H03F3/45753

Amplification interface, and corresponding measurement system and method for operating an amplification interface

An electronic amplification-interface circuit includes a differential-current reading circuit having a first input terminal and a second input terminal. The differential-current reading circuit includes a continuous-time sigma-delta conversion circuit formed by an integrator-and-adder module generating an output signal that is coupled to an input of a multilevel-quantizer circuit configured to output a multilevel quantized signal. The integrator-and-adder module includes a differential current-integrator circuit configured to output a voltage proportional to an integral of a difference between currents received at the first and second input terminals. A digital-to-analog converter, driven by a respective reference current, receives and converts the multilevel quantized signal into a differential analog feedback signal. The integrator-and-adder module adds the differential analog feedback signal to the differential signal formed at the first and second input terminals.

AMPLIFICATION INTERFACE, AND CORRESPONDING MEASUREMENT SYSTEM AND METHOD FOR OPERATING AN AMPLIFICATION INTERFACE

An electronic amplification-interface circuit includes a differential-current reading circuit having a first input terminal and a second input terminal. The differential-current reading circuit includes a continuous-time sigma-delta conversion circuit formed by an integrator-and-adder module generating an output signal that is coupled to an input of a multilevel-quantizer circuit configured to output a multilevel quantized signal. The integrator-and-adder module includes a differential current-integrator circuit configured to output a voltage proportional to an integral of a difference between currents received at the first and second input terminals. A digital-to-analog converter, driven by a respective reference current, receives and converts the multilevel quantized signal into a differential analog feedback signal. The integrator-and-adder module adds the differential analog feedback signal to the differential signal formed at the first and second input terminals.

AMPLIFICATION INTERFACE, AND CORRESPONDING MEASUREMENT SYSTEM AND METHOD FOR CALIBRATING AN AMPLIFICATION INTERFACE

A thermally-isolated-metal-oxide-semiconducting (TMOS) sensor has inputs coupled to first and second nodes to receive first and second bias currents, and an output coupled to a third node. A tail has a first conduction terminal coupled to the third node and a second conduction terminal coupled to a reference voltage. A control circuit applies a control signal to a control terminal of the tail transistor based upon voltages at the first and second nodes so that a common mode voltage at the first and second nodes is equal to a reference common mode voltage. A differential current integrator has a first input terminal coupled to the second node and a second input terminal coupled to the first node, and provides an output voltage indicative of an integral of a difference between a first output current at the first input terminal and a second output current at the second input terminal.

Fast-locking phase-locked loop and associated fast-locking method thereof
11139818 · 2021-10-05 · ·

A fast-locking phase-locked loop (PLL) and an associated fast-locking method thereof are provided. The fast-locking PLL may include a gear-shifting loop filter, which is configured to have a dynamic bandwidth. The gear-shifting loop filter may include a resistor set and a capacitor set coupled to the resistor set, where the resistor set is configured to have a dynamic resistance, and the capacitor set is configured to have a dynamic capacitance. More particularly, the dynamic resistance is switched from a first resistance to a second resistance and the dynamic capacitance is switched from a first capacitance to a second capacitance, to make the dynamic bandwidth be switched from a first bandwidth to a second bandwidth.

Amplification interface, and corresponding measurement system and method for calibrating an amplification interface

An amplification interface includes a drain of a first FET connected to a first node, a drain of a second FET connected to a second node, and sources of the first and second FETs connected to a third node. First and second bias-current generators are connected to the first and second nodes. A third FET is connected between the third node and a reference voltage. A regulation circuit drives the gate of the third FET to regulate the common mode of the voltage at the first node and the voltage at the second node to a desired value. A current generator applies a correction current to the first and/or second node. A differential current integrator has a first and second inputs connected to the second and first nodes. The integrator supplies a voltage representing the integral of the difference between the currents received at the second and first inputs.

OPERATIONAL AMPLIFIER, INTEGRATED CIRCUIT, AND METHOD FOR OPERATING THE SAME
20210303017 · 2021-09-30 ·

An operational amplifier comprises a front stage and an output stage. The front stage comprises a first input transistor, a second input transistor, a first node, a second node, and a first current mirror. A first voltage based on a first current through the first input transistor is generated on the first node. A second voltage based on a second current through the second input transistor is generated on the second node. The output stage is configured to output an output voltage based on at least one of the first voltage and the second voltage. The first current mirror comprises a first transistor having a drain connected to the first node, a second transistor having a drain connected to the second node, and a first offset canceling capacitor connected between gates of the first transistor and the second transistor.

OPERATIONAL AMPLIFIER
20210265962 · 2021-08-26 · ·

Disclosed herein is an operational amplifier including a non-inverting input terminal, an inverting input terminal, a P-type metal oxide semiconductor input differential pair, a first input tail current source, an N-type metal oxide semiconductor input differential pair, a second input tail current source, an output stage, a first correction circuit, and a second correction circuit. The first correction circuit and the second correction circuit operate over an operation region of the P-type metal oxide semiconductor input differential pair, an operation region of the N-type metal oxide semiconductor input differential pair, and a transition region in which both the P-type metal oxide semiconductor input differential pair and the N-type metal oxide semiconductor input differential pair operate.

AUTO-ZERO APPLIED BUFFER FOR DISPLAY CIRCUITRY

A system includes a pixel that emits light based on a signal provided to the pixel. The system may also include a buffer circuit having a differential pair stage, a cascade stage, and an output stage. The differential pair stage may receive a common mode voltage signal via a first switch in response to the first switch receiving a first signal that causes the first switch to close. The differential pair stage may couple a capacitor to the output stage via a second switch that operate based on a second signal, such that the capacitor reduces an offset provided by one or more circuit components in the differential pair stage, the cascade stage, the output stage, or any combination thereof. The differential pair stage may output the common mode voltage to the pixel via the output stage in response to the first signal being present.

Method and circuit for compensating for the offset voltage of electronic circuits

The present invention corresponds to a method and a circuit for compensating the offset voltage of electronic circuits, where the circuit implementing the method comprises: a dynamic comparator (1); a phase detector (6) connected to the dynamic comparator (1), the phase detector (6); a finite-state machine (9) connected to the phase detector (4), a first digital-analog converter (12) connected to an output of the finite-state machine (9); a second digital-analog converter (13) connected to another output (11) of the finite-state machine (9); a polarization block (14) with a first input (15) connected to the output of the first digital-analog converter (12) and a second input (16) connected to the output of the second digital-analog converter (13); where the polarization block (14) polarizes an electronic circuit (17) and the dynamic comparator (1), the phase detector (6), and the finite-state machine (9) are connected to a clock signal (3). The method is characterized by the following steps: a) connecting a dynamic comparator to the output of the electronic circuit; b) measuring the phase change of the dynamic comparator outputs of step a by means of a phase detector; c) controlling the output signals of a finite-state machine according to the phase detector output of step b, which can be coded forward, backward or in phase; c) converting the output of the finite-state machine of step c to an analog signal using two digital-analog converters; d) connecting the output of the two digital-analog converters of step d to the control terminal of the electronic circuit polarization block; and, e) modifying the polarization current of the electronic circuit polarization block by means of the output signals of the two digital-analog converters connected in step e.

Bias switch circuit for compensating frontend offset of high accuracy measurement circuit

Disclosed is a high accurate measurement circuit, and the feature is using bias switching circuit for compensating front end offset, and the back end offset of amplifier is also cancelled. In the real measurement environment, offset exists in the amplifier of the measurement circuit has, and non-ideal effects also exist in the interface between measurement terminal and the measurement circuit, such as leakage current of chip package pins or mismatch of the circuit. The above non-ideal effects belong to front end offset and cannot be compensated by the prior arts. The disclosed structure uses the bias switch circuit and uses different switching method in the two measurement timings. By subtracting the measurement results for the two measurement timings, the front end offset is compensated, and the back end offset of the amplifier is also cancelled.