Patent classifications
H03K5/2481
COMPARATOR OFFSET CORRECTION
A comparator including: first and second input transistors connected to control signals at first and second nodes of the comparator; latch circuitry; at least one controllable offset-correction component having an input terminal and connected to control the signal at one of the first and second nodes based on an offset-correction signal provided at its input terminal; for each controllable offset-correction component, an offset correction circuit configured to provide the offset-correction signal provided at its input terminal; and control circuitry. The control circuitry controls the at least one offset-correction circuit to: control an amount by which the offset-correction signal is adjusted; and/or in a bypass operation, connect the input terminal of the at least one controllable offset-correction component to a bypass-operation reference voltage supply; and/or in a maintenance operation, control the charging-operation voltage supply and/or the bypass-operation voltage supply to control leakage of the charge stored on the holding capacitor.
SIGNAL TRANSMISSION DEVICE
This invention, is concerning a signal voltage device, in which transformers 22a, 22b and a reception circuit 24 are formed on the same chip, and accordingly, no ESD protective element connected to a transformer connection terminal of the reception circuit 24 is required, and negative pulses generated in reception-side inductors 11 can be used in signal transmission. Signal transmission using both positive pulses and negative pulses is made possible as a result, and a stable signal transmission operation can be carried out even in a case where delay time varies in a signal detection circuit. Further, a reception circuit of low power consumption can be configured by using a single-ended Schmitt trigger circuit 14 in the signal detection circuit.
COMPARATOR, AD CONVERTER, SOLID-STATE IMAGE PICKUP DEVICE, ELECTRONIC DEVICE, METHOD OF CONTROLLING COMPARATOR, DATA WRITING CIRCUIT, DATA READING CIRCUIT, AND DATA TRANSFERRING CIRCUIT
The present disclosure relates to a comparator, an AD converter, a solid-state image pickup device, an electronic device, a method of controlling the comparator, a data writing circuit, a data reading circuit, and a data transferring circuit, capable of improving the determining speed of the comparator and reducing power consumption. The comparator includes: a differential input circuit configured to operate with a first power supply voltage, the differential input circuit configured to output a signal when an input signal is higher than a reference signal in voltage; a positive feedback circuit configured to operate with a second power supply voltage lower than the first power supply voltage, the positive feedback circuit being configured to accelerate transition speed when a compared result signal indicating a compared result between the input signal and the reference signal in voltage, is inverted, on the basis of the output signal of the differential input circuit; and a voltage conversion circuit configured to convert the output signal of the differential input circuit into a signal corresponding to the second power supply voltage. The present disclosure can be applied to, for example, a comparator of a solid-state image pickup device.
COMPARATOR LOW POWER RESPONSE
In described examples, an amplifier can be arranged to generate a first stage output signal in response to an input signal. The input signal can be coupled to control a first current coupled from a first current source through a common node to generate the first stage output signal. A replica circuit can be arranged to generate a replica load signal in response to the input signal and in response to current received from the common node. A current switch can be arranged to selectively couple a second current from a second current source to the common node in response to the replica load signal.
COMPARATOR WITH CONFIGURABLE OPERATING MODES
A multiple operating-mode comparator system can be useful for high bandwidth and low power automated testing. The system can include a gain stage configured to drive a high impedance input of a comparator output stage, wherein the gain stage includes a differential switching stage coupled to an adjustable impedance circuit, and an impedance magnitude characteristic of the adjustable impedance circuit corresponds to a bandwidth characteristic of the gain stage. The comparator output stage can include a buffer circuit coupled to a low impedance comparator output node. The buffer circuit can provide a reference voltage for a switched output signal at the output node in a higher speed mode, and the buffer circuit can provide the switched output signal at the output node in a lower power mode.
Digitally controlled delay line circuit and method
A digitally controlled delay line (DCDL) includes an input terminal, an output terminal, and a plurality of stages configured to propagate a signal along a first signal path from the input terminal to a selectable return stage of the plurality of stages, and along a second signal path from the return stage of the plurality of stages to the output terminal. Each stage of the plurality of stages includes a first inverter configured to selectively propagate the signal along the first signal path, a second inverter configured to selectively propagate the signal along the second signal path, and a third inverter configured to selectively propagate the signal from the first signal path to the second signal path. Each of the first and third inverters has a tunable selection configuration corresponding to greater than three output states.
RECEIVER, MEMORY AND TESTING METHOD
A receiver includes the following: a signal receiving circuit, including a first MOS transistor and a second MOS transistor, where a gate of the first MOS transistor is configured to receive a reference signal and a gate of the second MOS transistor is configured to receive a data signal, and the signal receiving circuit is configured to output a comparison signal, the comparison signal being configured to represent a magnitude relationship between a voltage value of the reference signal and a voltage value of the data signal; and an adjusting circuit, including a third MOS transistor, where a source of the third MOS transistor is connected to a source of the first MOS transistor, a drain of the third MOS transistor is connected to a drain of the first MOS transistor, and a gate of the third MOS transistor is configured to receive an adjusting signal.
Comparator and Decision Feedback Equalization Circuit
A comparator includes a first-stage circuit, a second-stage circuit, a first switching circuit and a second switching circuit. The first-stage circuit includes a first input circuit and a second input circuit. The first switching circuit is configured to control the conduction of the first input circuit, and the second switching circuit is configured to control the conduction of the second input circuit. The first input circuit is configured to generate a first differential signal in a sampling phase when being switched on. The second input circuit is configured to generate a second differential signal in a sampling phase when being switched on. The second-stage circuit is configured to amplify and latch the first differential signal or the second differential signal in a regeneration phase to output a comparison signal.
COMPARATOR AND DECISION FEEDBACK EQUALIZATION CIRCUIT
A comparator includes a second-stage circuit, a first input circuit, a second input circuit, a first cross-coupled circuit and a second cross-coupled circuit. The first input circuit is configured to generate a first data terminal voltage and a first reference terminal voltage. The first cross-coupled circuit is configured to perform mutual positive feedback on the first data terminal voltage and the first reference terminal voltage to generate a first differential signal. The second input circuit is configured to generate a second data terminal voltage and a second reference terminal voltage. The second cross-coupled circuit is configured to perform mutual positive feedback on the second data terminal voltage and the second reference terminal voltage to generate a second differential signal. The second-stage circuit is configured to amplify and latch the first differential signal or the second differential signal in a regeneration phase to output a comparison signal.
COMPARATOR CIRCUIT AND A/D CONVERTER
A comparator circuit outputs first and second digital signals corresponding to differential signals to a flip-flop having a predetermined forbidden input combination. A converter circuit performs differential amplification for the differential signals and converts the resultant signals to first and second signals that are complementary digital signals. A logic circuit performs predetermined logical operation, and when the logical values of the first and second signals are different from each other, outputs the first and second digital signals corresponding to the logical values of the first and second signals, and when the logical values of the first and second signals are the same, outputs the first and second digital signals having a same value other than the predetermined forbidden input combination.