H03K3/356121

HIGH SPEED VOLTAGE LEVEL SHIFTER

In one embodiment, a voltage level shifter includes a first p-type metal-oxide-semiconductor (PMOS) transistor having a gate configured to receive an input signal in a first power domain, and a second PMOS transistor, wherein the first and second PMOS transistors are coupled in series between a supply voltage of a second power domain and a node. The voltage level shifter also includes an inverter having an input coupled to the node and an output coupled to a gate of the second PMOS transistor, and a first n-type metal-oxide-semiconductor (NMOS) transistor having a gate configured to receive the input signal in the first power domain, wherein the first NMOS transistor is coupled between the node and a ground.

RESILIENT STORAGE CIRCUITS
20230231544 · 2023-07-20 ·

The present disclosure includes an integrated circuit comprising a first pair of complementary transistors configured in series, a second pair of complementary transistors configured in series, and at least one charge extraction transistor having a gate coupled to a first potential, a source coupled to a second potential, and a drain coupled to a data storage node of one of the first or second pairs of complementary transistors. The first potential and second potential bias the at least one charge extraction transistor in a nonconductive state. The drain of the at least one charge extraction transistor is formed in a doped material shared with a drain of a transistor of the first or second pairs of complementary transistors.

Low hold multi-bit flip-flop

Circuits, systems, and methods are described herein for increasing a hold time of a master-slave flip-flop. A flip-flop includes circuitry configured to receive a scan input signal and generate a delayed scan input signal; a master latch configured to receive a data signal and the delayed scan input signal; and a slave latch coupled to the master latch, the master latch selectively providing one of the data signal or the delayed scan input signal to the slave latch based on a scan enable signal received by the master latch.

High speed flipflop circuit

High-speed flipflop circuits are disclosed. The flipflop circuit may latch a data input signal or a scan input signal using a first signal, a second signal, a third signal, and a fourth signal generated inside the flipflop circuit, and may output an output signal and an inverted output signal. The flipflop circuit includes a first signal generation circuit configured to generate the first signal; a second signal generation circuit configured to generate the second signal; a third signal generation circuit configured to receive the second signal and generate the third signal; and an output circuit configured to receive the clock signal and the second signal, and output an output signal and an inverted output signal.

FEEDBACK FOR MULTI-LEVEL SIGNALING IN A MEMORY DEVICE
20230081735 · 2023-03-16 ·

Methods, systems, and devices for feedback for multi-level signaling in a memory device are described. A receiver may use a modulation scheme to communicate information with a host device. The receiver may include a first circuit, a second circuit, a third circuit, and a fourth circuit. Each of the first circuit, the second circuit, the third circuit, and the fourth circuit may determine, for a respective clock phase, a voltage level of a signal modulated using the modulation scheme. The receiver may include a first feedback circuit, a second feedback circuit, a third feedback circuit, and a fourth feedback circuit. The first feedback circuit that may use information received from the first circuit at the first clock phase and modify the signal input into the second circuit for the second clock phase.

Resilient storage circuits

The present disclosure includes storage circuits, such latches. In one embodiment, a circuit includes a plurality of latches, each latch including a first N-type transistor formed in a first P-type material, a first P-type transistor formed in a first N-type material, a second N-type transistor formed in a second P-type material, and a second P-type transistor formed in a second N-type material. The first and second N-type transistors are formed in different P-wells and the first and second P-type transistors are formed in different N-wells. In other storage circuits, charge extraction transistors are coupled to data storage nodes and are biased in a nonconductive state. These techniques make the data storage circuits more resilient, for example, to an ionizing particle striking the circuit and generating charge carriers that would otherwise change the state of the storage node.

FLIP FLOP INCLUDING SERIAL STACK STRUCTURE TRANSISTORS
20220337231 · 2022-10-20 · ·

A flip flop includes a precharge circuit configured to charge a first node by bridging a power voltage node and the first node, the charging of the first node by the precharge circuit according to a voltage level of a clock signal, the charging of the first node by the precharge circuit based on at least two PMOS transistors arranged in series, a discharge circuit configured to discharge the first node by bridging the first node and a ground node, the discharging of the first node according to an input signal and the clock signal, and a second node configured to be charged or discharged, the charging and the discharging of the second node according to a voltage level of the first node.

Logic drive based on standard commodity FPGA IC chips
11625523 · 2023-04-11 · ·

A chip package used as a logic drive, includes: multiple semiconductor chips, a polymer layer horizontally between the semiconductor chips; multiple metal layers over the semiconductor chips and polymer layer, wherein the metal layers are connected to the semiconductor chips and extend across edges of the semiconductor chips, wherein one of the metal layers has a thickness between 0.5 and 5 micrometers and a trace width between 0.5 and 5 micrometers; multiple dielectric layers each between neighboring two of the metal layers and over the semiconductor chips and polymer layer, wherein the dielectric layers extend across the edges of the semiconductor chips, wherein one of the dielectric layers has a thickness between 0.5 and 5 micrometers; and multiple metal bumps on a top one of the metal layers, wherein one of the semiconductor chips is a FPGA IC chip, and another one of the semiconductor chips is a NVMIC chip.

Cell of transmission gate free circuit and integrated circuit layout including the same

A semiconductor standard cell of a flip-flop circuit includes semiconductor fins extending substantially parallel to each other along a first direction, electrically conductive wirings disposed on a first level and extending substantially parallel to each other along the first direction, and gate electrode layers extending substantially parallel to a second direction substantially perpendicular to the first direction and formed on a second level different from the first level. The flip-flop circuit includes transistors made of the semiconductor fins and the gate electrode layers, receives a data input signal, stores the data input signal, and outputs a data output signal indicative of the stored data in response to a clock signal, the clock signal is the only clock signal received by the semiconductor standard cell, and the data input signal, the clock signal, and the data output signal are transmitted among the transistors through at least the electrically conductive wirings.

LEVEL SHIFTER AND A METHOD FOR SHIFTING VOLTAGE LEVEL
20170373691 · 2017-12-28 ·

A level shifter comprises a first control switch (207) for connecting an output terminal to a first supply voltage (VDDH) to set an output signal to be high, and a second control switch (208) for connecting the output terminal to a signal ground (GND) to set the output signal to be low. The level shifter comprises a pre-charging switch (210) for connecting the output terminal to the first supply voltage, and an input gate circuit (211) for controlling an ability of an input signal to control the second control switch. The level shifter comprises a keeper circuit (212) for controlling the first control switch based on the output signal. The first control switch is controlled with the first supply voltage when the output signal is low, and with a second supply voltage that is between the first supply voltage and the signal ground when the output signal is high.