor.

A circuit includes an amplifier having first and second inputs and an output, and a feedback circuit configured to generate a feedback voltage in response to a voltage at the output of the amplifier. The feedback circuit is coupled to the first input of the amplifier to provide the feedback voltage to the first input of the amplifier. An output circuit is configured to generate a variable bias current in response to the voltage at the output of the amplifier. A switch circuit is configured to switch the second input of the amplifier from receiving a first reference voltage during a first mode of operation to receiving a second reference voltage during a second mode of operation.

Disclosed is a system comprising a plurality of operational amplifiers, each operational amplifier having individually adjustable operational parameters, and a trimming circuit. The trimming circuit includes successive approximation register (SAR) logic that determines associated memory values. The trimming circuit changes the adjustable operational parameters of each operation amplifier based on the associated memory values.

The present invention provides a common-mode rejection ratio and gain trimming circuit of differential amplifier, comprising: a first trimming unit and a second trimming unit coupled between an in-phase input voltage and a reference voltage, wherein the first trimming unit and the second trimming unit are coupled to a positive input terminal of the differential amplifier by means of tap switches; a third trimming unit and a fourth trimming unit coupled between tan inverting input voltage and an output terminal of the differential amplifier, wherein the third trimming unit and the fourth trimming unit are coupled to a negative input terminal of the differential amplifier by means of tap switches; wherein, the first trimming unit, the second trimming unit, the third trimming unit, and the fourth trimming unit comprise: a first trimming resistor string and a second trimming resistor string coupled in series; the first trimming resistor string is coupled in parallel with a first trimming auxiliary resistor string, and the second trimming resistor string is coupled in parallel with a second trimming auxiliary resistor string; wherein, the second trimming resistor string of the first trimming unit is coupled to the second trimming resistor string of the second trimming unit, and the second trimming resistor string of the third trimming unit is coupled to the second trimming resistor string of the fourth trimming unit.

Enhanced operational amplifier trim circuitry and techniques are presented herein. In one implementation, a circuit includes a reference circuit configured to produce a set of reference voltages, and a digital-to-analog conversion (DAC) circuit. The DAC circuit comprises a plurality of transistor pairs, where each pair among the plurality of transistor pairs is configured to provide portions of adjustment currents for an operational amplifier based at least on the set of reference voltages and sizing among transistors of each pair. The circuit also includes drain switching elements coupled to drain terminals of the transistors of each pair and configured to selectively couple one or more of the portions of the adjustment currents to the operational amplifier in accordance with digital trim codes.

A high bandwidth Hall sensor includes a high bandwidth path and a low bandwidth path. The relatively high offset (from sensor offset) of the high bandwidth path is estimated using a relatively low offset generated by the low bandwidth path. The relatively high offset of the high bandwidth path is substantially reduced by combining the output of the high bandwidth path with the output of the low bandwidth path to generate a high bandwidth, low offset output. The offset can be further reduced by including transimpedance amplifiers in the high bandwidth sensors to optimize the frequency response of high bandwidth Hall sensor.

A method for use in an analog circuit having a plurality of differential pairs of elements, wherein for each pair of the plurality of differential pairs of elements, the elements of the pair are designed to match but may have mismatch that induces error. The method includes, for each pair of at least two pairs of the plurality of differential pairs of elements: spectrally separating the mismatch-induced error of the pair from mismatch-induced error of a remainder of the plurality of differential pairs of elements, monitoring, by an analog-to-digital converter (ADC), an output of the analog circuit, and analyzing the monitored output to measure the mismatch-induced error of the pair.

A method for matching a pair of composite circuit elements (CEs) included in a circuit includes fabricating N CEs (e.g., resistors, transistors, current sources, capacitors) designed to match and switches configurable, according to M different combinations, to connect N/2 of the N CEs to form a first composite CE and to connect a remaining N/2 of the N CEs to form a second composite CE. Sequentially in time, for each combination of the M combinations, the switches are configured to form the first and second composite CEs according to the combination and a characteristic of the circuit is measured that includes the formed first and second composite CEs. The characteristic indicates how well the formed composite CEs match. A final combination of the M combinations is chosen whose measured characteristic indicates a best match and the final combination is used to configure the switches to form the composite CEs.

The present disclosure provides an offset voltage correction circuit and an offset voltage correction method, including: a data obtaining module, configured to receive a data signal and a reference signal, and obtain a data indicator signal based on a comparison result of the reference signal and an offset data signal, the offset data signal being a data signal superimposed with an offset signal; a trimming enable module, configured to receive the data signal, the reference signal, the data indicator signal and an enable signal, obtain a theoretical indicator signal based on a comparison result of the data signal and the reference signal if the enable signal is of a high level, and generate an enable flag signal based on a comparison result of the theoretical indicator signal and the data indicator signal; and an offset correction module, configured to cancel the offset signal based on the enable flag signal.