An operational amplifier includes a first differential input pair, a first switch and a second switch. The first differential input pair includes a first input transistor and a second input transistor. The first input transistor has a gate terminal coupled to an output terminal of the operational amplifier. The second input transistor has a gate terminal. The first switch is coupled between the gate terminal of the first input transistor and the gate terminal of the second input transistor. The second switch is coupled between a first input terminal of the operational amplifier and the gate terminal of the second input transistor.

A level shifter, a digital-to-analog converter (DAC), and a buffer amplifier, and a source driver and an electronic device including the same are provided. The source driver includes a level shifter configured to receive digital bits and provide a level-shifted output signal; a DAC including a resistor string configured to provide a plurality of gradation voltages formed by an upper limit voltage and a lower limit voltage being received through one end and the other end, and an N-type metal oxide semiconductor (NMOS) switch and a P-type MOS (PMOS) switch configured to be controlled by the level-shifted output signal and output a gradation voltage corresponding to the level-shifted output signal; and an amplifier configured to amplify a signal provided by the digital-to-analog converter, and the lower limit voltage is provided to a body electrode of the NMOS switch.

A level shifter, a digital-to-analog converter (DAC), and a buffer amplifier, and a source driver and an electronic device including the same are provided. The source driver includes a level shifter configured to receive digital bits and provide a level-shifted output signal; a DAC including a resistor string configured to provide a plurality of gradation voltages formed by an upper limit voltage and a lower limit voltage being received through one end and the other end, and an N-type metal oxide semiconductor (NMOS) switch and a P-type MOS (PMOS) switch configured to be controlled by the level-shifted output signal and output a gradation voltage corresponding to the level-shifted output signal; and an amplifier configured to amplify a signal provided by the digital-to-analog converter, and the lower limit voltage is provided to a body electrode of the NMOS switch.

A digital-to-analog converter (DAC) for converting a digital input word to an analog output signal includes a string DAC, a first interpolator and a second interpolator. The string DAC outputs a first voltage and a second voltage in response to M most significant bits of the digital input word. The first interpolator interpolates between the first and second voltages in response to middle Q least significant bits of the digital input word and provides a first interpolated voltage. The second interpolator interpolates between the first interpolated voltage and the second voltage in response to lower P least significant bits of the digital input word.

An amplifier circuit includes a resistor divider (R.sub.REF) comprising n resistive elements, two main nodes defined at each end thereof, two readout nodes (d.sub.1, d.sub.2), resistor nodes (q) defined between adjacent resistive elements, and an input current source (I.sub.REF) connected or connectable to the first main node (a). The resistor divider (R.sub.REF) comprises two arrays of addressable switch elements controllable by a feedback signal (s.sub.FB) to be open or closed. The amplifier circuit includes a differential pair of transistors (T.sub.1, T.sub.2), wherein source terminals of each of the transistors (T.sub.1, T.sub.2) are connected to the second node (b), gate terminals of the transistors (T.sub.1, T.sub.2) are connected to input signals (v.sub.1, v.sub.2), drain terminals of the transistors (T.sub.1, T.sub.2) are connected to current sources (I.sub.1, I.sub.2), and bulk terminals of the transistors (T.sub.1, T.sub.2) are connected to the readout nodes (d.sub.1, d.sub.2). The amplifier circuit functions as a difference amplifier, wherein the bulk terminals affect a threshold of the respective transistors (T.sub.1, T.sub.2) so as to add or subtract a differential signal derived from the readout nodes (d.sub.1, d.sub.2) of the resistor divider (R.sub.REF) determined by the feedback signal (s.sub.FB).

Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

A device includes a transmitter to transmit serialized data within a differential direct-current (DC) signal over a differential output line, a multiplexer circuit coupled to the transmitter, and a calibration circuit coupled between the differential output line, a multi-phase clock, and the multiplexer circuit. The multiplexer circuit is to select the serialized data from ones of multiple input lines according to a multi-phase clock and pass the selected serialized data to the transmitter. The serialized data includes a calibration bit pattern. The calibration circuit is to capture and digitize the differential DC signal into a digital stream, measure an error value from the digital stream that is associated with distortion based on the calibration bit pattern, convert the error value into a gradient value, and correct one or more phases of the multi-phase clock to compensate for the distortion based on the gradient value.

Methods of performing mixed-signal/analog multiply-accumulate (MAC) operations used for matrix multiplication in fully connected artificial neural networks in integrated circuits (IC) are described in this disclosure having traits such as: (1) inherently fast and efficient for approximate computing due to current-mode signal processing where summation is performed by simply coupling wires, (2) free from noisy and power hungry clocks with asynchronous fully-connected operations, (3) saving on silicon area and power consumption for requiring neither any data-converters nor any memory for intermediate activation signals, (4) reduced dynamic power consumption due to Compute-In-Memory operations, (5) avoiding over-flow conditions along key signals paths and lowering power consumption by training MACs in neural networks in such a manner that the population and or combinations of multi-quadrant activation signals and multi-quadrant weight signals follow a programmable statistical distribution profile, (6) programmable current consumption versus degree of precision/approximate computing, (7) suitable for ‘always-on’ operations and capable of ‘self power-off’, (8) inherently simple arrangement for non-linear activation operations such as Rectified Linear Unit, ReLu, and (9) manufacturable on main-stream, low cost, and lagging edge standard digital CMOS process requiring neither any resistors nor any capacitors.

A digital-to-analog converter for generating an analog output voltage in response to a digital value comprising a plurality of bits, the converter including: (i) a first switched resistor network having a first configuration and for converting a first input differential signal into a first analog output in response to a first set of bits in the plurality of bits; and (ii) a second switched resistor network, coupled to the first switched resistor network, having a second configuration, differing from the first configuration, and for converting a second input differential signal into a second analog output in response to a second set of bits in the plurality of bits.

Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.