A semiconductor device includes: a first latch circuit that includes a first inverting circuit, a second inverting circuit, a third inverting circuit, and a fourth inverting circuit; a first first-type well region; a second first-type well region; and a second-type well region. In a plan view, a distance between a drain of a first-type MOS transistor in the first inverting circuit and a drain of a first-type MOS transistor in the third inverting circuit is longer than a distance between the drain of the first-type MOS transistor in the first inverting circuit and a drain of a first-type MOS transistor in the fourth inverting circuit.

A dynamic D flip-flop with an inverted output involves an input end (101) used for receiving input data; an output end (102) used for providing output data to respond to the input data; a clock signal end (103) used for receiving a clock signal; a first latch (104) used for latching the input data from the input end (101) and performing inverting transmission on the input data under the control of the clock signal; a second latch (105) used for latching data from the first latch (104) and performing inverting transmission on the data latched by the first latch (104) under the control of the clock signal; and an inverter (106) used for performing inverting output on the data received from the second latch (105), the first latch (104), the second latch (105), and the inverter (106) being sequentially connected in series between the input end and the output end.

A scan chain architecture with lowered power consumption comprises a multiplexer selecting between a functional input and a test input. The output of the multiplexer is coupled to a low threshold voltage latch and, in test mode, to a standard threshold voltage latch. The low threshold voltage latch and standard threshold voltage latch are configured to store data when a clock input falls, using a master latch functional clock M_F_CLK, master latch test clock M_T_CLK, slave latch functional clock S_F_CLK, and slave latch test clock S_T_CLK. The slave latch has lower power consumption than the master latch.

A single-phase clocked data multiplexer (MUX-D) scan capable flipflop (FF) design that improves over existing transmission-gate (t-gate) based master-slave flipflops in terms of dynamic capacitance (Cdyn) as well as performance while remaining comparable in area. Unique features of the design are a complementary metal oxide semiconductor (non-t-gate) style structure with an improvement in circuit parameters achieved by eliminating clock inversions and maximally sharing NMOS devices across NAND structures. The core of the flipflop adopts an all CMOS NAND, And-OR-Inverter (AOI) complex logic structure to implement a true edge-triggered flip-flop functionality.

A flip-flop includes an input switching circuit configured to output an intermediate signal based on an input signal and at least one of a phase of a clock signal or a phase of an inverted clock signal, the phase of the inverted clock signal being opposite to the phase of the clock signal, and block application of a driving voltage to at least one circuit element of the input switching circuit in response to receiving a reset signal representing a reset operation of the flip-flop, and a latch circuit configured to generate an output signal based on the intermediate signal according to the at least one of the phase of the clock signal or the phase of the inverted clock signal.

A flip-flop includes an input switching circuit configured to output an intermediate signal based on an input signal and at least one of a phase of a clock signal or a phase of an inverted clock signal, the phase of the inverted clock signal being opposite to the phase of the clock signal, and block application of a driving voltage to at least one circuit element of the input switching circuit in response to receiving a reset signal representing a reset operation of the flip-flop, and a latch circuit configured to generate an output signal based on the intermediate signal according to the at least one of the phase of the clock signal or the phase of the inverted clock signal.

An integrated circuit includes a flip-flop configured to operate in synchronization with a clock signal. The flip-flop includes a multiplexer configured to output an inverted signal of a scan input signal to a first node based on a scan enable signal, or the multiplexer configured to output an inverted signal of a data input signal or a signal having a first level to a first node based on a reset input signal, a master latch configured to latch the signal output through the first node, and to output the latched signal, and a slave latch configured to latch an output signal of the master latch and to output the latched output signal of the master latch.

A semiconductor device and electronic device with reduced power consumption are provided. The semiconductor device includes an encoder, a decoder, and a source driver circuit. An output terminal of the encoder is electrically connected to an input terminal of the source driver circuit, and an output terminal of the source driver circuit is electrically connected to an input terminal of the decoder. The encoder converts input image data into feature-extracted image data, and the decoder restores the feature-extracted image data to the original image data. In addition, provision of a circuit that performs convolution processing using a weight filter for the encoder enables calculation using a convolutional neural network.

A flip flop includes a master latch and a slave latch. The master latch includes a delay circuit configured to receive a clock signal and generate a first internal signal, and is configured to generate an internal output signal by latching a data signal based on the first internal signal. The slave latch is configured to generate a final signal by latching the internal output signal. The delay circuit is further configured to generate the first internal signal by delaying the clock signal by a delay time when the clock signal has a first logic level and generate the first internal signal based on the data signal when the clock signal has a second logic level.

A flip flop includes a master latch and a slave latch. The master latch includes a delay circuit configured to receive a clock signal and generate a first internal signal, and is configured to generate an internal output signal by latching a data signal based on the first internal signal. The slave latch is configured to generate a final signal by latching the internal output signal. The delay circuit is further configured to generate the first internal signal by delaying the clock signal by a delay time when the clock signal has a first logic level and generate the first internal signal based on the data signal when the clock signal has a second logic level.