A test apparatus (1) for test cards (37), comprising a receiving device (3) for holding at least one test card (37) to be tested, comprising at least one contact device (4) for making electrical touch contact with electrically conductive contact points of the at least one test card (37) in the receiving device (3), wherein the contact device (4) can be arranged vertically above the receiving device for the purpose of making touch contact, and comprising an actuating device (19), which is formed to displace the contact device (4) and the receiving device (3) relative to one another for the purpose of establishing the touch contact. It is provided that the receiving device (3) can be displaced by means of the actuating device (19) from a test position, which is located vertically below the contact device (4), into a loading and unloading position, which is laterally spaced apart from the contact device (4), and the other way round.

Evaluation board (EVB) assemblies or stacks utilized in tuning electronic modules are disclosed, as are methods for tuning such modules. In embodiments, the module testing assembly includes an EVB and an EVB baseplate. The EVB includes, in turn, an EVB through-port extending from a first EVB side to a second, opposing EVB side; and a module mount region on the first EVB side and extending about a periphery of the EVB through-port. The module mount region is shaped and sized to accommodate installation of a sample electronic module provided in a partially-completed, pre-encapsulated state fabricated in accordance with a separate thermal path electronic module design. A baseplate through-port combines with the EVB through-port to form a tuning access tunnel providing physical access to circuit components of the sample electronic module through the EVB baseplate from the second EVB side when the sample electronic module is installed on the module mount region.

Evaluation board (EVB) assemblies or stacks utilized in tuning electronic modules are disclosed, as are methods for tuning such modules. In embodiments, the module testing assembly includes an EVB and an EVB baseplate. The EVB includes, in turn, an EVB through-port extending from a first EVB side to a second, opposing EVB side; and a module mount region on the first EVB side and extending about a periphery of the EVB through-port. The module mount region is shaped and sized to accommodate installation of a sample electronic module provided in a partially-completed, pre-encapsulated state fabricated in accordance with a separate thermal path electronic module design. A baseplate through-port combines with the EVB through-port to form a tuning access tunnel providing physical access to circuit components of the sample electronic module through the EVB baseplate from the second EVB side when the sample electronic module is installed on the module mount region.

A test fixture holding without risk of any surface marking or damage to a product being tested includes a base with a circuit board, a needle seat, and a side push structure. The needle seat includes probes and first receiving cavity for holding the product. An opening in a sidewall of the first receiving cavity exposes one end of the side push structure. One end of the probe connects with the circuit board, other end of the probe is in the needle seat. With product in the first receiving cavity, the side push structure pushes the product against the sidewalls and the product is depressed to abut against the needle seat and the needles which are moved into the first receiving cavity to make contact with to the product. A testing machine having the test fixture is also provided.

A probe holder includes: a first layered member including members layered over one another; and a second layered member bonded to the first layered member and including members layered over one another. Each of the first and second layered members includes: a first member made of a material having a low dielectric constant; a second member provided on one of surfaces of the first member and having higher hardness than the first member; and a third member provided on the other surface of the first member and having higher hardness than the first member. The probe holder further includes a holder hole formed by bonding the third members of the first and second layered members, the holder hole penetrating the probe holder in a direction in which the first and second layered members are layered, and having a stepped hole shape having a smaller diameter in the second members.

A contact terminal may include a tubular body made of an electrically conductive material; and stick-shaped first and second central conductors made of an electrically conductive material. The first and second central conductors may include first and second stick-shaped bodies, first and second clasped portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies, and first and second swell portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies. The first and second central conductors are arranged to have a distal end portion of the first and second swell portions inserted into a joining portion of the tubular body, and to have a distal end surface of the first swell portion and a distal end surface of the second swell portion opposite each other with a gap therebetween.

A round probe of a probe card device includes a metallic pin and insulating latch. The outside diameter of the metallic pin is smaller than or equal to 40 m. The metallic pin includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, and a first contacting segment and a second contacting segment respectively extending from the first and second connecting segments in two opposite directions away from the middle segment. The insulating latch is formed on a part of the first contacting segment, and an end portion of the first contacting segment protruding from the insulating latch is defined as a protrusion. A maximum distance between an outer surface of the insulating latch and an adjacent outer surface of the metallic pin is smaller than or equal to the outside diameter of the metallic pin.

A contact terminal may include a tubular body made of an electrically conductive material; and stick-shaped first and second central conductors made of an electrically conductive material. The first and second central conductors may include first and second stick-shaped bodies, first and second clasped portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies, and first and second swell portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies. The first and second central conductors are arranged to have a distal end portion of the first and second swell portions inserted into a joining portion of the tubular body, and to have a distal end surface of the first swell portion and a distal end surface of the second swell portion opposite each other with a gap therebetween.

A probe holder includes: a first layered member including members layered over one another; and a second layered member bonded to the first layered member and including members layered over one another. Each of the first and second layered members includes: a first member made of a material having a low dielectric constant; a second member provided on one of surfaces of the first member and having higher hardness than the first member; and a third member provided on the other surface of the first member and having higher hardness than the first member. The probe holder further includes a holder hole formed by bonding the third members of the first and second layered members, the holder hole penetrating the probe holder in a direction in which the first and second layered members are layered, and having a stepped hole shape having a smaller diameter in the second members.

A test apparatus (1) for test cards (37), comprising a receiving device (3) for holding at least one test card (37) to be tested, comprising at least one contact device (4) for making electrical touch contact with electrically conductive contact points of the at least one test card (37) in the receiving device (3), wherein the contact device (4) can be arranged vertically above the receiving device for the purpose of making touch contact, and comprising an actuating device (19), which is formed to displace the contact device (4) and the receiving device (3) relative to one another for the purpose of establishing the touch contact. It is provided that the receiving device (3) can be displaced by means of the actuating device (19) from a test position, which is located vertically below the contact device (4), into a loading and unloading position, which is laterally spaced apart from the contact device (4), and the other way round.