A technique is provided that reduces dullness of a potential provided to a line such as gate line on an active-matrix substrate to enable driving the line at high speed and, at the same time, reduces the size of the picture frame region. On an active-matrix substrate (20a) are provided gate lines (13G) and source lines. On the active-matrix substrate (20a) are further provided: gate drivers (11) each including a plurality of switching elements, at least one of which is located in a pixel region, for supplying a scan signal to a gate line (13G); and lines (15L1) each for supplying a control signal to the associated gate driver (11). A control signal is supplied by a display control circuit (4) located outside the display region to the gate drivers (11) via the lines (15L1). In response to a control signal supplied, each gate driver (11) drives the gate line (13G) to which it is connected.

A solid-state circuit is presented which may comprise a pass device, a control circuit, and a leakage current compensation circuit. The pass device may have a first terminal, a second terminal and a drive terminal, wherein the first terminal of the pass device is coupled with an input terminal of the solid-state circuit, and wherein the second terminal of the pass device is coupled with an output terminal of the solid-state circuit. The control circuit may be coupled with the drive terminal of the pass device and may be configured to drive the pass device with a driving voltage. The leakage current compensation circuit may be configured to receive a leakage current of the pass device and may be configured to forward said leakage current as a bias current to said control circuit.

A measurement apparatus includes a linear regulator, a switching regulator, an acquisition unit configured to acquire measurement data by sensing a signal as a measurement target, and a control unit configured to selectively drive the linear regulator or the switching regulator, wherein the control unit is configured to select and drive the linear regulator in a first period in which the measurement data is acquired by the acquisition unit, and select and drive the switching regulator in a second period that is different from the first period.

A constant voltage generator circuit is provided with an operational amplifier including a feedback circuit having a first resistor, and transistor, and generates a feedback voltage generated by dividing an output voltage between an output terminal and a substrate voltage potential of the constant voltage generator circuit by the first resistor and a second resistor. The operational amplifier is configured to amplify a voltage potential difference between a reference voltage and the feedback voltage and to output a control voltage. The output transistor controls an output voltage based on the control voltage from the operational amplifier, and the feedback circuit is further configured to superimpose high-frequency noise components from the substrate voltage potential onto the feedback voltage.

A low drop-out voltage regulator includes an error amplifier that generates an amplified error voltage, the error amplifier including a first input for receiving a reference voltage, a second input for receiving a feedback voltage, a bias terminal for receiving an adaptive bias current, and an output. A pass gate providing an output voltage includes a first input connected to a supply voltage and a second input connected to the error amplifier output. A feedback network generating the feedback voltage includes a first terminal connected to the output of the pass gate and a second terminal connected to the second input of the error amplifier. An adaptive bias network providing the adaptive bias current includes a first transistor connected to the bias terminal of the error amplifier, a second transistor connected to the first transistor as a current mirror, and a third transistor connected in parallel with the pass gate.

A technique is provided that reduces dullness of a potential provided to a line such as gate line on an active-matrix substrate to enable driving the line at high speed and, at the same time, reduces the size of the picture frame region. On an active-matrix substrate (20a) are provided gate lines (13G) and source lines. On the active-matrix substrate (20a) are further provided: gate drivers (11) each including a plurality of switching elements, at least one of which is located in a pixel region, for supplying a scan signal to a gate line (13G); and lines (15L1) each for supplying a control signal to the associated gate driver (11). A control signal is supplied by a display control circuit (4) located outside the display region to the gate drivers (11) via the lines (15L1). In response to a control signal supplied, each gate driver (11) drives the gate line (13G) to which it is connected.

A power regulator is applied to regulate a work frequency of a central processing unit and the power regulator comprises a power resister, a voltage amplifier and an analog-to-digital converter. The power resister is coupled to a load to generate a first voltage. The voltage amplifier is coupled to the power resister to output a second voltage. The analog-to-digital converter is coupled to the voltage amplifier, converts the second voltage into a control signal and transmits the control signal to the central processing unit. The control signal is switched between a first level and a second level according to a value of the second voltage.

A circuit for parameter PSRR measurement includes a filter, a first regulator and a second regulator. The filter may be configured for receiving an AC input signal and a DC input signal, and for outputting a combined output signal according to the AC input signal and the DC input signal. The first regulator may be configured for receiving the combined output signal, and for outputting a first output signal having a first AC component signal and a first DC component signal. The second regulator may be configured for receiving the first output signal, and for outputting a second output signal having a second AC component signal and a second DC component signal. A parameter PSRR of the second regulator may be obtained according to a ratio between the second AC component signal and the first AC component signal.

Power supply noise reduction methods and low drop out (LDO) voltage regulators with capacitively coupled supply noise-reducing components are disclosed. One illustrative voltage regulator includes: a pass transistor having an n-type conduction channel that couples a supply voltage to an output node; an operational amplifier that derives a control signal for the pass transistor from a difference between a reference voltage and a scaled or unscaled voltage of the output node, the control signal being supplied to a gate or base of the pass transistor; a buffer that derives a ripple cancellation signal from the supply voltage; and a coupling capacitor that couples the buffer to the base or gate of the pass transistor to impose the ripple cancellation signal on the control signal.

A voltage regulation integrated circuit (IC) includes a first transistor, a feedback circuit, a bias circuit, an amplifier circuit, and a transient coupling circuit. The first transistor is configured to generate an output voltage according to an input voltage and a control voltage. The feedback circuit is configured to generate a feedback voltage according to the output voltage. The output voltage includes an AC component. The bias circuit is configured to generate a first bias voltage. The amplifier circuit is configured to generate the control voltage according to the first bias voltage and the feedback voltage. The transient coupling circuit is configured to generate a coupling voltage according to the AC component and to assist the change of the first bias voltage according to the coupling voltage, so that the output voltage is maintained at a voltage level.