A method for performing verification and testing of a device under test (DUT) is described. The method includes receiving, by a processing device, inputs from a user regarding a hardware design for the DUT. The processing device presents cover group attribute suggestions to the user based on the hardware design and receives cover group information from the user corresponding to one or more cover group attributes of one or more cover groups based on the cover group attribute suggestions. Based on the cover group information, the processing device automatically generates verification code, including one or more cover group definitions.

A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client. A method of providing usage-aware compressed data from a test and measurement instrument includes acquiring waveform data from one or more devices under test, receiving a user input through a user interface, determining one or more requested data types based on the user input, transforming the waveform data into compressed data containing only data elements corresponding to the one or more requested data types, and transmitting the compressed data to a client.

A system and method are disclosed for formulating a sequential equivalency problem for fault (non)propagation with minimal circuit logic duplication by leveraging information about the location and nature of a fault. The system and method further apply formal checking to safety diagnoses and efficiently models simple and complex transient faults.

Controlling of drop test equipment. A predefined test script is obtained over a machine-machine interface. The test script comprises plurality of test settings for drop testing of a device-under-test, DUT. The drop test equipment is controlled to perform drop testing of the DUT according to the test settings of the test script. Test results are collected and provided to a test report.

A method and test system are provided for selectively emphasizing waveforms on a display of the test system. The method includes presenting a graphical user interface (GUI) on the display of the test system; receiving through the GUI a selection of channels to be viewed on the display; receiving through the GUI an indication enabling a waveform emphasis feature; receiving through the GUI an indication of a cycle time; and displaying through the GUI multiple waveforms, respectively produced by the selected channels, by sequentially emphasizing each waveform of the multiple waveforms for the cycle time as a viewable waveform, while de-emphasizing each remaining waveforms of the multiple waveforms in relation to the emphasized waveform for the cycle time.

The present disclosure provides an electronic tester comprising at least one test fixture that couples to a device under test, at least one test instrument coupled to at least one of the test fixtures that measures signals in the device under test, a test controller that controls the device under test while the test is performed, and an adapter module comprising a general control interface that is coupled to the test controller, and a DUT-specific communication interface that couples to the device under test to communicate with the device under test, wherein the test controller controls the device under test with generic control signals sent to the general control interface, and wherein the adapter module translates the general control signals into DUT-specific control signals and transmit the DUT-specific control signals to the device under test. Further, the present disclosure provides a respective method.

Technologies are described herein for enabling the automated testing of remote control units by providing a suitable test system that includes a plurality of test stations for simultaneously testing a plurality of remote control units. Each test station includes features that allow it to interact with the remote control unit's inputs, such as buttons and microphone, and outputs, such as IR and RF remote control codes, status LEDs, and audio output. Each test station may be controlled by a controller that executes test scripts or other routines that exercise the functionality of the remote control unit as desired.

An electronic test equipment apparatus includes a power terminal configured to receive power, an interface for a device under test (DUT), at least one power transistor connected in series between the power terminal and the interface for the DUT, and a protection circuit. The protection circuit is configured to: switch on the at least one power transistor, to electrically connect the power terminal to the DUT through the interface as part of a test routine; and subsequently automatically switch off the at least one power transistor after a predetermined delay, to electrically disconnect the power terminal from the DUT regardless of whether the DUT passes or fails the test routine. A voltage clamp circuit for electronic test equipment and corresponding methods of testing devices using such electronic test equipment are also described.

A test and measurement instrument includes one or more processors to execute code to cause the processors to: access a user instance of the test and measurement instrument; receive one or more requests from the user instance of the test and measurement instrument; determine any collisions between the one or more requests and any other requests for elements of the test and measurement instrument; resolve any collisions as necessary; perform one or more operations to fulfill the request; and display information resulting from the one or more operations on an instance user interface.

Herein disclosed are an electronic component testing system and a time certification method. The electronic component testing system comprising a testing device and an interface device. The testing device comprises a backboard, and the backboard electrically connected to at least one test board and comprising a time certification component. The interface device, electrically connected to the testing device, provides a test instruction. Wherein the time certification component stores an authorization start time and an authorization end time. Wherein the testing device starts a test procedure according to the test instruction, the time certification component updates the authorization start time to a first stop time of the test procedure after the test procedure is completed.