An offset-cancellation circuit having a first amplification stage with a gain of the first amplification stage and configured to receive an offset voltage of a first amplifier. A storage element is configured to be coupled to and decoupled from the first amplification stage and configured to store a potential difference output by the first amplification stage. The potential difference is determined by the offset voltage of the first amplifier and the gain of the first amplification stage. A second amplification stage is coupled to the storage element and configured to receive the potential difference from the storage element when the storage element is decoupled from the first amplification stage and configured to deliver an offset-cancellation current. The offset-cancellation current is determined by the potential difference and a gain of the second amplification stage.

An analog-to-digital converter includes a switch circuit, a first capacitor array, a second capacitor array and a comparator. A method of operating the analog-to-digital converter includes switching a swap signal to a first level in a first sampling period for the switch circuit to couple the first capacitor array to a first input terminal of the comparator and a first signal source, and couple the second capacitor array to a second input terminal of the comparator and a second signal source, and switching the swap signal to a second level in a second sampling period for the switch circuit to couple the first capacitor array to the second input terminal of the comparator and the second signal source, and couple the second capacitor array to the first input terminal of the comparator and the first signal source.

A method of operating an analog-to-digital converter includes in a first conversion period, a comparator generating a first comparison result, a first selection circuit switching a voltage output to a first capacitor of a set of larger capacitor of a first capacitor array, and a second selection circuit switching a voltage output to a second capacitor of a set of larger capacitor of a second capacitor array, and in a second conversion period after the first conversion period, the comparator generating a second comparison result different from the first comparison result, the first selection circuit switching back the voltage output to a first capacitor portion of the first capacitor of the set of larger capacitor of the first capacitor array, and the second selection circuit switching back the voltage output to a first capacitor portion of the second capacitor of the set of larger capacitor of the second capacitor array.

An analog-to-digital converter includes a switch circuit, a first capacitor array, a second capacitor array and a comparator. A method of operating the analog-to-digital converter includes switching a swap signal to a first level in a first sampling period for the switch circuit to couple the first capacitor array to a first input terminal of the comparator and a first signal source, and couple the second capacitor array to a second input terminal of the comparator and a second signal source, and switching the swap signal to a second level in a second sampling period for the switch circuit to couple the first capacitor array to the second input terminal of the comparator and the second signal source, and couple the second capacitor array to the first input terminal of the comparator and the first signal source.

A method of operating an analog-to-digital converter includes in a first conversion period, a comparator generating a first comparison result, a first selection circuit switching a voltage output to a first capacitor of a set of larger capacitor of a first capacitor array, and a second selection circuit switching a voltage output to a second capacitor of a set of larger capacitor of a second capacitor array, and in a second conversion period after the first conversion period, the comparator generating a second comparison result different from the first comparison result, the first selection circuit switching back the voltage output to a first capacitor portion of the first capacitor of the set of larger capacitor of the first capacitor array, and the second selection circuit switching back the voltage output to a first capacitor portion of the second capacitor of the set of larger capacitor of the second capacitor array.

A successive approximation register (SAR) analog-to-digital converter (ADC) includes a plurality of differential capacitive digital-to-analog converters (C-DACs), comparators, and an SAR controller. Each differential C-DAC comprises a pair of C-DACs for positive and negative polarities and each C-DAC comprises a capacitor array. A capacitor for each bit position may include a pair of equal-sized capacitors. Each outer comparator is coupled to one of the differential C-DACs and the middle comparator is coupled to a differential output node pair of C-DACs from two differential C-DACs. The SAR controller generates a control signal for the differential C-DACs for each conversion step based on outputs of the comparators. The outputs of the comparators are provided to the differential C-DACs as the control signal without encoding. Single-bit/cycle shorting switches for shorting top plates of capacitors of the C-DACs of same polarity may be closed during a single-bit/cycle conversion.

A digital-to-analog converter (DAC). A DAC includes a plurality of DAC cells and a controller. The controller generates a control signal for driving the plurality of DAC cells for each clock cycle. The controller may generate the control signal to select a set of one or more DAC cells for an input code or for a standby mode of the DAC such that the selected set of one or more DAC cells to be active for the same input code or for the standby mode of the DAC change over time without affecting an output of the DAC more than a predetermined limit.

An apparatus and method for processing signals in the analog domain. A signal is derived from analog circuit properties that is shift and scale invariant. Although the circuit properties are not quantized as in traditional digital signal processing, the signal is immune from effects of the properties, such as common mode noise, absolute voltage or current level, finite settling time, etc., as a digital signal would be. The shift and scale invariance allows for mathematical operations of addition, subtraction, multiplication and division of signals. By combining these operations, various circuits may be constructed, including a voltage controlled amplifier, a time gain amplifier, and an analog-to-digital converter. The circuits are constructed using almost no non-linear, active devices, and will thus use less power for a given speed than comparable digital devices, and will often be faster as there are no delay elements and no need to wait for the circuit properties to settle.

A current digital-to-analog converter (DAC) and an integrated circuit chip including the DAC are disclosed. The current DAC includes a switching circuit that includes a plurality of switches coupled to receive differential digital control signals and to provide first and second differential current outputs, a current source coupled to an upper rail and to a first node of the switching circuit, a first current sink coupled to a lower rail and to a second node of the switching circuit, and an interference cancellation circuit coupled to substantially prevent a tail capacitance current from flowing through the first and second differential current outputs.

This application describes method and apparatus for data conversion. An analogue-to-digital converter circuit receives an analogue input signal (S.sub.IN) and outputs a digital output signal (S.sub.OUT) The circuit has a sampling capacitor, a controlled oscillator and a counter for generating a count value based on a number of oscillations in an output of the controlled oscillator in a count period during a read-out phase. The digital output signal is based on the count value. The converter circuit is operable in a sampling phase and the read-out phase. In the sampling phase, the sampling capacitor is coupled to an input node for the input signal, e.g. via switch. In the read-out phase, the sampling capacitor is coupled to the controlled oscillator, e.g. via switch, such that capacitor powers the first controlled oscillator and a frequency of oscillation in the output of the first controlled oscillator depends on the voltage of the first capacitor.