Numerous embodiments of input circuitry for an analog neural memory in a deep learning artificial neural network are disclosed.

A DAC, for use in an iADC, is configured for converting a multi-bit word to an analog feedback signal. The DAC comprises a MMS logic block. It further comprises a plurality of output elements configured to generate respective analog portions based on a selection vector and a signal combiner for combining the analog portions to the analog feedback signal. In the MMS logic block switching blocks are arranged cascaded. Each switching block receives at least a portion of the multi-bit word, splits the portion into two sub-portions and forwards them to one subsequent switching block or to one output element. A weight factor is adjusted by multiplying it with the difference of the two sub-portions. A weight accumulator accumulates successive adjusted weight factors, wherein the way of splitting the portion of a further multi-bit word is determined based on the sign of the weight accumulator.

A DAC, for use in an iADC, is configured for converting a multi-bit word to an analog feedback signal. The DAC comprises a MMS logic block. It further comprises a plurality of output elements configured to generate respective analog portions based on a selection vector and a signal combiner for combining the analog portions to the analog feedback signal. In the MMS logic block switching blocks are arranged cascaded. Each switching block receives at least a portion of the multi-bit word, splits the portion into two sub-portions and forwards them to one subsequent switching block or to one output element. A weight factor is adjusted by multiplying it with the difference of the two sub-portions. A weight accumulator accumulates successive adjusted weight factors, wherein the way of splitting the portion of a further multi-bit word is determined based on the sign of the weight accumulator.

A comparison control circuit is adapted to analog-to-digital converters and low-dropout regulators. The comparison control circuit includes a comparator, a Schmitt trigger, a capacitor set and a logic circuit. The comparator is configured to output a comparison signal according to a first input signal and a second input signal, wherein the comparison signal is a first high voltage potential or a first low voltage potential. The Schmitt trigger is configured to output a trigger signal according to the comparison signal and a voltage potential range, wherein the voltage potential range is in a range from the first low voltage potential to the first high voltage potential. The capacitor set is configured to adjust the second input signal when being controlled. The logic circuit is configured to control the capacitor set according to the trigger signal to correspondingly adjust the second input signal.

Disclosed are an analog-to-digital converter error shaping circuit and a successive approximation analog-to-digital converter. The analog-to-digital converter error shaping circuit includes a decentralized capacitor array, a data weighted average module, a mismatch error shaping module, a control logic generation circuit, a digital filter and a decimator. The decentralized capacitor array includes two symmetrically arranged capacitor array units, each capacitor array unit includes a first sub-capacitor array of a high segment bit and a second sub-capacitor array of a low segment bit. The data weighted average module is configured to eliminate correlation between the first sub-capacitor array and an input signal, and the mismatch error shaping module is configured to eliminate correlation between the second sub-capacitor array and the input signal.

A ratiometric analog-to-digital conversion circuit includes a first voltage range operation circuit configured to use a first power supply voltage of a first voltage range, and output an analog signal corresponding to an external input signal; and a second voltage range operation circuit configured to use a second power supply voltage of a second voltage range, generate a digital value by analog-to-digital converting the analog signal, feed back the digital value for analog-to-digital conversion, and output a digital signal corresponding to the digital value and proportional to the input signal.

Herein disclosed is an example analog-to-digital converter (ADC) and methods that may be performed by the ADC. The ADC may derive a first code that approximates a combination of an analog input value of the ADC and a dither value for the ADC sampled on a capacitor array. The ADC may further derive a second code to represent a residue of the combination with respect to the first code applied to the capacitor array. The ADC may combine the numerical value of the first code and the numerical value of the second code to produce a combined code applied to the capacitor array for deriving a digital output code. Combining the numerical value of the first code and the numerical value of the second code in the digital domain can provide for greater analog-to-digital (A/D) conversion linearity.

A digital to time converter (DTC). The DTC includes a lookup table, a divider, a thermometric array and a switched capacitor array. The lookup table is configured to generate one or more corrections based on thermometric bits of an input signal. The divider is configured to generate a plurality of divider signals from an oscillator signal based on the one or more corrections. The thermometric array is configured to generate a medium approximation signal from the plurality of divider signals based on the one or more corrections. The switched capacitor array is configured to generate a digital delay signal from the medium approximation signal based on the one or more corrections and switched capacitor bits of the input signal.

An asynchronous successive approximation register analog-to-digital converter (SAR ADC), which utilizes one or more overlapping redundant bits in each digital-to-analog converter (DAC) code word, is operable to generate an indication signal that indicates completion of each comparison step and indicates that an output decision for each comparison step is valid. A timer may be initiated based on the generated indication signal. A timeout signal may be generated that preempts the indication signal and forces a preemptive decision, where the preemptive decision sets one or more remaining bits up to, but not including, the one or more overlapping redundant bits in a corresponding digital-to-analog converter code word for a current comparison step to a particular value. For example, the one or more remaining bits may be set to a value that is derived from a value of a bit that was determined in an immediately preceding decision.

An analog-to-digital converter, including a sample/hold circuit; a reference voltage driver; a digital-to-analog converter; a comparator; and a logic circuit, wherein the reference voltage driver includes: a first voltage supplier circuit configured to output an external supply voltage provided from outside of the analog-to-digital converter; a second voltage supplier circuit configured to output a sampled reference voltage that is obtained during a sampling phase based on control signals received from the logic circuit; and a switching driver configured to electrically connect the first voltage supplier circuit to the digital-to-analog converter during a first conversion phase after the sampling phase based on the control signals received from the logic circuit, and to electrically connect the second voltage supplier circuit to the digital-to-analog converter during a second conversion phase based on the control signals received from the logic circuit.