Aspects of the invention include systems and methods directed to a portable chip tester. A non-limiting example of a system includes a housing, a printed circuit board mounted on the housing, in which the printed circuit board includes a first interface operable to permit electrical communication between the printed circuit board and a device under test. The system further includes a mount operable to enable an electrical connection with an integrated circuit, in which the integrated circuit is operable to manage testing the device under test under a testing protocol. The system further includes a power supply and a software platform that includes a memory having computer readable instructions and one or more processors for executing the computer readable instructions. The computer readable instructions controlling the processors to perform operations including directing the integrated circuit to manage testing of the device under test pursuant to the testing protocol.

A tool is presented herein capable of performing several electrical measurements and generating several electrical outputs. The tool can be configured to perform measurements and provide outputs most commonly utilized when developing and diagnosing failures of a hardware platform based around a microcontroller. The tool can have a form factor and a header configuration compatible for mating with an external microcontroller or minicomputer developer board such as Arduino, UDOO, Raspberry Pi, TI LaunchPad, STM Nucleo, BeagleBone, etc.

Aspects of the invention include systems and methods directed to a portable chip tester. A non-limiting example of a system includes a housing, a printed circuit board mounted on the housing, in which the printed circuit board includes a first interface operable to permit electrical communication between the printed circuit board and a device under test. The system further includes a mount operable to enable an electrical connection with an integrated circuit, in which the integrated circuit is operable to manage testing the device under test under a testing protocol. The system further includes a power supply and a software platform that includes a memory having computer readable instructions and one or more processors for executing the computer readable instructions. The computer readable instructions controlling the processors to perform operations including directing the integrated circuit to manage testing of the device under test pursuant to the testing protocol.

A case module of a radiofrequency testing apparatus has a cable hole and a front entrance, and includes two electromagnetic shielding units respectively covering the cable hole and the front entrance. Each electromagnetic shielding unit includes a stepped structure, a cover detachably fastened to the stepped structure, a shielding structure sandwiched between the stepped structure and the cover. The stepped structures of the two electromagnetic shielding units are respectively arranged around the cable hole and the front entrance. Each of the stepped structure and the cover includes a plurality of treads and a plurality of risers staggeredly arranged with the treads, and the treads and the risers of the stepped structure respectively face those of the cover. Any two faced treads are configured to sandwich a part of the shielding structure, and any two faced risers are configured to sandwich the other part of the shielding structure.

A case module of a radiofrequency testing apparatus has a cable hole and a front entrance, and includes two electromagnetic shielding units respectively covering the cable hole and the front entrance. Each electromagnetic shielding unit includes a stepped structure, a cover detachably fastened to the stepped structure, a shielding structure sandwiched between the stepped structure and the cover. The stepped structures of the two electromagnetic shielding units are respectively arranged around the cable hole and the front entrance. Each of the stepped structure and the cover includes a plurality of treads and a plurality of risers staggeredly arranged with the treads, and the treads and the risers of the stepped structure respectively face those of the cover. Any two faced treads are configured to sandwich a part of the shielding structure, and any two faced risers are configured to sandwich the other part of the shielding structure.

A tool is presented herein capable of performing several electrical measurements and generating several electrical outputs. The tool can be configured to perform measurements and provide outputs most commonly utilized when developing and diagnosing failures of a hardware platform based around a microcontroller. The tool can have a form factor and a header configuration compatible for mating with an external microcontroller or minicomputer developer board such as Arduino, UDOO, Raspberry Pi, TI LaunchPad, STM Nucleo, BeagleBone, etc.

A method in an electronic device that may include determining, with a processor, a quantity of group markers in a data set, and determining, with the processor and based on the quantity of group markers, a suggested view from a plurality of available views, each view in the plurality of available views diagrammatically depicting at least a portion of the data set. Also, a processor-implemented method of navigating between portions of a data set may include displaying, on a touchscreen display, a diagrammatical depiction of a first portion of the data set; detecting a continuous arc gesture at the touchscreen display; determining a direction of the arc gesture; selecting a second portion of the data set based on the determined direction of the arc gesture; and displaying a diagrammatical depiction of the second portion of the data set.

Various apparatus and methods associated with a compact electronics test system having user programmable device interfaces and on-board functions adapted for use in various environments are provided. Exemplary embodiments can include a variety of apparatuses and methods to realize an advanced field programmable gate array adapted to perform functional tests on digital electronics within an exemplary 48-pin DIP footprint. One aspect of the invention can include a testing device comprised of components to produce a product that is inexpensive and consumable. A small size of an exemplary embodiment of the invention further allows for desirable shielding to be placed around a highly portable and highly programmable and adaptable testing device in order to protect it from external dangers found in harsh environments (e.g., high levels of radiation when operating in space, etc.).

Various apparatus and methods associated with a compact electronics test system having user programmable device interfaces and on-board functions adapted for use in various environments are provided. Exemplary embodiments can include a variety of apparatuses and methods to realize an advanced field programmable gate array adapted to perform functional tests on digital electronics within an exemplary 48-pin DIP footprint. One aspect of the invention can include a testing device comprised of components to produce a product that is inexpensive and consumable. A small size of an exemplary embodiment of the invention further allows for desirable shielding to be placed around a highly portable and highly programmable and adaptable testing device in order to protect it from external dangers found in harsh environments (e.g., high levels of radiation when operating in space, etc.).

Various apparatus and method s associated with a compact electronics test system having user programmable device interfaces and on-board functions adapted for use in various environments are provided. Exemplary embodiments can include a variety of apparatuses and method s to realize an advanced field programmable gate array adapted to perform functional tests on digital electronics within an exemplary 48-pin DIP footprint. One aspect of the invention can include a testing device comprised of components to produce a product that is inexpensive and consumable. A small size of an exemplary embodiment of the invention further allows for desirable shielding to be placed around a highly portable and highly programmable and adaptable testing device in order to protect it from external dangers found in harsh environments (e.g., high levels of radiation when operating in space, etc).